FULL PAPER
C. Wang, Q. Wu, Y. Wang, J. Am. Ceram. Soc. 2013, 96, 1815–
1820; d) Y. Q. Li, N. Hirosaki, R. J. Xie, T. Takeda, M. Mi-
tomo, Chem. Mater. 2008, 20, 6704–6714; e) R.-J. Xie, N. Hiro-
saki, Sci. Technol. Adv. Mater. 2007, 8, 588–600; f) M. Zeuner,
S. Pagano, W. Schnick, Angew. Chem. Int. Ed. 2011, 50, 7754–
7775; Angew. Chem. 2011, 123, 7898; g) R.-J. Xie, H. T.
Hintzen, J. Am. Ceram. Soc. 2013, 96, 665–687; h) N. Zhong,
X.-S. Ning, K. Chen, M. Peng, Adv. Mater. Res. 2012, 412,
175–178.
a) R.-J. Xie, N. Hirosaki, N. Kimura, K. Sakuma, M. Mitom,
Appl. Phys. Lett. 2007, 90, 191101; b) H. Yang, Y. Liu, S. Ye,
J. Qiu, Chem. Phys. Lett. 2008, 451, 218–221; c) X.-M. Wang,
C.-H. Wang, M. M. Wu, Y. X. Wang, X.-P. Jing, J. Mater.
Chem. 2012, 22, 3388–3394.
a) J. W. H. van Krevel, H. T. Hintzen, R. Metselaar, Mater.
Res. Bull. 2000, 35, 747–754; b) T. Kurushima, G. Gundiah,
Y. Shimomura, M. Mikami, N. Kijima, A. K. Cheetham, J.
Electrochem. Soc. 2010, 157, J64–J68; c) M. Seibald, T. Rosen-
thal, O. Oeckler, F. Fahrnbauer, A. Tücks, P. J. Schmidt, W.
Schnick, Chem. Eur. J. 2012, 18, 13446–13452.
a) W. B. Park, Y. Song, M. Pyo, K.-S. Sohn, Opt. Lett. 2013,
38, 1739–1741; b) J. H. Ryu, H. S. Won, Y.-G. Park, S. H. Kim,
W. Y. Song, H. Suzuki, C. Yoon, Appl. Phys. A 2009, 95, 747–
752; c) N. Kimura, K. Sakuma, S. Hirafune, K. Asano, N. Hi-
rosaki, R.-J. Xie, Appl. Phys. Lett. 2007, 90, 051109; d) X. Li,
J. D. Budai, F. Liu, J. Y. Howe, J. Zhang, X.-J. Wang, Z. Gu,
C. Sun, R. S. Meltzer, Z. Pan, Light Sci. Appl. 2013, 2, e50.
a) C. Braun, M. Seibald, S. L. Börger, O. Oeckler, T. D. Boyko,
A. Moewes, G. Miehe, A. Tücks, W. Schnick, Chem. Eur. J.
2010, 16, 9646–9657; b) N. Hirosaki, R.-J. Xie, K. Kimoto, T.
Sekiguchi, Y. Yamamoto, T. Suehiro, M. Mitomo, Appl. Phys.
Lett. 2005, 86, 211905; c) R.-J. Xie, M. Mitomo, K. Uheda, F.-
F. Xu, Y. Akimune, J. Am. Ceram. Soc. 2002, 85, 1229–1234;
d) Y. Q. Li, J. E. J. van Steen, J. W. H. van Krevel, G. Botty,
A. C. A. Delsing, F. J. DiSalvo, G. De With, H. T. Hintzen, J.
Alloys Compd. 2006, 417, 273–279; e) K. Uheda, N. Hirosaki,
Y. Yamamoto, A. Naito, T. Nakajima, H. Yamamoto, Electro-
chem. Solid-State Lett. 2006, 9, H22–H25.
a) J. W. H. van Krevel, H. T. Hintzen, R. Metselaar, A. Meijer-
ink, J. Alloys Compd. 1998, 268, 272–277; b) Y. Menke, S.
Hampshire, L. K. L. Falk, J. Am. Ceram. Soc. 2007, 90, 1566–
1573; c) K. Inoue, N. Hirosaki, R.-J. Xie, T. Takeda, J. Phys.
Chem. C 2009, 113, 9392–9397.
a) Y. Q. Li, C. M. Fang, G. de With, H. T. Hintzen, J. Solid
State Chem. 2004, 177, 4687–4694; b) C. Chen, W. Chen, B.
Rainwater, L. Liu, H. Zhang, Y. Liu, X. Guo, J. Zhou, E. Xie,
Opt. Lett. 2011, 33, 1585–1590; c) C. J. Duan, A. C. A. Delsing,
H. T. Hintzen, J. Lumin. 2009, 129, 645–649.
1200 °C for 5 h in air or under an NH3 atmosphere to produce the
final silicates or oxonitridosilicates.
