A R T I C L E S
Friedrich et al.
XRD and N2-Physisorption. Powder XRD measurements were
performed with a Bruker AXS D8 Advance diffractometer using Co
KR1,2 radiation with a wavelength of 0.179 nm. Small-angle XRD
patterns of the SBA-15 material were recorded from 0.5-5° (2θ) at an
angular increment of 0.0086°. The diffraction pattern was corrected
for the KR2 component prior to further processing. To provide
reproducible results and minimize effects of XRD sample preparation,
the average over eight individual small angle XRD patterns was taken.
XRD measurements of the NiO/SBA-15 were obtained from 40 to 100°
(2θ) at an angular increment of 0.0086°. The NiO crystallite size was
calculated from the fwhm of the broadened diffraction peaks using the
Scherrer equation.
drawback of bulk techniques is that no direct information on
the actual location and distribution of the active particles within
the support is obtained. If additional, spatially resolved informa-
tion is required, transmission electron microscopy (TEM)14-19,24-27
and scanning electron microscopy (SEM)25-29 are applied.
Although TEM is a very powerful technique, the resulting
images are in first approximation a two-dimensional (2D)
projection of a three-dimensional (3D) structure.30 This implies
that for complex 3D objects, like the examined NiO/SBA-15,
the actual 3D location and distribution of the NiO phase cannot
be unambiguously determined from single TEM images.
N2-physisorption measurements were performed at -196 °C (Mi-
cromeritics, TriStar 3000 V6.01 A) on the SBA-15 and the NiO/SBA-
15 intermediate. From the adsorption isotherms, the pore volume and
pore size distribution were deduced using NL-DFT theory37-39 imple-
mented in the DataMaster 4.01 software (Micromeritics).
Complex 3D structures can be imaged using electron tomog-
raphy (ET), sometimes referred to as 3D-TEM, which combines
multiple TEM images from different directions.7-9,24-27,31-35
First applications of ET to heterogeneous catalysts focused on
the qualitative description of the observed nanoscale structures.7-9
More recent applications involve a posteriori image segmenta-
tion to quantify catalyst properties, like, porosity,33 localization
of the active phase,34 and loading of active components.35 As
for any data derived from electron microscopy, care has to be
taken that the imaged structures are representative for the bulk;
thus, bulk characterization is mandatory to provide a basis to
evaluate the relevance of nanoscale observations. In this study,
ET in combination with posteriori image segmentation is applied
to measure the 3D location and size of single NiO crystallites
in individual SBA-15 pores. On the basis of the segmentation
results, the NiO particle size distribution, 3D nearest neighbor
distances, and a loading model of individual SBA-15 pores are
derived. Obtained results are verified and discussed in context
of the bulk characterization. To our knowledge, this is the first
application of ET to quantify the particle size distribution, 3D
nearest neighbor distances, and the local loading in individual
pores of the support material.
Electron Tomography (ET). TEM tomography grids were prepared
by applying 10 nm sized colloidal gold particles (Aurion, PAG
conjugated) from aqueous suspension to a Quantifoil R2/1 carbon film
supported on a parallel bar Cu TEM grid. After drying in air, a small
amount of the NiO/SBA-15 powder was deposited directly onto the
grid. Excess catalyst was shook-off before inserting the TEM grid into
a Fischione, model 2020, advanced tomography holder. ET was
performed in bright-field TEM mode using a Tecnai 20 electron
microscope (FEI) operating at 200 kV acceleration voltage, equipped
with a LaB6 electron source and a TWIN objective lens. A series of
TEM images (tilt-series) were acquired by rotating the specimen inside
the microscope over a tilt range of at least +70 to -70° at increments
of 1°. Images were recorded at each tilt step on a 2048 pixel × 2048
pixel TVIPS CCD camera using Xplore3D software (FEI). Diffraction
effects caused by a combination of the microscope aberrations and
strongly excited high-order beams, resulting in nonsymmetric white
halos around crystalline material, were excluded by using an objective
aperture. The defocus was set between -130 and -200 nm depending
on the thickness of the examined SBA-15 particle to keep the entire
object in underfocus. The nominal magnification was 29 000×, which
corresponds to a pixel size of 0.27 nm. Images of the tilt-series were
aligned with respect to a common origin and rotation axis using the 10
nm gold particles as fiducial markers. Finally the aligned tilt-series
was binned to 0.54 nm pixel size prior to reconstruction of the three-
dimensional volume. Alignment and reconstruction by filtered back-
projection was performed in IMOD.40 Preliminary results using the
sequential iterative reconstruction technique (SIRT) showed good
contrast in the reconstruction but did not improve the segmentation
described in the next paragraph.
Assessment of the NiO phase within the SBA-15 mesopores, a
process called segmentation, was carried out in Amira 3.1 (TGS-Visual
Concepts/Mercury Computer Systems, Inc.). Segmentation involved in
a first step the manual tracing of the NiO crystallite contours throughout
the volume of the examined mesopores. Since the NiO crystallites are
three-dimensional, three perpendicular cutting planes were used to
identify connected regions with dark contrast. As practical limit for
the smallest detectable particle, a connected region of at least 3 × 3 ×
2 pixels (∼3 nm3) had to be present. This practical limit exceeds the
rule-of-thumb for the theoretically predicted resolution which equals
three times the thickness of the sample divided by the number of images.
However, the practical achievable resolution has been reported to be
considerably better than the calculated value.9,31 In the last segmentation
step, the volume and the center-of-mass of each NiO crystallite were
calculated.
2. Materials and Methods
Preparation of NiO/SBA-15. SBA-15 (pore volume 0.73 cm3‚g-1
)
was synthesized according to a procedure described by Zhao.6 Deposi-
tion of the NiO precursor was carried out by incipient wetness
impregnation of SBA-15 using a 4.2 M aqueous Ni(NO3)2 solution (Ni-
(NO3)2·6H2O (Acros) in demineralized water) followed by drying at
120 °C for 12 h. Conversion of the dried precursor was done by heating
the sample at 1 °C‚min-1 to 450 °C in a flow of 1 vol % NO in He.
The sample was kept at 450 °C for 4 h. Following this procedure, highly
dispersed NiO/SBA-15 at a loading of 24 wt % NiO was obtained.36
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