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T. Arii et al. / Thermochimica Acta 325 (1999) 151±156
study their thermodynamic, structural, and kinetic
properties. Among them, calorimetry and X-ray dif-
fraction have proven to be two of the most useful
techniques.
DSCs provide almost the same information, but their
measuring principles are fundamentally different.
In previous similar studies of XRD-DSC, various
types of hf-DSC have been used. For example, a
commercially available unit developed for optical
microscopy [14,15], and an original cell unit modi®ed
for this purpose [16,17] have been reported. Such a
cell unit has a small aperture through which the X-ray
beam can pass unhindered, and a sample material
mounted in a standard aluminum DSC crucible with
a cover. In this case, the DSC had been modi®ed to
allow transmission of the X-ray beam which passes
through the specimen and, therefore, the scattering
geometry requires mounting the DSC cell vertically.
In addition, modi®cation of the XRD-DSC stage is
necessary in order to minimize beam attenuation. The
sample holder of the DSC cell has apertures of a few-
millimeter diameter for the transmission of an X-ray
beam. The collimated X-ray beam passes through a
smaller aperture in order to eliminate parasitic scatter-
ing. A large irradiated area in the sample cell is
required to get strong X-ray diffraction patterns. How-
ever, this is especially troublesome when using an hf-
DSC. Keeping of an open window for the X-ray beam
makes it dif®cult to assure the small heat exchange
between the sample and surroundings, and to assure
the adequate measuring sensitivity of the DSC.
On the other hand, a pc-DSC has several advantages
over hf-DSC for the simultaneous XRD-DSC mea-
surement. Pc-DSCs may be roughly classi®ed into two
types by the electrical heater arrangement for heating
the sample. In one type, the electrical microheaters
separately heat the sample and the reference holders
and they control the energy required not only to heat
the sample and the reference, but to make the tem-
perature difference zero between the sample and the
reference. In the other type, an additional electrical
heater located around the sample and reference
holders acts as a source of controlled energy to heat
both, the sample and the reference. The former type of
pc-DSC makes it possible to maintain the path of the
X-ray beam, because the additional heater does not
interfere with the X-ray beam.
In this respect, X-ray diffraction (XRD) is probably
the most reliable technique for phase identi®cation
and structure characterization. Both the methods,
namely DSC and XRD, are considered complemen-
tary to each other, and the development of the simul-
taneous measuring instrument of DSC and XRD has
been anticipated. Parallel measurements of different
specimens using DSC and XRD, and a combination of
both data are one of the popular ways of studying
thermal reactions of solids. Problems arise, however,
because many chemical reactions of solids, for
instance the dehydration of hydrates, depend mark-
edly on the sample preparation and on the experi-
mental conditions such as the nature of the
atmosphere, shape of the crucible, the heating rate,
etc. The differences in measuring conditions compli-
cate the combination and comparison of the obtained
data. Such problems can be overcome by simulta-
neously performing DSC and XRD measurements on
the same sample.
Masuda et al. studied crystallinities of dehydrated
product phases and described the effect of water vapor
pressure on the kinetics of the thermal dehydration of
some formate hydrates by means of a combination of
TG-DTA and XRD [12,13]. These results reveal that
more sophisticated simultaneous measuring systems
under identical measuring conditions are preferred for
the determination of reaction mechanisms based on
structural and thermal data.
We have assembled a simultaneous XRD-DSC
measuring apparatus using a power compensation
DSC (pc-DSC) which was specially designed for
the above-mentioned purposes. Then, we have applied
it to the complicated dehydration behavior of zinc
formate dihydrate measured by this XRD-DSC, as an
example. It is the purpose of this paper to report on this
simultaneous apparatus and demonstrate its perfor-
mance.
1.1. Instrumentation of the simultaneous XRD-DSC
measuring apparatus
We tried to combine a pc-DSC of the former type
with an XRD apparatus to realize simultaneous mea-
surements. Fig. 1 shows a close-up of a pc-DSC
whose geometry is designed to perform XRD mea-
surement. The sample was mounted horizontally to the
Generally, a pc-DSC and a heat-¯ux DSC(hf-DSC)
are widely used for DSC measurements. Both these