Journal of Physical Chemistry p. 663 - 672 (1995)
Update date:2022-08-16
Topics:
Chu, J. C. S.
Soller, R.
Lin, M. C.
Melius, C. F.
The thermal decomposition of Si(OCH3)4 (TMOS) has been studied by FTIR at temperatures between 858 and 968 K.The experiment was carried out in a static cell at a constant pressure of 700 Torr under highly diluted conditions.Additional experiments were performed by using toluene as a radical scavenger.The species monitored included TMOS, CH2O, CH4, and CO.According to these measurements, the first-order global rate constants for the disappearrance of TMOS without and with toluene can be given by kg=1.4E16 exp(-81200/RT) s-1 and kg=2.0E14 exp(-74500/RT) s-1, respectively.The noticeable difference between the two sets of Arrhenius parameters suggests that, in the absence of the inhibitor, the reactant was consumed to a significant extent by radical attacks at higher temperatures.The experimental data were kinetically modeled with the aid of a quantum-chemical calculation using the BAC-MP4 method.The results of the kinetic modeling, using the mechanism constructed on the basis of the quantum-chemical data and the know C/H/O chemistry, identified two rate-controlling reactions: TMOS -> CH3OH+(CH3O)2SiOCH2 (reaction 2) and CH2OSi(OCH3)3 -> CH2O+Si(OCH3)3 (reaction 3), which have the following respective first-order rate constants, given in the units of s-1: k2=1.6E14 exp(-74000/RT) and k3=3.8E14 exp(-60000/RT).In addition to these new kinetic data, the heats of formation of many relevant SiOxCyHz species computed with the BAC-MP4 method are presented herein.
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