O.V. Borshchev et al.
Dyes and Pigments 185 (2021) 108911
(
(
thin-film) and solution-processed (ultrathin) ones. We found that
Hex-Ph) -TTA oligomer shows ambipolar charge transport and stronger
-TTA.
was added in the cell after recording the CV curve of the studied com-
pound. The onset oxidation potential evaluated from the CV data was
2
electroluminescence as compared to (Hex-T)
2
used to estimate the HOMO energy, according to the following equation
ox
E
HOMO = ꢀ (E onset+4.8) eV.
2
. Experimental section
.1. Materials
All reagents were obtained from Sigma-Aldrich or ABCR and used as
2
.3. Theoretical calculation
2
Density functional theory (DFT) and time-dependent DFT (TDDFT)
calculations were carry out using GAMESS package [32,33] at
B3LYP/6-31G (d,p) level, which provides a reasonable tradeoff between
the calculation time and accuracy.
received. Solutions of 1.6 M and 2.5 M n-butyllithium and 2 M lithium
diisopropylamide (LDA) (CAUTION: solutions can ignite in contact with
water and carbon dioxide, this compound should be handled under ni-
trogen with special equipment), 3-bromothiophene, potassium and so-
2.4. Device fabrication and measurement
2
dium carbonate, CuCl , quinoline and sulfur were obtained from Acros
organics. 3,4-Dibromothiophene, ethyl 2-thioxoacetate, LiOH and po-
tassium ferricyanide were obtained from ABCR and used as received.
Organoboron derivatives 4-hexyl-1-(4,4,5,5-tetramethyl-1,3,2-dioxa-
borolan-2-yl)benzene (3) and 2-(5-Hexyl-2-thienyl)-4,4,5,5-tetra-
methyl-1,3,2-dioxaborolane (4) were synthesized as described
elsewhere [27,28]. THF, DMF, NMP, chloroform, toluene, acetic acid
and diethyl ether were dried and purified according to the standard
techniques and then used as the solvents.
Two types of OFET samples were fabricated on precleaned Si/SiO2
substrates: vacuum-processed (thin-film) and solution-processed (ul-
trathin) ones. The first one was based on the thermally vacuum depos-
ited polycrystalline oligomer thin films with metal electrodes and the
second – on the solution-grown ultrathin (2D) single crystals of the
oligomers with organic (PEDOT:PSS) electrodes.
Substrate pretreatment: Silicon substrates coated with a thermally
grown 200-nm-thick layer of SiO were used after the following cleaning
2
steps. First, the substrates were cleaned in an ultrasonic bath for 10 min
2
.2. Characterization
in isopropanol, washed in distilled water, and dried in a stream of argon.
After that the substrates were exposed to ultraviolet radiation for 15 min
(PL16-110, SenLights). For thin-film samples hexamethyldisilazane
(HMDS) self-assembled monolayer was deposited by keeping the sub-
strates in saturated HMDS vapors in a closed Petri dish for 20 h in a
glovebox with the inert atmosphere. All further steps of the thin-film
OFET samples fabrication and measurement were conducted in argon-
filled gloveboxes.
Differential scanning calorimetry (DSC) was carried out on a Mettler
Toledo DSC30 instrument under nitrogen atmosphere at the scanning
◦
-1
◦
rate of 20 C min in the temperature range of +20–370 C. N
2
flow of
5
0 mL/min was used. Thermogravimetric analysis (TGA) was carried
out using Mettler Toledo TG50 system and reported decomposition
temperatures represent the temperature observed at 5% mass loss. New
compounds were studied in air and under nitrogen flow of 200 mL/min.
UV–vis absorption spectroscopy measurements were conducted on a
Shimadzu UV-2501PC (Japan) spectrophotometer in the standard 10
mm photometric quartz cuvette using THF solutions with the concen-
2
Solution-processed films: (Hex-Ph) -TTA was dissolved at a concen-
tration in the range of 0.1–0.8 g/L in ortho-dichlorobenzene with stir-
◦
ring (1200 rpm) and heating (60 C) during 3 h. The solution (<100
μL)
was spin-coated (SCS G3-8, Spincoating Systems) at 600–800 rpm for 30
s or drop-cast on the substrates, which were then placed in a closed Petri
dish for 5–15 h to provide conditions for slow solvent evaporation
[34–36]. The optimal concentration and deposition method were chosen
to maximize the lateral sizes of the thinnest domains of the films.
