Cd(AsF6)2 with HF and XeF2
9.6; As, 12.8; AsF6-, 32.4; Ftotal, 32.6; Ffree, 13.0. Found: Cd, 9.6;
As, 13.0; AsF6-, 32.4; Ftotal, 32.0; Ffree, 13.0), and X-ray powder
diffraction pattern.
The reaction was subsequently repeated with all of the reagents
added in stoichiometric amounts [Cd(AsF6)2 (0.340 g, 0.694 mmol);
XeF2 (0.471 g, 2.78 mmol); mole ratio of 1:4 Cd/Xe]. The Raman
and IR spectra and X-ray powder diffraction pattern of the product
were identical to those obtained in the experiment described above.
Preparation of Single Crystals of [Cd(HF)](AsF6)2. Cd(AsF6)2
(0.250 g) was placed in the wider tube of a crystallization vessel
and dissolved in aHF. This solution was decanted into the narrower
part of the T-shaped crystallization vessel. The crystals were grown
with a temperature gradient of 28 °C, isolated from the mother
liquid, and immersed in perfluorinated oil (ABCR, FO5960) in a
drybox. A suitable crystal was selected under the microscope and
transferred into the cold nitrogen stream of the X-ray diffractometer.
Preparation of Single Crystals of [Cd(XeF2)4](AsF6)2. Ap-
proximately 0.3 g of [Cd(XeF2)4](AsF6)2 was placed in the wider
part of a crystallization vessel and dissolved in aHF. The remainder
of the procedure was the same as that described above.
Figure 1. Raman spectrum of [Cd(XeF2)4](AsF6)2.
were used for the syntheses. Crystals were grown in a crystallization
vessel made from a T-shaped FEP reaction vessel, constructed from
one 16 mm i.d. FEP tube and a smaller 4 mm i.d. FEP tube
connected by a Teflon valve.
Elemental Analysis. The total fluoride content (Ftotal-) was
determined after complete decomposition of the sample by fusion
with KNaCO3.16,17 The content of free fluoride (Ffree-) was
determined in an aqueous solution of the sample after hydrolysis.18
Both fluoride contents were determined by direct potentiometry
using a fluoride ion selective electrode.16 Total arsenic was
determined potentiometrically by titration with Na2S2O319 after prior
Reagents. Cadmium difluoride was prepared by direct fluorina-
tion of CdCl2‚H2O (2.805 g) (Zorka Sˇabac, 99%) with F2 in
anhydrous HF (aHF) as a solvent at 298 K. Fluorine was partially
condensed three times at a pressure of 700 kPa from a vessel of
known volume into a reaction vessel cooled in liquid nitrogen.
Cadmium difluoride was characterized by the X-ray powder
diffraction pattern and by chemical analyses (Calcd: Cd, 74.7; F,
25.3. Found: Cd, 74.6; F, 25.2). aHF (Fluka, purum) was treated
with K2NiF6 (Ozark-Mahoning, 99%) for several days prior to use.
Arsenic pentafluoride was prepared by high-pressure fluorination
of As2O3, using the procedure described for PF5.13 Xenon difluoride
was prepared by the photochemical reaction between Xe and F2 at
room temperature.14 (Caution: aHF and AsF5 must be handled in
a well-ventilated hood, and protective clothing must be worn at all
times.)
-
fusion of the sample with KNaCO3. The content of AsF6 was
determined gravimetrically by precipitation with tetraphenyl-
arsonium chloride,20 and the cadmium content was determined by
complexometric titration with EDTA.21
X-ray Powder Diffraction Patterns. Diffraction data of the
samples were taken in sealed quartz capillaries on a 143 mm
Debye-Scherer camera with X-ray film, using Cu KR radiation.
Intensities were estimated visually.
