6956
I. Casades et al. / Tetrahedron 56 (2000) 6951±6956
1064 mm line of a Nd:YAG laser for excitation and a liquid
nitrogen-cooled Ge detector. The laser power at the sample
was approximately 100 mW and the spectral resolution
4 cm21. The number of scans varied from 400 to 1000.
The Raman spectra were corrected for instrumental
response using a white light reference spectrum. XPS
measurements were carried out at ambient temperature
with a concentric hemispherical analyser operated in the
constant pass energy mode (50 eV). A Mg Ka X-ray source
(hn1253.6 eV) was used. The analysis chamber was main-
tained at ca. 5£1029 Torr during acquisition of the XPS
spectra. Charging effects were calibrated by the C(1s) line
at 284.6 eV. Sputtering of the samples to obtain the atomic
pro®le of the samples was carried out inside the chamber
using an Ar1 ion gun. The response of each atom was
corrected by the corresponding response factor.
Acknowledgements
Financial support of the European Union (Brite BE97-4455)
and the Spanish DGICYT (grant MAT97-1060-CO2) is
gratefully acknowledged as it is a scholarship for I. C.
Â
from the Universidad Politecnica Valencia.
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 Â
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