ꢀ 5
trations of 10 M. Photoluminescence (PL) spectra were obtained with
a scanning spectrofluorimeter ALS01 M (Russia) with registration in
single photon counting mode at successive time intervals and automatic
adjustment of the intensity of the measured emission. Measurements
were carried out for several optical densities in the range from 0.06 to
Vacuum-processed films: (Hex-Ph) -TTA and (Hex-T)
2
2
-TTA were
◦
0
.12 absorbance units in 10 mm cuvette, measurement geometry – 90 .
evaporated onto HMDS-treated Si/SiO substrates by thermal deposition
2
The photoluminescence quantum yield (PLQY) was measured by
using a vacuum system (Univex 300 G, Leybold) at residual gas pressure
ꢀ 6
ꢀ 6
comparing the integral PL intensity of 10 M diluted solutions in THF
with the integral PL intensity of the standard as described elsewhere
of 2.6–4.7 × 10 mbar with deposition rates in the range of 1–7 Å/s,
until the thickness reached 50 nm according to a thickness monitor
(TM400, Maxtek).
[
29]. As the standards in measuring the PLQY a solution of 1,4-bis
5-phenyloxazol-2-yl)benzene (POPOP) in cyclohexane (PLQY = 0.93)
was used.
Thin polycrystalline films for the study of PL properties were ob-
(
Morphological and structural characterization: The grown films were
characterized with the use of differential interference-contrast micro-
scopy (AxioImager A2m, Zeiss) in circularly polarized light (Epi C-DIC)
to determine the lateral dimensions of the films, estimate their crystal-
linity and surface homogeneity. Atomic force microscopy (AFM) was
used to determine the thickness of the films.
tained by deposition from a THF solution on a quartz substrate. Mea-
surements of the PL spectra in polycrystalline thin films were carried out
in an integrating sphere. Fluorescence was register both when the film
was illuminated in a line (through transmission) and under frontal
illumination. The calculated luminescence spectra of polycrystalline
films (Fig. 2 blue curve) was obtained in accordance with the technique
described earlier [30]. The PLQY of polycrystalline films was by com-
parison with the luminescence intensity of a tetraphenylbutadiene
polycrystalline film with a known quantum yield (0.9) [31].
Fabrication and Characterization of OFETs: OFETs were fabricated on
2
Si/SiO substrates in the bottom-gate top-contacts architecture. Ultra-
thin samples were deposited from solution on the precleaned substrates
as described above. As the top electrodes, PEDOT:PSS (PH 1000, Her-
aeus GmbH) with an additive (5% dimethyl sulfoxide) was deposited by
using a microplotter (GIX Micro-plotter Desktop, SonoPlot). As the ratio
of the OFET channel width (W) to its length (L) was about unity, the
active layer was carefully scratched out around the W × L area to avoid
the current flow out of this area and hence overestimation of the charge-
carrier mobility. On the substrates with vacuum-deposited thin films the
source and drain electrodes were also thermally evaporated in vacuum
through shadow masks (Ossila, UK) which led to 20 devices per sub-
2 2
Сyclic voltammetry (CV) measurements were performed in CH Cl
with 0.1 M tetrabutylammonium hexafluorophosphate as supporting
electrolyte using a potentiostat (P-8nano, Elins) in combination with a
three-electrode cell (Gamry). Pt disk (3 mm), Pt wire, and Ag/AgCl were
used as working, counter and reference electrodes, respectively. Because
of low solubility of TTA derivatives the measurements were performed
for a films drop-casted (multiple deposition from CH
2
Cl
2
solution and
strate with different values of L from 10 to 30
μ
m with the step of 5 m
μ
drying in the air) on the surface of working electrode. The measurements
were standardized by measuring the redox potential of ferrocene, which
and W = 1 mm. The two types of source/drain electrodes were used:
calcium (Ca) for electron injection and bilayer of molybdenum oxide
2