Adv. Inorg. Radiochem., 1986, 30, 1; H. R. Keable and M. Kilner,
Enraf-Nonius CAD4 four cycle axis diffractometer (for 1) or
Rigaku RAXIS RAPID imaging plate diffractometer (for 2 and
4) with graphite monochromated Mo-Kα radiation (λ = 0.71069
Å). The diffraction data of 1 were collected at 296(2) K using
the ω–2θ technique to a maximum 2θ value of 55.0Њ, whereas
those of 2 and 4 were collected at 223(2) K in the θ ranges 1.79 ≤
θ ≤ 27.48Њ and 2.63 ≤ θ ≤ 27.48Њ, respectively (44 oscillation
exposures). Data collection and cell refinement of 1 were
carried out using the program system ‘CAD4 Express’19 on a
MS VAX computer, whereas those of 2 and 4 were done using
“MSC/AFC Diffractometer Control”20 on a Pentium com-
puter. The structure was solved by direct methods (SIR-97, 1)21
or the Patterson method (DIRDIF-94 PATTY, 2 and 4),22 and
was refined using full-matrix least squares (SHELXL-97)23
based on F 2 for all independent reflections measured. The H
atoms were located at ideal positions except for those of the
methyl groups which were allowed to rotate about the CH3
(adjacent atom) bonds. They were included in the refinement,
but were restricted to riding on the carbons to which they were
bonded. Isotropic thermal factors for the H atoms were held to
1.2 to 1.5 times (for methyl groups) Ueq of the parent atoms.
Further details are listed in Table 4.
J. Chem. Soc., Dalton Trans., 1972, 1535.
4 M. Yoshioka, T. Kawakita and M. Ohno, Tetrahedron Lett., 1989,
30, 1657; H. Takahashi, T. Kawakita, M. Ohno, M. Yoshioka and
S. Kobayashi, Tetrahedron, 1992, 48, 5691; M. J. Rozema, A. Sidduri
and P. Knochel, J. Org. Chem., 1992, 57, 1956; W. Brieden,
R. Ostwald and P. Knochel, Angew. Chem., Int. Ed. Engl., 1993, 32,
582; S. Pritchett, D. H. Woodmansee, T. J. Davis and P. J. Walsh,
Tetrahedron Lett., 1998, 39, 5941.
5 S. Pritchett, P. Gantzel and P. J. Walsh, Organometallics, 1997, 16,
5130.
6 S. Pritchett, D. H. Woodmansee, P. Gantzel and P. J. Walsh, J. Am.
Chem. Soc., 1998, 120, 6423.
7 S. Pritchett, P. Gantzel and P. J. Walsh, Organometallics, 1999, 18,
823.
8 L. T. Armistead, P. S. White and M. R. Gagné, Organometallics,
1998, 17, 216.
9 R. Baumann, M. Davis and R. R. Schrock, J. Am. Chem. Soc., 1997,
119, 3830; R. Baumann and R. R. Schrock, J. Organomet. Chem.,
1998, 557, 69; R. R. Schrock, F. Schattenmann, M. Aizenberg
and W. M. Davis, Chem. Commun., 1998, 199; L.-C. Liang, R. R.
Schrock and W. M. Davis, Organometallics, 2000, 19, 2526; see also
ref. 12–14.
10 M. Aizenberg, L. Turculet, W. M. Davis, F. Schattenmann and
R. R. Schrock, Organometallics, 1998, 17, 4795.
11 M. A. Flores, M. R. Manzoni, R. Baumann, W. M. Davis and
R. R. Schrock, Organometallics, 1999, 18, 3220.
12 R. Baumann, R. Stumpf, W. M. Davis, L. C. Liang and
R. R. Schrock, J. Am. Chem. Soc., 1999, 121, 7822.
13 H. W. Görlitzer, M. Spiegler and R. Anwander, Eur. J. Inorg. Chem.,
1998, 1009.
CCDC reference numbers 160977–160979.
lographic data in CIF or other electronic format.
14 I. Kim, Y. Nishihara, R. F. Jordan, R. D. Rogers, A. L. Rheingold
and G. P. A. Yap, Organometallics, 1997, 16, 3314.
15 C. H. Lee, Y.-H. La and J. W. Park, Organometallics, 2000, 19, 344.
16 Other examples of dimeric compounds, (Al): E. J. Corey,
S. Sarshar and J. Bordner, J. Am. Chem. Soc., 1992, 114, 7938; (In):
A. Blaschette, A. Michalides and P. G. Jones, J. Organomet. Chem.,
1991, 411, 57.
Acknowledgements
A part of this study was financially supported by the Japan
Society for the Promotion of Science (10450343, 13450374,
1302090) and CREST, the Japan Science and Technology
Corporation (JST).
17 For representative reviews see: W. Kaminsky, J. Chem. Soc., Dalton
Trans., 1998, 1413; H. H. Brintzinger, D. Fischer, B. Rieger and
R. Waymouth, Angew. Chem., Int. Ed. Engl., 1995, 34, 1143; G. J. P.
Biritovsk, V. C. Gibson and D. F. Wass, Angew. Chem., Int. Ed.,
1999, 38, 428.
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