Characterization: The X-ray diffraction (XRD) measurements were
carried out with a D8 Focus diffractometer using Cu-Kα radiation
(λ = 0.15405 nm). Scanning electron microscopy (SEM) micro-
graphs and energy-dispersive X-ray (EDX) spectra were obtained
using a field emission scanning electron microscope (FE-SEM,
XL30, Philips). High-resolution transmission electron microscopy
(HRTEM) was performed using PEI Tecnai G2 S-Twin with a field
emission gun operating at 200 kV. Images were acquired digitally
with a Gatan multiple CCD camera. Fourier-transform Infrared
(FTIR) spectra were measured with a Vertex Perkin–Elmer 580BIR
spectrophotometer (Bruker) with the KBr pellet technique. Ther-
mogravimetry analysis (TGA) was carried out with a Netzsch STA
409 thermoanalyzer with a heating rate of 10 °Cmin–1 in air and
under nitrogen. The PL measurements were performed with a Hita-
chi F-7000 spectrophotometer equipped with a 150 W xenon lamp
as the excitation source. The density functional theory (DFT) cal-
culation for Y4Si2N2O7 was performed with the Vienna ab initio
simulation package (VASP).[31] The diffuse reflectance spectra were
taken with a Hatachi U-4100-Vis/NIR spectrophotometer. The
temperature-dependent (300–500 K) PL spectra were performed
with a fluorescence spectrophotometer equipped with a 450 W xe-
non lamp as the excitation source (Edinburgh Instruments, FLSP-
920) with a temperature controller. The CL measurements were [5]
carried out in an ultra-high vacuum chamber (Ͻ10–8 Torr), where
the phosphors were excited by an electron beam in the voltage
range of 2.5–5.0 kV and different filament currents, and the emis-
sion spectra were recorded using an F-7000 spectrophotometer.
The luminescence decay curves were obtained from a Lecroy Wave
Runner 6100 Digital Oscilloscope (1 GHz) using a tunable laser
(pulse width: 4 ns, gate: 50 ns) as the excitation (Continuum Sunlite
OPO).
[2]
[3]
[4]
Supporting Information (see footnote on the first page of this arti-
[6]
cle): XRD patterns of the precursor for Y4Si2N2O7 (a) and the
sample calcined at 1200 °C in air (b); emission intensity of Ce3+ as
a function of its doping concentration (x) in the Y4Si2N2O7:xCe3+
sample; emission spectra of Y4Si2N2O7:yTb3+ samples with dif-
ferent Tb3+ concentrations; CIE chromaticity coordinates of
[7]
Y4Si2N2O7:yTb3+ (a) and Y4Si2N2O7:zDy3+ (b) phosphors with
different Tb3+ and Dy3+ doping concentrations; emission spectra
(a) and the emission intensity ratios (Y/B) (b) of Y4Si2N2O7:zDy3+
samples with different z values; spectral overlap between the emis-
[8]
S. Thomas, J. Oró-Solé, B. Glorieux, V. Jubera, V. Buissette, T.
Le Mercier, A. Garcia, A. Fuertes, J. Mater. Chem. 2012, 22,
23913–23920.
T.-C. Liu, H. Kominami, H. F. Greer, W. Zhou, Y. Nakanishi,
R.-S. Liu, Chem. Mater. 2012, 24, 3486–3492.
J. Lin, M. Yu, C. K. Lin, X. M. Liu, J. Phys. Chem. C 2007,
111, 5835–5845.
a) M. Kakihana, J. Sol-Gel Sci. Technol. 1996, 6, 7–55; b) S. J.
Chen, X. T. Chen, S. Yu, J. M. Hong, Z. Xue, X. Z. You, Solid
State Commun. 2004, 130, 281–285.
sion band of Y4Si2N2O7:0.01Ce3+ and the excitation spectra of
Y4Si2N2O7:0.04Tb3+ (a) as well as Y4Si2N2O7:0.01Dy3+ (b), the ex-
citation spectra of Y4Si2N2O7:0.01Ce3+
,
0.01Tb3+ (c) and
[9]
Y4Si2N2O7:0.01Ce3+, 0.01Dy3+ (d) samples monitored with the
characteristic emissions of Tb3+ and Dy3+ ions; temperature depen-
dence of the emission intensity for the Y4Si2N2O7:0.01Ce3+ sample.
[10]
[11]
Acknowledgments
[12]
[13]
K. J. D. Mackenzie, G. J. Gainsford, M. J. Ryan, J. Eur. Ceram.
Soc. 1996, 16, 553–560.
This project is financially supported by the National Natural Sci-
ence Foundation of China (NSFC) (grant numbers 51332008,
51172227, 21221061), the Joint Funds of the National Natural Sci-
ence Foundation of China and Guangdong Province (grant number
U1301242), and the National Basic Research Program of China
(grant numbers 2010CB327704, 2014CB643803).
a) L. D. Carlos, C. de Mello Donegá, R. Q. Albuquerque, S.
Alves Jr., J. F. S. Menezes, O. L. Malta, Mol. Phys. 2003, 101,
1037–1045; b) G. Bühler, C. Feldmann, Angew. Chem. Int. Ed.
2006, 45, 4864–4867; Angew. Chem. 2006, 118, 4982; c) J. Hui,
Q. Yu, Y. Long, Z. Zhang, Y. Yang, P. Wang, B. Xu, X. Wang,
Chem. Eur. J. 2012, 18, 13702–13711.
[14]
a) M. Yu, J. Lin, Z. Wang, J. Fu, S. Wang, H. J. Zhang, Y. C.
Han, Chem. Mater. 2002, 14, 2224–2231; b) W. Xu, Y. Wang,
X. Bai, B. Dong, Q. Liu, J. Chen, H. Song, J. Phys. Chem. C
2010, 114, 14018–14024.
[1] a) F. C. Lu, X. P. Song, Q. L. Liu, Opt. Mater. 2010, 33, 91–
98; b) W.-T. Chen, H.-S. Sheu, R.-S. Liu, J. P. Attfield, J. Am.
Chem. Soc. 2012, 134, 8022–8025; c) Z. Yang, Z. Zhao, Y. Shi,
Eur. J. Inorg. Chem. 2014, 1955–1964
1963
© 2014 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim