Pyrolysis of Methyltrichlorosilane
J. Phys. Chem. A, Vol. 108, No. 11, 2004 1951
geometric mean rule, eq 6. We assumed the contribution of
termination reactions R8 and R9 should be small enough to
ignore their effect in calculating k1, especially at higher
temperatures, when reaction R5 becomes more important. At
the B3LYP/6-311++G(d,p) level of theory, we found a barrier
height equal to 295 kJ mol-1 for the decomposition of CH2-
SiCl3 to CH2SiCl2 and Cl, R5.
As shown in Figure 6, at 825 K the value of k1 reached its
high-pressure limit when the pressure was about 100 Torr, while
at higher temperatures the dependency of k1 to the pressure was
stronger.
According to our suggested mechanism, the concentration of
SiCl2 should be almost equal to the sum of the concentrations
of methane and chloromethane. The effect of presence of SiCl2
on the rate of deposition of SiC is considered by different
researchers. Sachdev and Scheid19 have studied the formation
of SiC by rf-plasma CVD. They suggested the formation of
silicon halides results in a loss of silicon needed for the correct
stoichiometry of the SiC deposits. Thus, the deposits become
carbon-rich because of different reaction kinetics of the silicon-
and carbon-containing species. Kaneko and co-workers20 have
studied the growth process of SiC from MTS by rf-plasma. From
the compositional analysis of the film, they suggested that the
competitive decomposition of SiCl3 and CH3 fragments is rate-
determining in an electron collision process. They believe the
existence of SiCl2 instead of SiCl3 supports their conclusion.
They detected SiCl2 by IR adsorption. They suggested that the
precursor of SiC is SiCl2. Josiek and Langlais21 have studied
the residence-time-dependent kinetics of CVD growth of SiC
in the MTS/H2 system. They suggested the simplest precursors
SiCl3 and CH3 which are directly formed by MTS decomposition
and adsorb on surfaces site cannot fulfill their experimental
results. They suggested SiCl2, C2H2, or C2H4 are the dominant
reactive intermediate source species in the intermediate. SiCl3
adsorbed more strongly on surface site than SiCl2. They
concluded, at low residence time and temperature, the gas-phase
concentration of SiCl2 should be lower than that of SiCl3. SiCl2
must adsorb on two surface sites to play a more important role
for the growth kinetics than SiCl3. At higher residence times, it
In the present work, we were able to calculate the ratios of
rate constants (k2)2/k10 and (k3)2/k10. As shown in Table 1, these
ratios are independent to the pressure at higher pressures at
different temperatures. We were not able to calculate the value
of k10 from our experimental results. We used the expression
given by Wagner and Wardlaw17 for the recombination of
methyl radical to calculate the values of k2 and k3 from our
results. As one expected, rate of hydrogen abstraction is higher
than the rate of chlorine abstraction from MTS by methyl
radicals. As shown in Table 1, the ratio of k2/k3 is close to 1.1
at higher temperatures and decreases to a value about 1.6 at
lower temperatures. This should be due to the stronger Si---Cl
bond relative to C---H bond. We found a value of 61 ( 3 kJ
mol-1 for the activation energy of reaction R2. Niiranen and
Gutman16 reported a value of 48.1 kJ mol-1 for the activation
energy of reaction R2 in the temperature range of 378-478 K.
As one expected, hydrogen abstraction reaction R2 should have
a curved Arrhenius plot because of tunneling effect. Therefore,
it is reasonable that this reaction has higher activation energy
at higher temperatures.
22
23
is possible for SiCl2 to react with H2 or CH4 in gas phase
to produce SiH2Cl2 or CH3SiHCl2, respectively.
From the previous paragraph, it is difficult to suggest a
reliable mechanism for the formation of SiC film on the surfaces.
