L.-P. Zhu et al.
FULL PAPER
[5] a) S. A. Jenekhe, X. L. Chen, Science 1998, 279, 1903–1907; b)
O. Ikkala, G. T. Brinke, Science 2002, 295, 2407–2409.
[6] J. Du, Y. Chen, Angew. Chem. Int. Ed. 2004, 43, 5084–5890.
[7] W. Shenton, D. Pum, U. B. Sleytr, S. Mann, Nature 1997, 389,
585–587.
[8] J. Park, E. Kang, S. U. Son, H. M. Park, M. K. Lee, J. Kim,
K. W. Kim, H. J. Noh, J. H. Park, C. J. Bae, J. G. Park, T. Hy-
eon, Adv. Mater. 2005, 17, 429–434.
[9] N. Cordente, M. Respaud, F. Senocq, M. J. Casanove, C. Ami-
ens, B. Chaudret, Nano Lett. 2001, 1, 565–568.
[10] D. E. Zhang, X. M. Ni, H. G. Zheng, T. Y. Li, X. J. Zhang,
Z. P. Yang, Mater. Lett. 2005, 59, 2011–2014.
homogeneous green solution was obtained. An ethanol solution
(10 mL) of EDA was added dropwise into an aqueous solution of
NiCl2·6H2O (30 mL) to give a mauve pellucid solution. Then the
desired NaOH solution and hydrated hydrazine (3.0 mL, 80%) was
added. The whole mixture was transferred into a Teflon cup in a
stainless steel-lined autoclave (50 mL capacity), sealed, and main-
tained at 115 °C for 4 h. After the heat treatment, the black fluffy
particles floating on the solution were collected, rinsed with dis-
tilled water and absolute ethanol, and finally vacuum-dried at
60 °C.
The phase purity of the products was examined by XRD with a
Rigaku D/max 2500 diffractometer at a voltage of 40 kV and a
current of 200 mA with Cu-Kα radiation (λ = 1.5406 Å), employing
a scanning rate of 0.02°/s in the 2θ range from 20 to 80°. SEM
images and EDX analyses were obtained with a HITACHI S-4800
microscope (Japan). TGA-DSC analyses were carried out with a
NETZSCH STA-409 PC thermal analyzer with a heating rate of
10 °Cmin–1 in flowing oxygen. TEM images and the corresponding
SAED pattern were taken with a Hitachi-600 transmission electron
microscope at an accelerating voltage of 200 kV. HRTEM images
were recorded with a JEOL JEM-2010 transmission electron micro-
scope at an accelerating voltage of 200 kV. The FTIR spectrum was
recorded with a Varian 3100 FTIR spectrometer by using a KBr
wafer. Magnetic measurements for the samples were carried out at
room temperature by using a vibrating sample magnetometer
(VSM, Lakeshore 7307, USA) with a maximum magnetic field of
10 kOe.
[11] C. M. Liu, L. Guo, R. M. Wang, Y. Deng, H. B. Xu, S. Yang,
Chem. Commun. 2004, 2726–.
[12] Z. Liu, S. Li, Y. Yang, S. Peng, Z. Hu, Y. Qian, Adv. Mater.
2003, 15, 1946–1948.
[13] J. C. Bao, C. Y. Tie, Z. Xu, Q. F. Zhou, D. Shen, Q. Ma, Adv.
Mater. 2001, 13, 1631–1633.
[14] a) J. C. Bao, Y. Liang, Z. Xu, L. Si, Adv. Mater. 2003, 15, 1832–
1835; b) Q. Liu, H. Liu, M. Han, J. Zhu, Y. Liang, Z. Xu, Y.
Song, Adv. Mater. 2005, 17, 1995–1999; c) Y. Wang, Q. Zhu,
H. Zhang, J. Mater. Chem. 2006, 16, 1212–1214.
[15]
[16]
[17]
[18]
X. Ni, J. Zhang, Y. Zhang, H. Zheng, J. Colloid Interface Sci.
2007, 307, 554–558.
H. Wu, R. Zhang, X. Liu, D. Lin, W. Pan, Chem. Mater. 2007,
19, 3506–3511.
Y. Leng, Y. Wang, X. Li, T. Liu, S. Takahashhi, Nanotechnol-
ogy 2006, 17, 4834–4839.
X. Ni, Q. Zhao, H. Zheng, B. Li, J. Song, D. Zhang, X. Zhang,
Eur. J. Inorg. Chem. 2005, 4788–4793.
[19]
[20]
X. M. Liu, S. Y. Fu, J. Cryst. Growth 2007, 306, 428–432.
a) J. T. Tian, C. H. Gong, L. G. Yu, Z. S. Wu, Z. J. Zhang,
Chin. Chem. Lett. 2008, 19, 1123–1126; b) F. Ma, Q. Li, J.
Huang, J. Li, J. Cryst. Growth 2008, 310, 3522–3526.
