Electron-impact ionization cross sections of the SiF3 free radical

Article abstract of DOI:10.1063/1.454836

Absolute cross sections for electron-impact ionization of the SiF3 free radical from threshold to 200 eV are presented for formation of the parent SiF3 ion and the fragment SiF2 , SiF+, and Si+ ions.A 3 keV beam of SiF3 is prepared by near-resonant charge transfer of SiF3 with 1,3,5-trimethylbenzene.The beam contains only ground electronic state neutral radicals, but with as much as 1.5 eV of vibrational energy.The absolute cross section for formation of the parent ion at 70 eV is 0.67 +/- 0.09 Angstroem².At 70 eV the formation of SiFi2⁺ is the major process, having a cross section 2.51 +/- 0.02 times larger than that of the parent ion, while the SiF+ fragment has a cross section 1.47 +/- 0.08 times larger than the parent.Threshold measurements show that ion pair dissociation processes make a significant contribution to the formation of positively charged fragment ions.

Full text of DOI:10.1063/1.454836

Electronimpact ionization cross sections of the SiF3 free radical
Todd R. Hayes, Randy J. Shul, Frank A. Baiocchi, Robert C. Wetzel, and Robert S. Freund
Citation: The Journal of Chemical Physics 89, 4035 (1988); doi: 10.1063/1.454836
View online: http://dx.doi.org/10.1063/1.454836
View Table of Contents: http://scitation.aip.org/content/aip/journal/jcp/89/7?ver=pdfcov
Published by the AIP Publishing
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128.59.226.54 On: Tue, 09 Dec 2014 18:31:27

This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to IP:
128.59.226.54 On: Tue, 09 Dec 2014 18:31:27

This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to IP:
128.59.226.54 On: Tue, 09 Dec 2014 18:31:27

This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to IP:
128.59.226.54 On: Tue, 09 Dec 2014 18:31:27

This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to IP:
128.59.226.54 On: Tue, 09 Dec 2014 18:31:27

This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to IP:
128.59.226.54 On: Tue, 09 Dec 2014 18:31:27