Journal of the American Chemical Society
Page 6 of 7
(9) (a) Shibuya, G. M.; Kanady, J. S.; Vanderwal, C. D. J. Am.
Experimental procedure and characterization data for all the
products. This material is available free of charge via the In-
1
2
3
4
5
6
7
8
Chem. Soc. 2008, 130, 12514-12518. (b) Bedke, D. K.; Shibuya, G.
M.; Pereira, A.; Gerwick, W. H.; Haines, T. H.; Vanderwal, C. D. J.
Am. Chem. Soc. 2009, 131, 7570-7572. (c) Bedke, D. K.; Shibuya,
G. M.; Pereira, A. R.; Gerwick, W. H.; Vanderwal, C. D. J. Am.
Chem. Soc. 2010, 132, 2542-2543. (d) Chung, W.-j.; Carlson, J. S.;
Bedke, D. K.; Vanderwal, C. D. Angew. Chem., Int. Ed. 2013, 52,
10052-10055. (e) Vogel, C. V.; Pietraszkiewicz, H.; Sabry, O. M.;
Gerwick, W. H.; Valeriote, F. A.; Vanderwal, C. D. Angew. Chem.,
Int. Ed. 2014, 53, 12205-12209. (f) Chung, W.-j.; Vanderwal, C. D.
Acc. Chem. Res. 2014, 47, 718-728. (g) Chung, W.-j.; Carlson, J. S.;
Vanderwal, C. D. J. Org. Chem. 2014, 79, 2226-2241.
(10) (a) Nilewski, C.; Geisser, R. W.; Carreira, E. M. Nature
2009, 457, 573-576. (b) Nilewski, C.; Geisser, R. W.; Ebert, M.-O.;
Carreira, E. M. J. Am. Chem. Soc. 2009, 131, 15866-15876. (c)
Nilewski, C.; Deprez, N. R.; Fessard, T. C.; Li, D. B.; Geisser, R.
W.; Carreira, E. M. Angew. Chem., Int. Ed. 2011, 50, 7940-7943.
(d) Nilewski, C.; Chapelain, C. L.; Wolfrum, S.; Carreira, E. M.
Org. Lett. 2015, 17, 5602-5605. (e) Fischer, S.; Huwyler, N.;
Wolfrum, S.; Carreira E. M. Angew. Chem., Int. Ed. 2016, 55, 2555-
2558. (f) Bailey, A. M.; Wolfrum, S.; Carreira, E. M. Angew.
Chem., Int. Ed. 2016, 55, 639-643.
(11) (a) Yoshimitsu, T.; Fukumoto, N.; Tanaka, T. J. Org. Chem.
2009, 74, 696-702. (b) Yoshimitsu, T.; Fukumoto, N.; Nakatani,
R.; Kojima, N.; Tanaka, T. J. Org. Chem. 2010, 75, 5425-5437. (c)
Yoshimitsu, T.; Nakatani, R.; Kobayashi, A.; Tanaka, T. Org. Lett.
2011, 13, 908-911.
(12) (a) Yu, T.-Y.; Wang, Y.; Hu, X.-Q.; Xu, P.-F. Chem. Com-
mun. 2014, 50, 7817-7820. (b) Yu, T.-Y.; Wei, H.; Luo, Y.-C.;
Wang, Y.; Wang, Z.-Y.; Xu, P.-F. J. Org. Chem. 2016, 81, 2730-
2736.
(13) (a) Keith, J. M.; Larrow, J. F.; Jacobsen, E. N. Adv. Synth.
Catal. 2001, 343, 5-26. (b) Vedejs, E.; Jure, M. Angew. Chem., Int.
Ed. 2005, 44, 3974-4001.
(14) Li, L.; Liu, Y.; Peng, Y.; Yu, L.; Wu, X.; Yan, H. Angew.
Chem., Int. Ed. 2016, 55, 331-335.
(15) (a) Yan, H.; Jang, H. B.; Lee, J.-W.; Kim, H. K.; Lee, S. W.;
Yang, J. W.; Song, C. E. Angew. Chem., Int. Ed. 2010, 49, 8915-
8917. (b) Yan, H.; Oh, J. S.; Lee, J.-W.; Song, C. E. Nat. Commun.
2012, 3, 1212. (c) Park, S. Y.; Lee, J.-W.; Song, C. E. Nat. Commun.
2015, 6, 7512. (d) Liu, Y.; Ao, J.; Paladhi, S.; Song, C. E.; Yan, H. J.
Am. Chem. Soc. 2016, 138, 16486-16492. (e) Oliveira, M. T.; Lee, J.-
W. ChemCatChem 2017, 9, 377-384. (f) Vaithiyanathan, V.; Kim,
M. J.; Liu, Y.; Yan, H.; Song, C. E. Chem. - Eur. J. 2017, 23, 1268-
1272.
