SAMs Based on Pd-Containing Organometallic Thiols
J. Phys. Chem. A, Vol. 113, No. 52, 2009 14739
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estimated for SAM(4) and SAM(5), respectively; SAM(5)
appears to attain a more upstanding position on the surface.
Concerning the thickness fo the SAM samples, the
evaluated average tilt angles lead to calculated expected
values that can be compared to the ones experimentally
determined by the HRXPS Au 4f signals’ attenuation. Taking
an XRD-based length of the molecule (including just the S
atom of the terminal thiolate group) dXRD and estimating a
S-Au bond length value of 1.8 Å,29 the organometallic
thioles SAM thickness was estimated by
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d ) dXRD cos ꢀ + 1.8
obtaining a thickness of 1.8 nm for SAM(5) and 1.0 for
SAM(4). Since the SAM(3) molecules results are not
oriented, the same calculation for this system was not
performed. These values are overestimated due to the
incertitude in tilt angle determination by NEXAFS (about
15% of the estimated angle value) and the approximated XRD
molecular lengths; however, they represent the maximum
thickness values compatible with a monolayer coverage on
the substrate. The comparison with HRXPS data confirms
that the procedure followed to produce SAMs leads to
substrate coverage degrees of no more than one monolayer.
4. Conclusions
Multilayers and self-assembled monolayers of organometallic
thiols in situ prepared starting from organometallic thiolates,
that is, trans-[Pd(PBu3)2(SCOCH3)2], trans-[(C6H5CtC)Pd-
(PBu3)2(SCOCH3)], and trans,trans-[(CH3COS)Pd(PBu3)2-
(CtC-C6H4-C6H4-CtC)(PBu3)2Pd(SCOCH3)], were depos-
ited onto gold surfaces by a dipping procedure. The self-
assembly of the thiols on the gold surface was assessed, and
the HR-XPS measurements joined with NEXAFS studies
allowed us to evaluate the anchoring of the organometallic
moieties through the sulfur linkage to gold. Depending on the
investigated molecule, the interaction occurring at the interface
and the molecular orientation of the thiols on the surface with
tilt angles (defined as the angle between the molecular axis and
the normal to the surface) of about 30-40° was observed. The
thickness of the obtained SAMs was calculated to be 0.2, 0.4,
and 1.1 nm for samples SAM(3), SAM(4), and SAM(5),
respectively. By comparison with molecular dimensions evalu-
ated from the XRD data, these values are indicative of
monolayer or submonolayer adsorption regimes. NEXAFS
studies suggested a high level of molecular organization for
SAMs 4 and 5. These SAMs offer a promising perspective for
the applications of these materials in nanoelectronics.
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Acknowledgment. The authors gratefully acknowledge the
financial support of University La Sapienza “Ateneo 2007”.
Supporting Information Available: Chemical synthesis
details and XPS characterization data of mono and binuclear
Pd(II) complexes, together with crystallographic data table and
CIF files for complexes 2, 3, and 5 are supplied. This material
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