www.chemasianj.org
Wen-Chang Chen, Zhishan Bo et al.
and NI groups. Therefore, the switching mechanism of TPA-
NI-DCN can be explained by the electric field-induced CT
effect between the donors and acceptors. Under excitations
with sufficient energy, electrons are possibly transferred
from the electron-donating TPA to the electron-accepting
DCN/NI moieties. Therefore, the CT interaction gives rise
to the charge separation state that creates the effective
charge transport channel and reduces the resistance
throughout the TPA-NI-DCN layer. Charge hopping over
the thermal barrier between the neighboring local sites is
a principal charge conduction mechanism in thin films of or-
ganic conjugated materials employed in devices. Color-
coded computer graphics stimulation shows a representation
of the ESP surface of TPA-NI-DCN. Note that ESP illus-
trates the charge distribution of molecules three dimension-
ally and enables to visualize variably negatively and posi-
tively charged regions. Accordingly, a channel flow inside
the film for migration of charge carriers between the bottom
and top electrodes is formed in the continuous positive ESP
through the conjugated backbone, leading to a resistance
switching from HRS to LRS. The negative ESP suggests
that this electrophilic region acts as a trap site to localize
the charge carrier that possibly induces the related memory
[5]
effects and charge retention.
However, the WORM
Figure 3. (a) I–V characteristics and (b) retention time test of the TPA-
NI-DCN memory device.
memory behavior of TPA-NI-DCN is supported by the fol-
lowing factors. First, the large calculated dipole moment
(
4.48 Debye) of the molecule, contributed by the strong
with the applied voltage. However, the current jumps
electron-withdrawing DCN groups, suggests a high polarity
that implies a strong intermolecular interaction in the D-A-
A architecture. Second, the transferred electrons can be
more significantly delocalized in the DCN moiety with
a strong electron affinity that provides a deep trapping bar-
rier and stable CT state. Third, the introduction of aromatic
TPA donors linked with acceptors suppresses strongly the
intramolecular coupling induced by the twisted conforma-
tion after turning off the power. Consequently, all these fea-
tures lead to a more stable/promoted CT state, and an ap-
propriate charge delocalization in the separated moieties
leads to the storage of the former transferred charge. It also
prevents the segregated cationic and anionic charges from
recombination even after power-off or the application of
a reverse polarity bias. As a result, the quasi-permanent
conductance is observed in the LRS of the fabricated non-
volatile device.
À8
À5
abruptly from 5ꢁ10 A to 1ꢁ10 A at a threshold voltage
of about À3.5 V, indicating that the device is switched from
the HRS to the low-resistance state (LRS; ON state). The
operation for the electrical transition is defined as the “writ-
3
ing” process, with an ON/OFF (HRS to LRS) ratio of ~10 .
The switching voltage of the TPA-NI-DCN device can be
reduced if the work function of the deposited electrode is
close to the HOMO level of the TPA-NI-DCN. In the LRS,
the current then increases smoothly with the applied volt-
age. The device remains in its LRS once the applied voltage
is turned off and then subsequently reapplied to the device
nd
rd
either at negative (2 sweep) or positive voltage (3 sweep).
This device cannot return to the HRS even after switching
th
th
off the power for 1 day in both polarities (4 or 5 sweep).
This indicates that the TPA-NI-DCN device belongs to the
nonvolatile WORM memory. To investigate the stability of
the small molecule-based device, the retention test was con-
ducted with a reading bias of À1 V, as shown in Figure 3(b).
It is seen that the device exhibits good retention abilities:
both the ON and OFF currents do not degrade and thus the
ON/OFF ratio does not show any serious deterioration. The
Moreover, the current at the LRS increases as the elec-
trode size increases in a nearly linear dependence, which
can exclude the switching phenomena from random forma-
[
2b]
tion and rupture of conducting metal filaments.
Besides,
the obtained vapor phase-deposited TPA-NI-DCN thin film
exhibits an extremely smooth surface, with a root-mean-
square (RMS) roughness of about 0.38 nm as obtained from
the AFM image (Figure S4 in the Supporting Information).
This also suggests that the uniform and crack-free surface
minimizes the possibility of filamentary resistive switching
since no effective pathway can be situated for filaments em-
4
test can last for a period of over 10 s and it also proves the
nonvolatile nature and non-destructive reading.
The optimized molecular geometries and electronic prop-
erties such as HOMO and LUMO energy levels and electro-
static potentials (ESP), calculated by density functional
theory, are shown in Figure 1. It is seen that HOMO orbitals
are localized at the TPA electron donors while LUMO orbi-
tals are mainly localized at the electron acceptors, the DCN
[
3]
bedded in the TPA-NI-DCN film. To elucidate the con-
duction mechanism of resistive switching, the plots of the I-
Chem. Asian J. 2014, 00, 0 – 0
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