Program of the Institute for Chemical Research (ICR), Kyoto
University. The Preliminary X-ray diffraction data of 18 were
collected at the BL40XU in Spring-8 (JASRI, 2015B1074).
Computation time was partially provided by the Supercomputer
Laboratory, Institute for Chemical Research, Kyoto University.
We would like to thank Mr. Toshiaki Noda and Ms. Hideko
Natsume at Nagoya University for the expert manufacturing of
custom-tailored glassware. The manuscript was partially
written at the Rheinische Friedrich-Wilhelms-Universität Bonn
during the tenure of a Friedrich Wilhelm Bessel Research
Award (TS). TS would like to express his gratitude to Prof.
Rainer Streubel and his co-workers for their kind hospitality, as
well as to the Alexander von Humboldt Stiftung for their
generosity. One of the authors (AE) is grateful to the Kyoto
University Research Coordination Alliance for their support of
the collaboration and to "Servicio de Cálculo Científico" at the
University of Murcia for computational resources and technical
support.
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17. X-ray
crystallographic
data
for
[15·C6H6]:15
C54H104Br2Ge2Si8, FW = 1283.09, T = −170 °C, triclinic,
P–1 (no. 2), a = 9.5903(2) Å, b = 12.1744(3) Å, c =
30.5707(9) Å, α = 82.3768(19)º, β = 86.935(2)º, γ =
75.4857(13)º, V = 3424.10(15) Å3, Z = 2, Dcalcd = 1.224
g/cm3, µ = 2.215 mm–1, λ = 0.71075 Å, 2 θmax = 50.0°,
27891/11871 measured/independent reflections (Rint
0.0498), 625 refined parameters, GOF = 1.021, R1
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0.0449 (I > 2 σ(I)), wR2 = 0.1256 (all data), largest
difference peak and hole 1.841 and −1.098 e Å–3. X-ray
crystallographic data for [2b·C6H6]:15 C54H104Ge2Si8, FW
= 1123.27, T = −170 °C, triclinic, P–1 (no. 2), a =
13.2964(4) Å, b = 16.4120(10) Å, c = 17.2864(8) Å, α =
87.040(2)º, β = 73.057(2)º, γ = 69.160(3)º, V = 3366.7(3)
Å3, Z = 2, Dcalcd = 1.108 g/cm3, µ = 1.065 mm–1, λ =
0.71075
Å,
2θmax
=
51.0°,
29799/12418
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J. Am. Chem. Soc. 2006, 128, 11366. d) L. Pu, B.
Twamley, P. P. Power, J. Am. Chem. Soc. 2000, 122,
3524.
measured/independent reflections (Rint = 0.0501), 602
refined parameters, GOF = 1.016, R1 = 0.0604 (I > 2 σ(I)),
wR2 = 0.1718 (all data), largest difference peak and hole
1.255 and −0.505 e Å–3.
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a) M. Stender, A. D. Phillips, R. J. Wright, P. P. Power,
Angew. Chem., Int. Ed. 2002, 41, 1785. b) A. D. Phillips,
R. J. Wright, M. M. Olmstead, P. P. Power, J. Am. Chem.
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19. X-ray crystallographic data for [13·C6H6]: C58H108Ge2Si8,
FW = 1175.34, T = −170 °C, orthorhombic, Pnna (no. 52),
a = 18.2435(3) Å, b = 30.6273(4) Å, c = 12.6638(2) Å, V
= 7075.89(19) Å3, Z = 4, Dcalcd = 1.103 g/cm3, µ = 1.016
mm–1, λ = 0.71075 Å, 2 θmax = 51.0°, 59699/6580
measured/independent reflections (Rint = 0.0791), 323
refined parameters, GOF = 1.034, R1 = 0.0405 (I > 2 σ(I)),
wR2 = 0.1128 (all data), largest difference peak and hole
1.145 and −0.523 e Å–3. X-ray crystallographic data for
[14·C6H6]: C60H110Ge2Si8, FW = 1201.38, T = −170 °C,
triclinic, P–1 (no. 2), a = 12.2815(2) Å, b = 17.1720(5) Å,
c = 18.6944(3) Å, α = 93.8158(13)°, β = 106.5432(10)°, γ
6.
7.
= 105.0468(10)°, V = 3607.56(13) Å3, Z = 2, Dcalcd
=
=
1.106 g/cm3, µ = 0.998 mm–1, λ = 0.71075 Å, 2 θmax
52.0°, 43493/13645 measured/independent reflections
(Rint = 0.0611), 683 refined parameters, GOF = 1.162, R1
= 0.0839 (I > 2 σ(I)), wR2 = 0.1952 (all data), largest
difference peak and hole 3.018 and −0.667 e Å–3.