Helvetica Chimica Acta ± Vol. 86 (2003)
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graphed (SiO ; CHCl ). Some of the compounds (expecially b-1) are unstable, and their crystals do not diffract
2 3
well, which affects the refinement.
X-Ray Crystallography. Crystals suitable for X-ray-diffraction studies were obtained by slow evaporation of
the reaction solvent. The diffraction-intensity measurements for a-1, 3, and 5 were carried out on a Philips PW-
1
100 four-circle diffractometer, and a Nonius KappaCCD diffractometer was used for compounds b-1, 2, and 4,
with graphite-monochromated MoK
a
radiation (l 0.71073ä). Unit-cell parameters were determined from 20
to 25 well-centered, intense reflections (Philips), or from all the data (Nonius). Structure solutions and full-matrix
least-squares refinements were accomplished with the SHELXS-97 PC package [22]. All non-H-atoms were
refined anisotropically, except for the disordered solvent present in 4. All methyl H-atom positions were calculated
geometrically, fixed at a CÀH distance of 0.96 ä (not refined). Other H-atoms were isotropically refined. Crystal
data and further data-collection parameters for the compounds studied are summarized in Table 3.
Crystallographic data (excluding structure factors) for the structures reported in this paper have been
deposited with the Cambridge Crystallographic Data Centre as deposition No. CCDC-201084 (3), CCDC-
2
01181 (4), CCDC-201182 (5), CCDC-201183( 2), CCDC-201184 (b-1), and CCDC-201185 (a-1). Copies of the
data can be obtained, free of charge, on application to the CCDC, 12 Union Road, Cambridge CB2 1EZ UK
(
fax: 441223 336033; e-mail: deposit@ccdc.cam.ac.uk).
This research was supported mainly by the United States-Israel Binational Science Foundation, Grant No.
1
997389, and partially by the Technion V.P.R. Fund, and by the Fund for the Promotion of Research at the
Technion. R. E. D. S. and J. S. M. gratefully acknowledge support from the U.S. NSF (Grant No. CHE 0110685)
and U.S. DOE (Grant No. DE-FG-93ER45504).
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Received February 6, 2003