C O M M U N I C A T I O N S
diffraction observed. In the diffractograms of both 1 and 2, the
intensity of the diffracted peaks on different surfaces and substrate
temperatures corresponded with mobility. For instance, for 1, peak
intensities are higher for the films grown on OTS/SiO2/Si compared
to the film grown on SiO2/Si or PVP dielectric surface at both room
temperature and at 60 °C (see Supporting Information).
To conclude, we have synthesized two new asymmetric linear
acenes that show high charge mobility and stability. These new
conjugated cores can be further functionalized to make a variety
of small molecule and polymer based OTFTs, which may aid in
the understanding of thin film packing and mobility.
Acknowledgment. The authors thank Mark E. Roberts and
Jason J. Locklin for helpful lab assistance. M.L.T. acknowledges
financial support from a Kodak Graduate Fellowship. Z.B. ac-
knowledges financial support from the Air Force Office of Scientific
Research Grant FA9550-06-1-0126 and NSF Center for Polymer
and Macromolecular Assemblies.
Figure 1. Characteristic transfer curves of 1 and 2 on OTS/SiO2/Si at
60 °C and room temperature, respectively (L ) 50 µm, W/L ) 20), and the
corresponding AFM.
with a mobility of 0.006 cm2 V-1 s-1. This may be due to the grains
being more connected at the interface with the dielectric for thicker
films. For both 1 and 2, the on/off ratio is on the order of 106 for
the OTS treated surface but only about 102 for the other surfaces.
To probe the morphology of the molecules in an evaporated thin
film, we performed AFM scans. AFM images of submonolayer
films of 1 on bare SiO2/Si and OTS/SiO2/Si reveal grains as large
as 1 µm that greatly resemble that of pentacene.18,19 AFM images
of 50 nm films of 1 grown at room temperature on device wafers
show a dendritic growth characteristic of pentacene. Dendritic
growth is especially apparent on OTS/SiO2/Si and PVP/Si (see
Figure S-10). From room temperature to a substrate temperature
of 60 °C, 50 nm films of 1 show larger grains on all substrates,
corresponding well with the increase in the thin film mobility (see
Figure S-11). At 80 °C, 3D growth dominates on SiO2/Si and OTS/
SiO2/Si, resulting no working devices. AFM studies of the sub-
monolayer growth of 2 were difficult to perform because of the
high roughness of the films. Perhaps this is related to the low
molecular weight of 2, which encouraged desorption at room
temperature. However, the morphology of 40 nm films of 2 at room
temperature showed grains as large as 3 µm on SiO2/Si and OTS/
SiO2/Si, with 3D growth occurring much more prominently than
for 1. This is not unexpected, considering tetracene forms towers
in thin film and does not give evaporated films with good grain
connectivity and thus poor mobility.20 The 40 nm films of 2 at
room temperature on PVP/Si showed disconnected grains with high
walls at the boundary of the grains, commensurate with no mobility
measured on this surface. Substrate-molecule interactions seem
to be less favored than molecule-molecule interactions on the PVP/
Si surface. At 40 °C, nothing seems absorbed on SiO2/Si, while
the large disconnected grains exceeding 10 µm on OTS/SiO2/Si
account for nonworking devices made at this temperature (see
Figure S-12).
Supporting Information Available: Details of experimental
procedures, UV-vis, cyclic voltammagrams, table content of OTFT
device data and X-ray OOP d-spacings, X-ray diffraction graphs, AFM
images. This material is available free of charge via the Internet at
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