In summary, a series of 5,15-dialkylated porphyrins was
synthesized and the charge transport properties were studied
using OTFTs structure by the vacuum deposition method. The
charge transport properties are strongly affected by the surface
morphology, crystallinity, and molecular packing of the thin
film. Properly substituted alkyl chain of C4-Por led to the highest
crystallinity of the as-deposited film and best charge transport
behavior, which makes it an effective organic semiconductor for
potential practical application in organic electronics. The main
aim of this study is to reveal the structure–property relationship
of macromolecules and to serve as a guideline for materials
design and development for organic electronics.
Fig. 3 AFM images of vacuum-deposited thin films of (a) C2-Por;
(b) C4-Por and (c) C6-Por.
(12.9 A derived from the single crystal X-ray data)). Upon
further increasing the substituted alkyl chain to hexyl, the
as-deposited film of C6-Por exhibited a diffraction peak at
4.71 (2y) with a sharp decrease in the diffraction intensity.
These interplanar distances suggest that the molecular planes of
5,15-dialkylated porphyrins are roughly perpendicular to the
SiO2/Si substrate surface, thereby enabling a well-ordered face-to-
face molecular alignment along one direction, which is advanta-
geous for intermolecular charge transport (Fig. S4, ESIz).
The surface morphology of these thin films was studied by
tapping mode atomic force microscopy (AFM). The peripheral
alkyl substituents were found to affect the morphology of the films
of 5,15-dialkylated porphyrins and hence the charge mobility
of the as-fabricated devices. Fig. 3 shows the AFM images of
50 nm-thick thin films of 5,15-dialkylated porphyrins deposited on
the SiO2/Si substrate. Although the grain sizes of 5,15-dialkylated
porphyrins-based thin films were found to be similar, the reduced
ordering in the series of C4-Por > C6-Por > C2-Por is consistent
with the GIXRD measurement and charge carrier mobility
results. The C4-Por based thin film exhibited the best crystalline
grains (Fig. 3b) and strongest GIXRD diffraction peak (Fig. 2),
both of which led to the highest charge carrier mobility among
5,15-dialkylated porphyrins.
This work was supported by the National Natural Science
Foundation of China (no. 21172160), Ministry of Education
of China (no. 20100181120039) and City University of Hong
Kong (Project No. 7002672).
Notes and references
z Crystal data for C2-Por: M = 366.46, monoclinic, a = 13.1977(4) A,
b = 12.7229(4) A, c = 11.5658(4) A, a = 90.001, b = 103.008(2)1,
g = 90.001, V = 1892.21(11) A3, T = 296(2) K, space group P2(1)/c,
Z = 4, 24 410 reflections measured, 4303 independent reflections
(Rint = 0.0520). The final R1 value was 0.0642 (I > 2s(I)). The final
wR(F2) value was 0.1917 (I > 2s(I)). The final R1 value was 0.0871
(all data). The final wR(F2) value was 0.2123 (all data). Crystal data for
C4-Por: M = 422.56, monoclinic, a = 9.8980(6) A, b = 9.3449(6) A,
c = 12.9197(8) A, a = 90.001, b = 107.261(4)1, g = 90.001, V =
1141.20(12) A3, T = 296(2) K, space group P2(1)/c, Z = 2, 12 012
reflections measured, 2312 independent reflections (Rint = 0.0507).
The final R1 value was 0.0744 (I > 2s(I)). The final wR(F2) value was
0.2107 (I > 2s(I)). The final R1 value was 0.1290 (all data). The final
wR(F2) value was 0.2826 (all data).
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The degree of film crystallinity, morphological continuity,
concentration of the defects and grain boundaries within the
vacuum-deposited thin films could be affected by intermolecular
packing of the molecules.18 All 5,15-dialkylated porphyrins have
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c
This journal is The Royal Society of Chemistry 2012
Chem. Commun., 2012, 48, 5139–5141 5141