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2. Experimental methods and materials
during the cooling run using a Keithley 610C electrometer with
the application of a constant field of 0.12 kV/cm. The samples
prepared for the capacitance measurement were also used for the
DC conductivity studies.
2.1. Crystal growth
Triglycine sulphate was synthesized at pH 2.5 using Analar
grade glycine (Merck India) and sulphuric acid taken in the molar
ratio 3:1. The purity of the TGS salt was enhanced by re-crystal-
lizing the salt three times. The purified salt was used as a basic
material for growing n-bromo succinimide doped TGS (NBSTGS)
crystals. Now onwards the new doped crystal is referred to as
NBSTGS. The TGS solution was prepared by dissolving TGS in
double distilled water. Saturated solution of TGS doped with four
different concentrations of (in the range of 1–20 mol%) n-bromo
succinimide (Merck India) was prepared at 45 1C and filtered
using sintered glass micro-fiber filter paper with porosity less
2.5. P–E hysteresis measurements
The crystal surfaces cleaved perpendicular to the ferroelectric
b-axis was used to examine the P–E hysteresis loops. The cleaved
plates (0 1 0) were polished to get a smooth and parallel surface.
The prepared sample for the study is now in the form of thin plate
of surface area about 25 mm2 and thickness 1.5 mm. The parallel
(0 1 0) faces were electroded with conducting silver paste. The
hysteresis measurements of the samples were carried out at room
temperature using a computer controlled automatic P–E loop
tester. While doing measurements the crystal sample is placed
inside a silicone oil bath.
than 2 mm. The filtered solution was poured into experimental
vessels and was kept in a dust free chamber for slow evaporation
at ambient temperature. After definite period of evaporation the
solution became supersaturated and tiny crystals were nucleated.
Defect-free seed crystals were taken out from the experimental
vessels and tied with the help of fine human hair from the scalp.
These seed crystals were slowly lowered in the saturated mother
solution and allowed to grow in these experimental vessels to get
the bulk crystals. Large numbers of crystals of various sizes were
grown in a time period of 20–45 days.
2.6. Piezoelectric and hardness measurements
The piezoelectric measurements for pure TGS and NBSTGS
were carried out on 010 plates at room temperature using PM300
Piezotest, UK, at 100 Hz with the application of 0.5 N dynamic
force. The samples were cleaved perpendicular to the b-axis and
polished till the thickness was reduced to 1.5 mm. The surface
area of the samples used in this study was approximately
25 mm2. The opposite faces were electroded with conducting
silver paste.
2.2. Powder X-ray diffraction and FTIR measurements
Powder X-ray diffraction data of pure TGS and NBSTGS crystals
The micro hardness of the crystals of pure TGS and NBSTGS
was measured at room temperature on the 010 plates with
Clemax fully automatic digital micro-hardness tester fitted with
a Vickers diamond pyramid indenter. Flat, parallel and polished
surfaces cut perpendicular to ferroelectric b-axis (0 1 0) are used
in the measurement.
were collected at room temperature using a BRUKER AXS D8
˚
Advanced X-ray Diffractometer with Cu K
(l¼1.5418 A) radia-
a
tion in the 2y
range from 201 to 701 at a scanning rate of 21 minꢀ1
for the finely crushed powder. To confirm the presence of various
functional groups in TGS and NBSTGS, Fourier transform infrared
(FTIR) spectrum was recorded in the range 400–4000 cmꢀ1 using
a Shimadzu-8700 FTIR Spectrometer for the powder sample by
the KBr pellet technique.
3. Results and discussion
3.1. Crystal growth and morphology
2.3. Dielectric measurements
Fig. 1 depicts the photograph of pure TGS and NBSTGS crystals.
We have grown large numbers of crystal by suspending the seed
crystals in doped TGS solution. Less than 20 mol% of dopant
concentration is suitable for growing optical quality bulk crystals
by suspending the seed crystals in the growth solution. The
quality of the crystals was found to be poor at higher concentra-
tions. Visible defects were observed around the seed crystal, as
the crystal grew bigger. The concentration of the dopant in the
growth solution has larger impact on the shape, size and quality
of the crystals harvested. It is found that the ac-plane area is
sensitive to the dopant concentration. This yields larger, 010
faces, which makes the crystal very suitable for IR applications.
The crystals are transparent, colorless, non-hygroscopic and
stable under ambient conditions.
The capacitance of the crystal sample was measured using a
HP4194A impedance/gain phase analyzer by heating the sample
at a rate of 1 1C/min using Metler hot stage FP90 over the
temperature range 30–60 1C. The data collected was used to
calculate the dielectric constant and transition temperature.
Samples for capacitance measurements were prepared in the
form of thin plate cleaved perpendicular to ferroelectric b-axis
from the regions of the crystals away from the seed so that they
contain no flaws. The cleaved samples were polished to get flat
and smooth surface of thickness approximately 1.5 mm. The
opposite faces were electroded with conducting silver paste. The
sample preparation technique is discussed in detail [16]. Before
conducting the electrical measurements the samples were kept at
60 1C for 24 h to remove any moisture present.
2.4. Pyroelectric current and DC conductivity measurements
3.2. Powder X-ray diffraction studies
Pyroelectric current and DC conductivity measurements were
carried out in a two-terminal cell by mounting the samples in an
unclamped condition. Pyroelectric current was measured over the
temperature range of 30–60 1C using a Keithley 610C electro-
meter. The sample preparation and current measurement techni-
que are discussed in detail [17].
Before conducting the DC conductivity measurements, the
crystal samples were heated to 65 1C and maintained there for
about an hour. Thereafter the leakage current was measured
Powder X-ray diffraction pattern of pure TGS and 20 mol%
NBSTGS crystals are shown in Fig. 2. The peaks observed in the
X-ray diffraction profiles for the pure TGS crystal matched well
with the reported ASTM data (organic index to the powder
diffraction file, Joint Committee of Powder Diffraction Standards
(1967)). The unit cell parameters of the grown crystals of TGS and
the literature values are compared [17]. The X-ray diffraction
analysis shows that the monoclinic structure of the TGS crystal
doped with different amounts of doping entities undergoes no