Y.G. Gogotsi et al.: Cyclic nanoindentation and Raman microspectroscopy study of phase transformations in semiconductors
5. G.M. Pharr, W.C. Oliver, R.F. Cook, P.D. Kirchner, M.C. Kroll,
T.R. Dinger, and D.R. Clarke, J. Mater. Res. 7, 961 (1992).
6. G.M. Pharr, W.C. Oliver, and D.R. Clarke, J. Electron. Mater. 19,
881 (1990).
19. I.V. Gridneva, Y.V. Milman, and V.I. Trefilov, Phys. Status
Solidi A 9, 177 (1972).
20. E.R. Weppelmann, J.S. Field, and M.V. Swain, J. Mater. Res. 8,
830 (1993).
7. J.J. Gilman, J. Mater. Res. 7, 535 (1992).
21. E.R. Weppelmann, J.S. Field, and M.V. Swain, J. Mater. Sci. 30,
2455 (1995).
22. M.C. Gupta and A.L. Ruoff, J. Appl. Phys. 51, 1072 (1980).
23. J. Crain, G.J. Ackland, J.R. Maclean, R.O. Piltz, P.D. Hatton, and
G.S. Pawley, Phys. Rev. B 50, 13043 (1994).
24. P. Haasen and A. Kelly, Acta Metall. Mater. 5, 192 (1957).
25. V.P. Alekhin, Physica Prochnosti i Plastichnosti Poverkhnost-
nykh Sloev Materialov (Nauka, Moscow, 1983).
26. B. Bhushan, A.V. Kulkarni, W. Bonin, and J.T. Wyrobek, Philos.
Mag. A 74, 1117 (1996).
27. T.F. Page, W.C. Oliver, and C.J. McHargue, J. Mater. Res. 7, 450
(1992).
28. R.J. Nelmes, M.I. McMahon, N.G. Wright, D.R. Allan, and J.S.
Loveday, Phys. Rev. B 48, 9883 (1993).
29. C.S. Menoni, J.Z. Hu, and I.L. Spain, Phys. Rev. B 34, 362
(1986).
30. C.H. Bates, F. Dachille, and R. Roy, Science 147, 860 (1965).
31. A. Kailer, Y.G. Gogotsi, and K.G. Nickel, in High Pressure Ma-
terials Research, edited by R.M. Wentzcovitch, R.J. Hemley,
W.J. Nellis, and P.Y. Yu (Mater. Res. Soc. Symp. Proc. 499, War-
rendale, PA, 1998), pp. 225–230.
32. N.W. Ashcroft and N.D. Mermin, Solid State Physics (Saunders
College Publishing, Philadelphia, PA, 1976).
33. A.B. Chen, A. Sher, and W.T. Yost, in The Mechanical Properties
of Semiconductors, edited by K.T. Faber and K. Malloy (Aca-
demic Press, London, 1992), Vol. 37, p. 68.
8. S.V. Hainsworth, A.J. Whitehead, and T.F. Page, in Plastic De-
formation of Ceramics, edited by R.C. Bradt, C.A. Brookes, and
J.L. Routbort (Plenum Press, New York, 1995), p. 173.
9. J.C. Morris and D.L. Callahan, in Microstructure of Materials,
edited by K.M. Krishnan (San Francisco Press, San Francisco,
1992), p. 104.
10. D.L. Callahan and J.C. Morris, J. Mater. Res. 7, 1614 (1992).
11. N.V. Novikov, S.N. Dub, Y.V. Milman, I.V. Gridneva, and S.I.
Chugunova, Sverkhtverdye Materialy (Superhard Materials) 18,
37 (1996).
12. S.N. Dub, in Thin Films: Stresses and Mechanical Properties VII,
edited by R.C. Cammarata, M. Nastasi, E.P. Busso, and W.C.
Oliwer (Mater. Res. Soc. Symp. Proc. 505, Warrendale, PA,
1998), pp. 223–228.
13. M.I. McMahon and R.J. Nelmes, Phys. Status Solidi B 198, 389
(1996).
14. J.M. Besson, J.P. Itie, A. Polian, G. Weill, J.L. Masot, and
J. Gonzalez, Phys. Rev. B 44, 421 (1991).
15. J.J. Gilman, Czech J. Phys. 45, 913 (1995).
16. Y. Gogotsi, M.S. Rosenberg, A. Kailer, and K.G. Nickel, in Pro-
ceedings of the Workshop on Tribology Issues and Opportunities
in MEMS, edited by B. Bhushan (Kluwer, Dordrecht, The Neth-
erlands, 1998), pp. 431–442.
17. R.J. Needs and A. Mujica, Phys. Rev. B 51, 9652 (1995).
18. R.O. Piltz, J.R. Maclean, S.J. Clark, G.J. Ackland, P.D. Hatton,
and J. Crain, Phys. Rev. B 52, 4072 (1995).
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