J.-H. Park et al. / Materials Research Bulletin 47 (2012) 836–842
841
Fig. 6. Schematic illustration showing the possible mechanism for the formation of GaN NWs on the (a) too small, (b) optimum and (c) too large sizes of the nano-patterns on
Si(1 1 1) substrates.
References
4. Conclusions
In summary, we have selectively grown high quality GaN NW
arrays on nano-patterned Si(1 1 1) substrate by MOCVD
technique with the variation of pattern size. The different
growth behaviors of GaN NWs were observed on different sizes
of the nano-patterned Si(1 1 1) substrates. Nano-pattern size can
be conveniently altered by varying the Au sputtering time of 10,
30, 50 and 120 s. There was no trace of any catalytic metal or
alloy cluster at top end of the grown GaN NWs because the Au
was completely etched by Au etchant before growing NWs.
Based on the experimental observation, we can conclude that
nano-patterns having the diameter of 50 nm is most favorable
for the GaN NWs growth. The selective growth of GaN NWs is
very sensitive to the diameter of nano-patterns; the lateral
dimensions of GaN NWs were correlated with the initial size of
Au nano-droplets and the related diameter of the fabricated
nano-patterns. These results suggested that the suitable
diameter of the fabricated nano-pattern on Si(1 1 1) for selective
area growth of GaN NWs having excellent characteristics is most
essential in order to apply it for electronic and optoelectronic
applications.
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This research was supported by Basic Science Research Program
through the National Research Foundation of Korea (NRF) funded
by (NRL.R0A-2008-000-20031-0) of Korean Government
(MOEHRD), and the Human Resource Development (Proj.No:
201040100660) of the Korea Institute of Energy Technology
Evaluation and Planning (KETEP) grant funded by the Korea
Government Ministry of Knowledge Economy.