091103-3
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Appl. Phys. Lett. 91, 091103 ͑2007͒
of the fast decay component at higher temperatures is asso-
ciated with a strong decrease of PL intensity which is shown
in the Arrhenius plot in Fig. 3͑c͒. The temperature depen-
dence of the emission intensity allows us to estimate the
characteristic activation energy and yields a band bending of
=2.8 meV.
In summary, spatially and temporally resolved PL
spectroscopies have been used to address physical properties
of single InP nanowires. We observed a size dependent blue-
shift of up to 56 meV for the nanowire emission energy with
respect to InP bulk band gap emission and narrow linewidths
as low as 2.3 meV which indicates a nonradiative surface
recombination in the as-grown nanowires. This interpretation
is confirmed by temperature and time resolved investigations
which reveal a low surface recombination velocity of about
6ϫ102 cm/s and point to thermally activated nonradiative
surface recombination above approximately 20 K.
FIG. 3. ͑Color online͒ Photoluminescence decay of NW4 emission taken
after spectral filtering ͑1.461–1.465 eV͒ at ͑a͒ 4 K and ͑b͒ 27 K, respec-
tively. ͑c͒ Arrhenius plot showing the PL intensity of NW4 emission vs
reciprocal temperature.
This work was partly supported by the European Com-
mission through the IST Project Node and the State of Ba-
varia. Support is also acknowledged from DARPA HR0011-
04-1-0040 ͑CONSRT͒ and HP-CITRIS grants, with author
fellowship support from the NSF Graduate Research Fellow-
ship Program to one of the authors ͑S.C.͒, and NSF-IGERT
Program to two of the authors ͑L.C.C. and M.M.͒.
shown in Fig. 3͑b͒ for T=27 K the biexponential is associ-
ated with a fast decay shortly after the laser pulse and a
slower decay at longer delay times. We relate the fast decay
with a time constant of 1=1.1 ns to nonradiative surface
recombination while the longer component with 2=2.6 ns
observed also for T=4 K ͓c.f. Fig. 3͑a͔͒ is attributed to ra-
diative recombination in the NWs.12
In order to describe the time resolved data more quanti-
tatively, we take into account a model introduced to describe
carrier decay in GaAs NWs.16 In this model, the carrier de-
cay rate depends via
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dn
dt
1
2S
= −
+
n
͑1͒
ͩ ͪ
dNW
rad
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S = S0e−͉͉/k T
.
͑2͒
B
In relation to this model, we associate the fast decay ob-
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which is most prominent at short delays after photon excita-
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dI
dt
logarithmic derivation /I of the decay curve at short de-
lays, we estimate
a surface recombination velocity
dI
SϷ− /I dNW/2 of about 6ϫ102 cm/s ͑dNW=20 nm͒. This
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͑
͒
dt
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