Acknowledgments
This work is supported by the Overseas Outstanding Scholar Foun-
dation of the Chinese Academy of Sciences (Grant Nos.: 2005-1-3
and 2005-2-1), the Specialized Research Fund for Outstanding
Young Teachers in Shanghai Higher Education Institutions (Grant
No.: egd08013), and the Innovation Program of the Shanghai Mu-
nicipal Education Commission (Grant No.: 10YZ200). We also
thank Prof. Shao-Yun Fu for helpful discussions.
[21] L. P. Zhu, H. M. Xiao, S. Y. Fu, Eur. J. Inorg. Chem. 2007,
3947–3951.
[22] L. P. Zhu, W. D. Zhang, H. M. Xiao, G. Yang, S. Y. Fu, Cryst.
Growth Des. 2008, 8, 957–963.
[23] M. Wen, Y. F. Wang, F. Zhang, Q. S. Wu, J. Phys. Chem. C
2009, 113, 5960–5966.
[24] L. H. Zhang, H. Q. Yang, J. Yu, F. H. Shao, L. Li, F. H. Zhang,
H. Zhao, J. Phys. Chem. C 2009, 113, 5434–5443.
[25] M. R. Kim, D. J. Jang, Chem. Commun. 2008, 5218–5220.
[26] X. J. Wang, K. Han, F. Q. Wan, Y. J. Gao, K. Jiang, Mater.
Lett. 2008, 62, 3509–3511.
[1] J. Chen, D. H. Bradhurst, S. X. Dou, H. K. Liu, J. Electro-
chem. Soc. 1999, 146, 3606–3612.
[2] H. G. Yang, H. C. Zeng, Angew. Chem. Int. Ed. 2004, 43, 5930–
5933.
[3] a) G. Kaltenpoth, M. Himmelhaus, L. Slansky, F. Caruso, M.
[27] H. Tang, J. G. Yu, X. F. Zhao, J. Alloys Compd. 2008, 460,
513–518.
[28] U. Pal, P. Santiago, J. Phys. Chem. B 2005, 109, 15317–15321.
Grunze, Adv. Mater. 2003, 15, 1113–1118; b) Y. Hou, H. Kon- [29] Y. C. Zhang, G. Y. Wang, X. Y. Hu, R. Xing, J. Solid State
doh, T. Ohta, Chem. Mater. 2005, 17, 3994–3996; c) L. P. Zhu,
H. M. Xiao, W. D. Zhang, Y. Yang, S. Y. Fu, Cryst. Growth
Des. 2008, 8, 1113–1117; d) L. P. Zhu, W. D. Zhang, H. M.
Xiao, Y. Yang, S. Y. Fu, J. Phys. Chem. C 2008, 112, 10073–
10078; e) Y. J. Zhang, Q. Yao, Y. Zhang, T. Cui, D. Li, W. Liu,
Z. Zhang, Cryst. Growth Des. 2008, 8, 3206–3212.
Chem. 2005, 178, 1609–1613.
[30] H. P. Klug, L. E. Alexander, X-ray Diffraction Procedure, 2nd
ed., Wiley, New York, 1974.
[31] C. Pacholski, A. Kornowski, H. Weller, Angew. Chem. Int. Ed.
2002, 41, 1188–1191.
[32] V. Salgueirino-Maceira, M. A. Correa-Duarte, A. Hucht, M.
Farle, J. Magn. Magn. Mater. 2006, 303, 163–166.
[33] W. Gong, H. Li, Z. Zhao, J. Chen, J. Appl. Phys. 1991, 69,
5119–5121.
[34] B. D. Cullity (Ed.), Introduction to Magnetic Materials, Addi-
son-Wesley, London, 1972, pp. 240–245.
[35] J. Wang, Q. W. Chen, C. Zeng, B. Y. Hou, Adv. Mater. 2004,
16, 137–140.
[4] a) J. Yuan, K. Laubernds, Q. Zhang, S. L. Suib, J. Am. Chem.
Soc. 2003, 125, 4966–4967; b) M. Yada, C. Taniguchi, T. Tori-
kai, T. Watari, S. Furuta, H. Katsuki, Adv. Mater. 2004, 16,
1448–1453; c) H. Y. Fan, K. Yang, D. M. Boye, T. Sigmon,
K. J. Malloy, H. Xu, G. P. López, C. J. Brinker, Science 2004,
304, 567–571; d) P. Gao, Z. Wang, J. Am. Chem. Soc. 2003,
125, 11299–11300; e) J. Hu, L. Ren, Y. Guo, H. Liang, A. Cao,
L. Wan, C. Bai, Angew. Chem. Int. Ed. 2005, 44, 1269–1273; f)
L. P. Zhu, H. M. Xiao, X. M. Liu, S. Y. Fu, J. Mater. Chem.
2006, 16, 1794–1797; g) L. P. Zhu, H. M. Xiao, S. Y. Fu, Cryst.
Growth Des. 2007, 7, 177–182.
[36] S. H. Wu, D. H. Chen, J. Colloid Interface Sci. 2003, 259, 282–
286.
Received: September 7, 2009
Published Online: February 2, 2010
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