Full Length ArticleElectronic and atomic structure studies of Tin oxide (cas 1332-29-2) layers using X-ray absorption near edge structure spectroscopy data modelling

Add time:08/17/2019    Source:sciencedirect.com

The phase composition and local atomic and electronic structure of Tin oxide (cas 1332-29-2) layers have been studied by applying synchrotron X-ray absorption near edge structure spectroscopy. The linear combination analysis of the achieved results have been performed using first-principles calculated reference data for main tin-oxygen crystalline compounds. Our results suggest that proposed modelling approach successfully allows the reliable interpretation for Sn M4,5 X-ray absorption near edge spectra caused by appropriate atomic structure reconstruction and phase transformation dynamics in thermally oxidized tin oxide layers produced by magnetron sputtering.

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