(SiMe2), 0.8 (SiMe), 127.0 (CF3); 19F NMR (C6D6, 235.3
MHz): d ꢀ74.1 (CF3); Anal. Calc. for C28H75F9O9S3Si13
(1188.17): C, 28.30; H, 6.36. Found: C, 28.01; H, 6.13%.
5
6
(a) A. Sekiguchi, M. Nanjo, C. Kabuto and H. Sakurai, J. Am.
Chem. Soc., 1995, 117, 4195; (b) C. Marschner and E. Hengge in
Organosilicon Chemistry II, ed. N. Auner and J. Weis, Wiley-
VCH, 1997, p. 333; (c) M. Nanjo, T. Sunaga, A. Sekiguchi and
E. Horn, Inorg. Chem. Commun., 1999, 203.
(a) M. Ishikawa, J. Iyoda, H. Ikeda, K. Kotake, T. Hashimoto
and M. Kumada, J. Am. Chem. Soc., 1981, 103, 4845; (b) J. Y.
Corey, D. M. Kraichely, J. L. Huhmann and J. Braddock-Wilk-
ing, Organometallics, 1994, 13, 3408; (c) J. Y. Corey, D. M.
Kraichely, J. L. Huhmann, J. Braddock-Wilking and A. Linde-
berg, Organometallics, 1995, 14, 2704; (d) U. Herzog andG.
Roewer, in Organosilicon Chemistry III: From Molecules to Ma-
terials, ed. N.Auner and J. Weis, VCH, Weinheim, 1998, p. 312; (e)
U. Herzog, N. Schulze, K. Trommer and G. Roewer, J. Organo-
met. Chem., 1997, 547, 133.
X-ray crystallography
The data collection for 2b was done on a STOE-IPDS dif-
fractometer using a graphite monochromated Mo Ka radia-
tion. The structure was solved by direct methods (SHELXS-86)
and refined by the full matrix least-squares method against F2
(SHELXL-93)21 All non-hydrogen atoms were refined aniso-
tropically. The hydrogen atoms were placed in theoretical
positions and refined using the riding model.
7
8
1a was first prepared by D. B. Puranik, M. P. Johnson and M. J.
Fink, Organometallics, 1989, 8, 770.
Crystal data. C16H42F6O6S2Si7, M ¼ 705.25, colourless
prism, monoclinic, space group P21/c, a ¼ 8.992(2), b ¼
16.534(3), c ¼ 23.992(5) A, b ¼ 92.85(3)1, V ¼ 3562.6(13)
A3, T ¼ 200 K, Z ¼ 4, m(Mo-Ka) ¼ 0.443 mmꢀ1, 8670
reflections measured, 4657 reflections independent of symme-
try, 3692 reflections observed [I 4 2s(I)], 334 parameters,
R1 ¼ 0.045, wR2 (all data) ¼ 0.121.z
In a previous work 2a was produced analogously using toluene as
solvent, but neither was the compound isolated nor were analytical
data given, except for the Si-NMR spectrum which is in agreement
with our data. U. Baumeister, K. Schenzel, R. Zink and K.
Hassler, J. Organomet. Chem., 1997, 543, 117.
The conformations are roughly classified as cis (C) and trans (T)
by dihedral angles of 0–301 and 150–1801, respectively.
9
10 (a) J. Michl and R. D. Miller, Chem. Rev., 1989, 89, 1359; (b) R.
West, in The Chemistry of Organic Silicon Compounds, ed. S. Patai
and Z. Rappoport, Wiley, Chichester, UK, 1989, p. 1207.
11 A. Asadi, A. G. Avent, C. Eaborn, M. S. Hill, P. B. Hitchcock, M.
M. Meehan and J. D. Smith, Organometallics, 2002, 21, 2183.
12 H.-W. Lerner, N. Wiberg, M. Bolte, H. Noeth and J. Knizek, Z.
Naturforsch. Teil B, 2002, 57, 177.
13 E. Lukevics, O. Pudova and R. Sturkovich, Molecular Structure of
Organosilicon Compounds, Horwood, Chichester, UK, 1989,
p. 180.
14 P. D. Lickiss, The Chemistry of Organic Silicon Compounds, ed. Z.
Rappoport and Y. Apeloig, Wiley, Chichester, UK, 1998, Vol. 2,
Part 1, Ch. 11.
15 The Si–OTf distances in pentacoordinate organosilicon structures
are usually longer than in tetracoordinate derivatives.
Acknowledgements
We thank Prof. Dr H. Oehme for his generous support and we
gratefully acknowledge the support of our research by the
Fonds der Chemischen Industrie.
