Published on Web 03/04/2008
Variable Density Effect of Self-Assembled Polarizable
Monolayers on the Electronic Properties of Silicon
Naama Peor, Ruthy Sfez, and Shlomo Yitzchaik*
The Institute of Chemistry and the Hebrew UniVersity Center for Nanoscience and
Nanotechnology, The Hebrew UniVersity of Jerusalem, Jerusalem 91904, Israel
Received October 16, 2007; E-mail: sy@cc.huji.ac.il
Abstract: Electronic structures at the Si/SiO2/molecule interfaces were studied by Kelvin probe techniques
(contact potential difference) and compared to theoretical values derived by the Helmholtz equation. Two
parameters influencing the electronic properties of n-type <100> Si/SiO2 substrates were systematically
tuned: the molecular dipole of coupling agent molecules comprising the layer and the surface coverage of
the chromophoric layer. The first parameter was checked using direct covalent grafting of a series of
trichlorosilane-containing coupling agent molecules with various end groups causing a different dipole with
the same surface number density. It was found that the change in band bending (∆BB) clearly indicated
a major effect of passivation due to two-dimensional polysiloxane network formation, with minor differences
resulting from the differences in the end groups’ capacity to act as “electron traps”. The change in electron
affinity (∆EA) parameter increased upon increasing the dipole of the end group comprising the monolayer,
resulting in a range of 600 mV. Moreover, a shielding effect of the aromatic spacer compared with the
aliphatic spacer was found and estimated to be about 200 mV. The density effect was examined using the
4-[4-(N,N-dimethylamino phenyl)azo]pyridinium halide chromophore which has a calculated dipole of more
than 10 D. It was clearly shown that upon increasing surface chromophoric coverage an increase in the
electronic effects on the Si substrate was observed. However, a major consequence of depolarization was
also detected while comparing the experimental and calculated values.
device performances can be tuned.24-32 Polar molecules are
often used to modify electronic properties such as barrier height
values1-6 and work functions (WF).7-10 The chemical func-
tionality directed from the surface up has a crucial influence
on the resulting surface properties, both structurally and
electronically.11 Indeed, it was already shown that organic self-
Introduction
The adsorption of organic molecules on inorganic semicon-
ductors substrates has attracted increasing interest in past
decades due to their ability to control and tune the electronic
properties of semiconductors and metal surfaces;1-23 ergo,
(1) Vilan, A.; Cahen, D. Trends Biotechnol. 2002, 20, 22-29.
(2) Haick, H.; Ambrico, M.; Ligonzo, T.; Tung, R. T.; Cahen, D. J. Am. Chem.
Soc. 2006, 128, 6854-6869.
(15) Cohen, R.; Kronik, L.; Shanzer, A.; Cahen, D.; Liu, A.; Rosenwaks, Y.;
Lorenz, J. K.; Ellis, A. B. J. Am. Chem. Soc. 1999, 121, 10545-10553.
(16) Cohen, R.; Kronik, L.; Vilan, A.; Shanzer, A.; Rosenwaks, Y.; Cahen, D.
AdV. Mater. 2000, 12, 33-37.
(17) Cahen, D.; Kahn, A.; Umbach, E. Mater. Today 2005, 8, 32-41.
(18) Cui, Y.; Lieber, C. M. Science 2001, 291, 851-853.
(19) Ishii, H.; Sugiyama, K.; Ito, E.; Seki, K. AdV. Mater. 1999, 11, 605-625.
(20) Saito, N.; Hayashi, K.; Sugimura, H.; Takai, O. Langmuir 2003, 19, 10632-
10634.
(3) Vilan, A.; Shanzer, A.; Cahen, D. Nature (London) 2000, 404, 166-168.
(4) Ashkenasy, G.; Cahen, D.; Cohen, R.; Shanzer, A.; Vilan, A. Acc. Chem.
Res. 2002, 35, 121-128.
(5) Zuppiroli, L.; Si-Ahmed, L.; Kamaras, K.; Nu¨sch, F.; Bussac, M. N.; Ades,
D.; Siove, A.; Moons, E.; Gra¨tzel, M. Eur. Phys. J. B 1999, 11, 505.
(6) Crispin, X.; Geskin, V.; Crispin, A.; Cornil, J.; Lazzaroni, R.; Salaneck,
W. R.; Bredas, J. L. J. Am. Chem. Soc. 2002, 124, 8131-8141.
(7) Kru¨ger, J.; Bach, U.; Gra¨tzel, M. AdV. Mater. 2000, 12, 447-451.