According to the suggested mechanism in the present study, it
is expected that a large amount of SiCl2 produces during the
initial steps of the thermal decomposition of MTS. SiCl2
produces in a loop that consists of reactions R2, R3, R4, R7,
and R15. If we accept a key role for SiCl2 in the formation of
SiC film, therefore, further studies are necessary to investigate
this role of SiCl2. According to our suggested mechanism, we
do not expect SiCl3 produces in a large amount during the initial
steps in the pyrolysis of MTS.
Osterheld and co-workers12 have suggested three different
unimolecular decomposition paths for MTS as R1, R13, and
C-H bond cleavage R16.
CH3SiCl3 f CH2SiCl3 + H
(R16)
In their study, they reported the rate of reaction R16 is almost
100 times lower than the rate of reaction R1 and activation
energy for R16 is higher than that for reaction R1 by 26 kJ
mol-1 and has a lower preexponential factor. They reported their
results as the following Arrhenius expressions in the temperature
range of 800-1000 K.
Acknowledgment. The authors are pleased to acknowledge
financial support from the Research Council of Shiraz Univer-
sity. S.H.M. wishes to thank Professor M. Rashidi for valuable
discussion.
k1 ) 2.0 × 1018 exp(-407.1 kJ mol-1/RT) s-1
k13 ) 1.3 × 1015 exp(-399.2 kJ mol-1/RT) s-1
k16 ) 5.0 × 1017 exp(-433.0 kJ mol-1/RT) s-1
References and Notes
(1) De Jong, F.; Meyyappan, M. Diamond Relat. Mater. 1996, 5, 141.
It was difficult to verify the role of reactions R13 and R16
in production of CH2SiCl2 or CH2SiCl3 because we expected
other reactions such as reactions R5 (directly) and R6 (indirectly)
to produce the same products. As listed in Table 1, the average
rate of formation of CH2SiCl2 is smaller than the rate of
formation of methane. Therefore, we can conclude from these
results that the role of reactions R13 and R16 could not be very
important in the pyrolysis of MTS.
(2) Davidson, I. M. T.; Ring, M. A. J. Chem. Soc., Faraday Trans. 1
1980, 76, 1520. Neudorfl, P. S.; Lown, E. M.; Sararik, I.; Jodhan, A.;
Strausz, O. P. J. Am. Chem. Soc. 1987, 109, 5780. Lee, M.-S.; Bent, S. F.
J. Phys. Chem. B 1997, 101, 9195.
(3) Burgess, J. N.; Lewis, T. J. Chem. Ind. 1974, 76.
(4) Kobayashi, F.; Ikawa, K; Iwamoto, K. J. Cryst. Growth 1975, 28,
395.
(5) Davidson, I. M.; Dean, C. E. Organometallics 1987, 6, 966.
(6) Gordon, M. S.; Truong, T. N. Chem. Phys. Lett. 1987, 142, 110.
(7) Besmann T. M.; Sheldon B. W. J. Am. Ceram. Soc. 1991, 74, 3046.
According to ref 10, ∆fH° for MTS, CH3, SiCl3, CH2SiCl3,
H, and CH2SiCl2 are reported as -576 ( 4, 146 ( 5, -318 (
7, -367 ( 6, 217 ( 0.0, -143 ( 5 kJ mol-1 at 298 K,
respectively, and for HCl -92.31 ( 0.10 kJ at 298 K from ref
18. According to these data, ∆H0298 for reactions R1, R13, and
(8) Besmann, T. M.; Sheldon, B. W; Lowden, R. A.; Stinton, D. P.
Science 1991, 253, 1104.
(9) Besmann, T. M.; Sheldon, B. W.; Moss, T. S., III; Kaster, M. D.
J. Am. Ceram. Soc. 1992, 75, 2899.
(10) Allendorf, M. D.; Melius, C. F. J. Phys. Chem. 1993, 97, 720.
(11) Cagliostro, D. E.; Riccitiello, S. R.; Ren, J.; Zaghi, F. J. Am. Ceram.
Soc. 1994, 77, 2721.
R16 equaled 404 ( 16, 341 ( 9, and 426 ( 10 kJ mol-1
respectively.
,