AUTHOR INFORMATION
Corresponding Author
*yhl198151@cqu.edu.cn
Funding Sources
9
This study was supported by the Fundamental Research
Funds for the Central Universities in China (Grant No:
CQDXWL-2014-Z003), the Scientific Research Foundation of
China (Grant No: 21402016), Graduate Scientific Research
and Innovation Foundation of Chongqing, China (CYB16032)
Notes
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
The authors declare no competing financial interest.
ACKNOWLEDGMENT
We are grateful to Mr. Xiangnan Gong (Analytical and Test-
ing Center of Chongqing University) for X-ray crystallo-
graphic analysis.
REFERENCES
(1) (a) Butler, A.; Walker, J. V. Chem. Rev. 1993, 93, 1937-1944.
(b) Gribble, G. W. Acc. Chem. Res. 1998, 31, 141-152. (c) Pereira, A.
R.; Byrum, T.; Shibuya, G. M.; Vanderwal, C. D.; Gerwick, W. H.
J. Nat. Prod. 2010, 73, 279-283. (d) Wang, B. G.; Gloer, J. B.; Ji, N.
Y.; Zhao, J. C. Chem. Rev. 2013, 113, 3632-3685.
(2) (a) Halland, N.; Braunton, A.; Bachmann, S.; Marigo, M.;
Jørgensen, K. A. J. Am. Chem. Soc. 2004, 126, 4790-4791. (b) Shi-
batomi, K.; Yamamoto, H. Angew. Chem., Int. Ed. 2008, 47, 5796-
5798. (c) Lundin, P. M.; Esquivias, J.; Fu, G. C. Angew. Chem., Int.
Ed. 2009, 48, 154-156. (d) Liang, Y.; Fu, G. C. J. Am. Chem. Soc.
2015, 137, 9523-9526. (e) Kainz, Q. M.; Matier, C. D.; Bartosze-
wicz, A.; Zultanski, S. L.; Peters, J. C.; Fu, G. C. Science 2016, 351,
681-684.
(3) (a) Denmark, S. E.; Kuester, W. E.; Burk, M. T. Angew.
Chem., Int. Ed. 2012, 51, 10938-10953. (b) Cresswell, A. J.; Eey, S.
T.-C.; Denmark, S. E. Angew. Chem., Int. Ed. 2015, 54, 15642-
15682. (c) Chung, W.-j.; Vanderwal, C. D. Angew. Chem., Int. Ed.
2016, 55, 4396-4434.
(4) Snyder, S. A.; Tang, Z. Y.; Gupta, R. J. Am. Chem. Soc.
2009, 131, 5744-5745.
(16) CCDC 1527201 (2a), 1527202 (4a), 1533845 (7), and 1527200
(11a) contain the supplementary crystallographic data for this
paper. These data can be obtained free of charge from The Cam-
bridge Crystallographic Data Centre.
(17) (a) Nilewski, C.; Carreira, E. M. Eur. J. Org. Chem. 2012,
2012, 1685-1698. (b) Umezawa, T.; Matsuda, F. Tetrahedron Lett.
2014, 55, 3003-3012.
(18) (a) Saunders, W. H., Jr.; Ashe, T. A. J. Am. Chem. Soc.
1969, 91, 4473-4478. (b) Mayer, B. J.; Spencer, T. A.; Onan, K. D.
J. Am. Chem. Soc. 1984, 106, 6343-6348. (c) Villano, S. M.; Kato,
S.; Bierbaum, V. M. J. Am. Chem. Soc. 2006, 128, 736-737.
(5) Nicolaou, K. C.; Simmons, N. L.; Ying, Y.; Heretsch, P. M.;
Chen, J. S. J. Am. Chem. Soc. 2011, 133, 8134-8137.
(6) (a) Hu, D. X.; Shibuya, G. M.; Burns, N. Z. J. Am. Chem.
Soc. 2013, 135, 12960-12963. (b) Hu, D. X.; Seidl, F. J.; Bucher, C.;
Burns, N. Z. J. Am. Chem. Soc. 2015, 137, 3795-3798. (c) Bucher,
C.; Deans, R. M.; Burns, N. Z. J. Am. Chem. Soc. 2015, 137, 12784-
12787. (d) Landry, M. L.; Hu, D. X.; McKenna, G. M.; Burns, N. Z.
J. Am. Chem. Soc. 2016, 138, 5150-5158. (e) Burckle, A. J.; Vasilev,
V. H.; Burns, N. Z. Angew. Chem., Int. Ed. 2016, 55, 11476-11479.
(7) Soltanzadeh, B.; Jaganathan, A.; Yi, Y.; Yi, H.; Staples, R. J.;
Borhan, B. J. Am. Chem. Soc. 2017, 139, 2132-2135.
(8) Cresswell, A. J.; Eey, S. T.-C.; Denmark, S. E. Nat. Chem.
2015, 7, 146-152.
ACS Paragon Plus Environment