(8) Ofir, Y.; Zenou, N.; Goykhman, I.; Yitzchaik, S. J. Phys. Chem. B 2006,
101, 8002-8009.
(21) Reed, M. A.; Tour, J. M. Appl. Phys. Lett. 2000, 77, 1224.
(22) Iozzi, M. F.; Cossi, M. J. Phys. Chem. B 2005, 109, 15383-15390.
(23) Seker, F.; Meeker, K.; Kuech, T. F.; Ellis, A. B. Chem. ReV. 2000, 100,
2505-2536.
(9) Nuesch, F.; Rotzinger, F.; Si-Ahmed, L.; Zuppiroli, L. Chem. Phys. Lett.
1998, 288, 861-867. Ganzorig, C.; Kwak, K.-J.; Yagi, K.; Fujihira, M.
Appl. Phys. Lett. 2001, 79, 272-274. Rudich, Y.; Benjamin, I.; Naaman,
R.; Thomas, E.; Trakhtenberg, S.; Ussyshkin, R. J. Phys. Chem. A 2000,
104, 5238-5245. Linford, M. R.; Fenter, P.; Eisenberger, P. M.; Chidsey,
C. E. D. J. Am. Chem. Soc. 1995, 117, 3145-3155.
(24) Wu, D. G.; Ashkenasy, G.; Shvarts, D.; Ussyshkin, R. V.; Naaman, R.;
Shanzer, A.; Cahen, D. Angew. Chem., Int. Ed. 2000, 39, 4496-4500.
(25) Wu, D. G.; Cahen, D.; Graf, P.; Naaman, R.; Nitzan, A.; Shvarts, D.
Chem.sEur. J. 2001, 7, 1743-1749.
(26) Cahen, D.; Naaman, R.; Vager, Z. AdV. Funct. Mater. 2005, 15, 1571-
1578.
(10) Si-Ahmed, L.; Nu¨esch, F.; Zuppiroli, L.; Franc¸ois, B. Macromol. Chem.
Phys. 1998, 199, 625-632.
(27) Patolsky F.; Zheng, G. F.; Lieber, C. M. Anal. Chem. 2006, 78, 4260-
4269 and references therein.
(11) Ulman, A. Chem. ReV. 1996, 96, 1533-1554. Ulman, A. An Introduction
to Ultrathin Organic Films; Academic Press: Boston, 1991. Kronik, L.;
Shapira, Y. Surf. Sci. Rep. 1999, 37, 1-299.
(28) Niwa, D.; Yamada, Y.; Homma, T.; Osaka, T. J. Phys. Chem. B 2004,
108, 3240-3245.
(29) Rampi, M. A.; Whitesides, G. M. Chem. Phys. 2002, 281, 373-391.
(30) Salomon, A.; Cahen, D.; Lindsay, S.; Tomfohr, J.; Engelkes, V. B.; Frisbie,
C. D. AdV. Mater. 2004, 16, 477.
(12) Cohen, R.; Zenou, N.; Cahen, D.; Yitzchaik, S. Chem. Phys. Lett. 1997,
279, 270-274. Zenou, N.; Zelichenok, A.; Yitzchaik, S.; Cohen, R.; Cahen,
D. ACS Symp. Ser. 1997, 695, 57-66.
(31) Shen, Y.; Hosseini, A. R.; Wong, M. H.; Malliaras, G. G. Chem. Phys.
Chem. 2004, 5, 16-25.
(13) Sfez, R.; Peor, N.; Cohen, S. R.; Cohen, H.; Yitzchaik, S. J. Mater. Chem.
2006, 16, 4044-4050.
(32) Chabinyc, M. L.; Chen, X.; Holmlin, R. E.; Jacobs, H.; Skulason, H.; Frisbie,
C. D.; Mujica, V.; Ratner, M. A.; Rampi, M. A.; Whitesides, G. M. J. Am.
Chem. Soc. 2002, 124, 11730-11736.
(14) Ray, S. G.; Cohen, H.; Naaman, R.; Liu, H.; Waldeck, D. H. J. Phys. Chem.
B 2005, 109, 14064-14073.
9
4158
J. AM. CHEM. SOC. 2008, 130, 4158-4165
10.1021/ja077933g CCC: $40.75 © 2008 American Chemical Society