FULL PAPER
sample was sandwiched between a pair of quartz glass plates, and
its reflectance spectrum was acquired over the range 220–2500 nm
at room temp. under an ambient atmosphere. No noise peaks or
dispersion was observed in the baseline spectrum obtained by scan-
ning quartz glass plates in air over 220–2500 nm. As it was difficult
to distinguish small peaks from noise and artifacts, each spectrum
was acquired five times by using independently prepared samples,
and the results were averaged. To identify the intramolecular transi-
tions in NMQ and Ni(dmit)2, the solution spectra of (TBA)n[Ni-
(dmit)2] (n = 1,2) and NMQ·I (190–1100 nm) in acetonitrile were
also acquired by using a JASCO V-630 spectrophotometer at 20 °C
at a resolution of 2 nm. A trace amount of triethylamine was added
to the Ni(dmit)2 solution to prevent air oxidation of the [Ni-
(dmit)2]n– (n = 1,2), except for spectral measurements between 200
and 250 nm, in which region triethylamine has an intense absorp-
tion.
ure S1), calculated band structures over a wider energy range (Fig-
ure S2), photoresponses to light of various wavelengths (Figure S3),
crystal structure at 93 K (Figure S4), XPS data (Figure S5).
Acknowledgments
The elemental analysis and some of the spectroscopic measure-
ments were carried out at the Integrated Center for Sciences, Ehime
University.
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X-ray Photoelectron Spectroscopy: X-ray photoelectron spec-
troscopy (XPS) patterns were obtained by using Mg-Kα radiation
(1253.6 eV, 10 kV, 10 mA) with a JPS-9200 (JEOL) spectrometer at
room temp. The single crystals were placed on a small piece (ca.
5ϫ5 mm2) of conductive carbon tape (Nisshin EM) on a titanium
sample stage, and the glancing angle of the X-ray beam to the sam-
ple surface was ca. 35°. This setup enabled us to analyze the elec-
tronic states at a depth of a few nanometers (ca. a few unit cells)
from the surface, which is much shallower than the penetration
depth of the UV/Vis/NIR light (in the order of 1 μm) in this mate-
rial, yet sufficiently deep to allow observations of the bulk elec-
tronic state, as shown in the Supporting Information. The X-ray
beam had a square section of ca. 5ϫ5 mm2 at the sample surface,
and the area from which photoelectrons were collected (the field of
view) was ca. 3 mm in diameter. The pass energy and dwell time
were 10 eV and 100 ms, respectively. Including these parameters,
the measurement conditions (diffraction angle and selected area in
the electron lens system, sample position relative to X-ray and UV
laser incident beams, and laser focus) were optimized to provide
the best possible signal/background (S/B) ratio and signal/noise
(S/N) ratio. To maintain the intensity of the incident X-ray beam,
a monochromator was not used, and the energy resolution was ca.
0.75 eV as judged from the Ag 3d5/2 spectra measured under iden-
tical conditions. As sulfur-containing compounds can be unstable
under exposure to soft X-rays, the reliabilities of the spectra were
confirmed by a series of XPS measurements, in which spectral
changes were followed on progressively prolonged exposure of the
samples to the X-ray beam. Similarly, the effects of Ar+-etching
before XPS measurements was carefully examined, as the [Ni-
(dmit)2]n– (0 Ͻ n Յ 2) compounds are generally sensitive to oxi-
dants such as Ar+. Details of the means by which we determined
the best measurement conditions are described in the Supporting
Information (Figure S5). The XPS spectra of samples under UV
irradiation were measured by using the same laser setup as that
applied in other experiments in this work, and the sample was irra-
diated through a quartz window attached to the XPS chamber.
Spectral measurements under dark and irradiated conditions were
performed in series, and the order in which the measurement condi-
tions (irradiated or dark) were applied was not found to affect the
results. In addition to assessing the reproducibility of measure-
ments, the O 1s peaks were used to judge whether there was a
charge-up effect. All of the spectra shown in Figure 6 were con-
firmed to have good reproducibility and to be free of artifacts due
to decomposition/degradation of the samples.
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[5] In this paper, the HOMOs and LUMOs are always based on
the neutral-molecule states.
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R. Kato, H. Kobayashi, R. A. Clark, A. E. Underhill, Solid
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1251–1260.
[10] For recent progress in high-TC cuprates, see: “SPECIAL TOP-
ICS: Recent Development in Superconductivity”, J. Phys. Soc.
Jpn. 2012, 81, 011001–015002.
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[15] Owing to the heavy disorder of the quinoline ring atoms at
296 K, the single-crystal X-ray structural analysis was also per-
formed at 93 K. Although the thermal factors of the quinoline
ring atoms become much smaller, the crystal retains its essen-
tial features such as the overall molecular arrangement, the
space group (P21/n), and the lattice parameters (for details, see
Supporting Information).
[16] Note that difference in the absolute values of χ and its tempera-
ture dependence at the lowest temperatures should originate
from the difference in contamination of each sample.
[17] For recent reviews, see: T. Naito (Ed.), Molecular Electronic
and Related Materials
– Control and Probe with Light,
Transworld Research Network, Kerala, 2010.
[18] This method would transform the crystals into semiconducting
devices only during the irradiation, and the crystal would re-
turn to the initial diamagnetic insulators (“initialized”) on
ceasing the irradiation.
[19] a) Ortep 3 for Windows: L. J. Farrugia, J. Appl. Crystallogr.
1997, 30, 565; the program is available from http://
www.chem.gla.ac.uk/_louis/software/ortep3/; b) Visualization
vesta/jp/.
Supporting Information (see footnote on the first page of this arti-
Received: February 10, 2014
cle): Parameters of atomic orbitals (Table S1), IR spectra (Fig-
Published Online: May 27, 2014
Eur. J. Inorg. Chem. 2014, 4000–4009
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