References
1
(a) I. El-Sayed, Y. Hatanaka, C. Muguruma, S. Shimada, M.
Tanaka, N. Koga and M. Mikami, J. Am. Chem. Soc., 1999, 121,
5095; (b) K. Tamao, H. Tsuji, M. Terada, M. Asahara, S.
Yamaguchi and A. Toshimitsu, Angew. Chem., 2000, 112, 3425
(Angew. Chem., Int. Ed., 2000, 39, 3287); (c) Y. Hatanaka, J.
Organomet. Chem., 2003, 685, 207.
16 (a) T. Muller, R. Meyer, D. Lennartz and H.-U. Siehl, Angew.
¨
Chem., Int. Ed., 2000, 39, 3074; (b) R. Meyer, K. Werner and T.
2
(a) A. R. Bassindale and T. J. Stout, J. Organomet. Chem., 1984,
271, C1; (b) K. Matyjaszewski and Y. L. Chen, J. Organomet.
Chem., 1988, 340, 7; (c) W. Uhlig and A. Tzschach, J. Organomet.
Chem., 1989, 378, C1; (d) K. E. Ruehl and K. Matyjaszewski, J.
Muller, Chem.-Eur. J., 2002, 8, 1163.
¨
17 (a) C. Eaborn, P. D. Lickiss, S. T. Najim and W. A. Stancyk, J.
Chem. Soc., Chem. Commun., 1987, 1461; (b) C. Eaborn, K. L.
Jones and P. D. Lickiss, J. Chem. Soc., Chem. Commun., 1989,
595; (c) C. Eaborn, K. L. Jones and P. D. Lickiss, J. Chem. Soc.,
Perkin Trans. 2, 1992, 489; (d) C. Eaborn, K. L. Jones, P. D.
Lickiss and W. A. Stancyk, J. Chem. Soc., Perkin Trans. 2, 1993,
59; (e) P. D. Lickiss and P. C. Masangane, Abstract of Papers,
ISOS XII, 2A14, Sendai, Japan, 1999; (f) P. D. Lickiss and P. C.
Masangane, Abstract of Papers, 34th Organosilicon Symposium
C-16, White Plains, New York, 2001.
18 C. Krempner, D. Hoffmann and H. Reinke, J. Organomet. Chem.,
2002, 662, 1.
19 R. Fischer, T. Konopa, J. Baumgartner and C. Marschner,
Organometallics, 2004, 23, 1899.
20 C. Kayser, G. Kickelbick and C. Marschner, Angew. Chem., Int.
Ed., 2002, 41, 989.
21 G. M. Sheldrick, SHELXS-86, Program for solution of crystal
structures, Acta Crystallogr., 1990, A46, 467; G. M. Sheldrick,
SHELXL-93, Program for refinement of crystal structures,
Organomet. Chem., 1991, 410, 1; (e) C. Rudinger, H. Beruda and
¨
H. Schmidbaur, Chem. Ber., 1992, 125, 1401; (f) W. Uhlig, Chem.
Ber., 1992, 125, 47; (g) W. Uhlig, J. Organomet. Chem., 1994, 452,
29; (h) C. Rudinger, H. Beruda and H. Schmidbaur, Z. Natur-
¨
forsch., 1994, 49b, 1348; (i) W. Uhlig and C. Tretner, J. Organo-
met. Chem., 1994, 467, 31; (j) C. Tretner, B. Zobel, R.
Hummeltenberg and W. Uhlig, J. Organomet. Chem., 1994, 468,
94.
For a review see: (a) W. Uhlig, Chem. Ber., 1996, 129, 733; (b) W.
Uhlig, Polym. Adv. Technol., 1997, 8, 731; (c) W. Uhlig, Silicon
Chem., 2002, 1, 129; (d) W. Uhlig, Prog. Polym. Sci., 2002, 27, 255;
(e) W. Uhlig, J. Organomet. Chem., 2003, 685, 70.
(a) J. Chrusciel, S. W. Gorgen-Wylie and K. Matyjaszewski,
Organometallics, 1992, 11, 3257; (b) E. Fossum, S. W. Gorgen-
Wylie and K. Matyjaszewski, Organometallics, 1994, 13, 1695; (c)
U. Poschl and K. Hassler, Organometallics, 1995, 14, 4948; (d) A.
¨
Kleewein and H. Stuger, Monatsh. Chem., 1999, 130, 69.
¨
3
4
University of Gottingen, Germany, 1993.
¨
z CCDC reference number 288229. For crystallographic data in CIF or
other electronic format see DOI: 10.1039/b408573f
1584
N e w J . C h e m . , 2 0 0 5 , 2 9 , 1 5 8 1 – 1 5 8 4