6
.65; found C 51.35, H 8.26. N 6.70. By assuming that the
organic component has decomposed completely and all the in-
organic residuals are MoO and Mn O at 800 °C, the measured
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J. M. Lehn, Science, 2002, 295, 2400–2403.
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2
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5 G. M. Whitesides and M. Boncheva, Proc. Natl. Acad. Sci. U. S. A.,
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residue of 28.28 wt% in total from TGA (Fig. S16†) is in agree-
ment with the calculated value of 29.84 wt% from the given
6
B. A. Grzybowski, C. E. Wilmer, J. Kim, K. P. Browne and
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−1
SEOP-1 formula. FT-IR (KBr, cm ): ν = 3323 (s), 3347 (s),
085 (s), 3032 (s), 2920 (s), 2850 (s), 1697 (s), 1631 (s), 1568
s), 1468 (sh), 1417 (s), 1377 (s), 1355 (s), 1323 (s), 1309 (s),
298 (sh), 1271 (s), 1244 (s), 1149 (s), 1110 (s), 1036 (s), 941
7
8
S. Mann, Nat. Mater., 2009, 8, 781–792.
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3
(
1
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5
−1
(s), 912 (s), 822 (s), 802 (s), and 669 cm (s).
1
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1
Sample preparation for measurements
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1
In order to characterize the true aggregation states of the SEOPs
in solutions at different temperatures, all the samples for SEM,
XRD, and XPS measurements were prepared through direct
casting the sample solutions onto silicon wafers at the same
temperature with the same solvent atmosphere to the samples.
For the TEM measurements, the sample solutions were dropped
onto a carbon-coated copper grid, and then the grid was dried
quickly through adsorbing the excess solution by a filter paper.
4
1
1
5 Z. H. Peng, Angew. Chem., Int. Ed., 2004, 43, 930–935.
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1
1
3
19 B. Liu, J. Yang, M. Yang, Y. L. Wang, N. Xia, Z. J. Zhang, P. Zheng,
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2
2
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Measurements
FT-IR spectra were carried out on a Bruker Vertex 80v FT-IR
spectrometer equipped with a DTGS detector (32 scans) with a
resolution of cm− . H NMR spectra were recorded on a Bruker
AVANCE 500 MHz spectrometer. X-ray photoelectron spec-
troscopy (XPS) were carried out on an ESCALAB 250 spec-
trometer with a monochromic X-ray source (Al Kα line, 1486.6
eV) and the charging shift was corrected by the binding energy
of C 1s at 284.6 eV. X-ray diffraction (XRD) data were recorded
on a Rigaku X-ray diffractometer using Cu Kα radiation at a
wavelength of 1.542 Å. Organic elemental analysis (C H N) was
performed on a Flash EA1112 from ThermoQuest Italia S.P.A.
Thermal gravimetric analysis (TGA) measurements were per-
1 1
23 M. Carraro, A. Sartorel, G. Scorrano, C. Maccato, M. H. Dickman,
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2
2
2
2010, 132, 5315–5321.
5 J. Zhang, Y. F. Song, L. Cronin and T. B. Liu, J. Am. Chem. Soc., 2008,
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P. Lehmann, H. Schnablegger, D. Schwahn, M. Piepenbrink and
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formed on a Q500 Thermal Analyzer (New Castle TA Instru-
2
3
3
9 W. F. Bu, H. L. Li, H. Sun, S. Y. Yin and L. X. Wu, J. Am. Chem. Soc.,
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1
.
2005, 127, 8016–8017.
0 H. L. Li, W. Qi, W. Li, H. Sun, W. F. Bu and L. X. Wu, Adv. Mater.,
Electrospray ionization mass spectrometry (ESI-MS) was
obtained on UPLC-MS/MS (Qattro Premier). Scanning electron
microscope (SEM) images were acquired on a JEOL FESEM
2
005, 17, 2688–2692.
1 H. L. Li, H. Sun, W. Qi, M. Xu and L. X. Wu, Angew. Chem., Int. Ed.,
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2
6
700F electron microscope, and transmission electron micro-
32 H. L. Li, Y. Yang, Y. Z. Wang, W. Li, L. H. Bi and L. X. Wu, Chem.
Commun., 2010, 46, 3750–3752.
scopic (TEM) images were carried out on a Hitachi H8100 elec-
tron microscope.
33 H. L. Li, Y. Yang, Y. Z. Wang, C. Y. Wang, W. Li and L. X. Wu, Soft
Matter, 2011, 7, 2668–2673.
3
3
4 A. Nisar, J. Zhuang and X. Wang, Chem. Mater., 2009, 21, 3745–3751.
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Acknowledgements
3
6 X. H. Yan, P. L. Zhu, J. B. Fei and J. B. Li, Adv. Mater., 2010, 22, 1283–
1287.
This work was financially supported by the National Basic
Research Program (2007CB808003), National Natural Science
Foundation of China (20973082, 20921003), and Open Project
of State Key Laboratory of Polymer Physics and Chemistry,
CAS.
3
7 D. Volkmer, B. Bredenkötter, J. Tellenbröker, P. Kögerler, D. G. Kurth,
P. Lehmann, H. Schnablegger, D. Schwahn, M. Piepenbrink and
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6, 8062–8071.
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4
4
4
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10050 | Dalton Trans., 2012, 41, 10043–10051
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