X-ray Structure Determination. Both single-crystal data sets
were collected at -73 °C using a Mercury CCD area detector
coupled with a Rigaku AFC7 diffractometer with graphite-mono-
chromatized Mo KR radiation. The data were corrected for Lorentz
and polarization effects. Multiscan absorption corrections were
applied to each data set. All calculations during the data processing
were performed using the CrystalClear software suite.22 Structures
were solved by direct methods23 and expanded using Fourier
techniques. Full-matrix least-squares refinement of F2 against all
reflections was performed using the SHELX97 program.24 More
details on the data collection and structure determination are given
in Table 1.
Synthesis of Cd(AsF6)2. Cd(AsF6)2 was prepared from CdF2
(0.518 g, 3.44 mmol) and AsF5 (1.341 g, 7.89 mmol) in an aHF
solvent as previously described.15 The product was dried under
dynamic vacuum for 3 days to remove all traces of aHF and
characterized by the X-ray powder diffraction pattern and chemical
-
analysis (Calcd for Cd(AsF6)2: Cd, 22.9; As, 30.6; Ftotal, 46.5; Ffree
0; AsF6-, 77.1. Found: Cd, 22.7; As, 31.4; Ftotal-, 46.3; Ffree-, 0.5;
AsF6-, 77.0).
Synthesis of [Cd(HF)](AsF6)2. All attempts to synthesize this
compound in bulk were unsuccessful. [Cd(HF)](AsF6)2 is not stable
under dynamic vacuum even at -20 °C, losing HF to get Cd(AsF6)2
as the final product.
,
Raman Spectroscopy. Raman spectra of the powdered samples
in sealed quartz capillaries were recorded on a Renishaw Raman
Synthesis of [Cd(XeF2)4](AsF6)2. Cd(AsF6)2 (1.032 g, 2.11
mmol) was dissolved in aHF. Xenon difluoride (2.387 g, 14.10
mmol) was sublimated into the reaction vessel at -196 °C followed
by warming of the reaction vessel to room temperature. The product
of the reaction was not completely dissolved in aHF. The excess
of XeF2 and aHF were pumped off at room temperature for 6 h,
yielding a white product (1.4131 g) with a mole ratio of 1:3.97
Cd/XeF2. The compound was characterized by Raman spectroscopy
(Figure 1), chemical analyses (Calcd for [Cd(XeF2)4](AsF6)2: Cd,
(16) Ponikvar, M.; Sedej, B.; Pihlar, B.; Zˇemva, B. Anal. Chim. Acta 2000,
418, 113-118.
(17) Ponikvar, M.; Zˇemva, B.; Liebman, J. F. J. Fluorine Chem. 2003,
123, 217-220.
(18) Sedej, B. Talanta 1976, 23, 335 and 336.
(19) Ponikvar, M.; Pihlar, B.; Zˇemva, B. J. Fluorine Chem. 2003, 122,
215-217.
(20) Dess, H. M.; Parry, R. W.; Vidale, G. L. J. Am. Chem. Soc. 1956, 78,
5730-5734.
(21) Pribil, R. Applied Complexometry; Pergamon Press: Oxford, 1982;
pp 169-171.
(22) CrystalClear; Rigaku Corporation: The Woodlands, TX, 1999.
(23) SIR92: Altomare, A.; Cascarano, G.; Giacovazzo, C.; Guagliardi, A.
J. Appl. Crystallogr. 1993, 26, 343.
(13) Jesih, A.; Zˇemva, B. Vestn. SloV. Kem. Drus. 1986, 33, 25.
(14) Sˇmalc, A.; Lutar, K. In Inorganic Syntheses; Grimes, R. N., Ed.;
Wiley: New York, 1992; Vol. 29, p 1.
(24) Sheldrick, G. M. SHELX97-2: Programs for Crystal Structure
Analysis, release 97-2; University of Go¨ttingen: Go¨ttingen, Germany,
1998.
(15) Frlec, B.; Gantar, D.; Holloway, J. J. Fluorine Chem. 1982, 19, 485-
500.
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