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Appl. Phys. Lett., Vol. 83, No. 14, 6 October 2003
Ney et al.
¨
present. This finding may turn out to be important for tech-
nical applications because, for room-temperature devices, the
bulk transition temperature is quite low. ͑iv͒ Careful hard-
axis magnetic measurements can serve as a highly sensitive
probe for testing the structural homogeneity of MnAs films.
To unambiguously clarify the structural origin of the out-
of-plane magnetiztion component further, careful investiga-
tions are necessary. From our magnetic measurements, we
can only derive indirect conclusions. The finite crystalline
anisotropy of the observed component requires crystallinity
of these regions. Their easy axis should be close to out of
plane and the rounded shape of the out-of-plane loop sug-
gests that these regions are well separated and weakly
coupled. The out-of-plane magnetization seems to be linked
to the granular magnetic contrast recorded by MFM above
the transition temperature. Recently, Iikawa et al.17 observed
a MnAs component in MnAs/GaAs͑001͒ which is rotated by
30° along the c axis, thus exhibiting an a axis perpendicular
to the substrate plane. It is not clear, however, why this struc-
turally equivalent MnAs fraction should have a higher tran-
sition temperature. We therefore actually favor Mn-rich in-
clusions with differing magnetic properties as a possible
explanation, which were found recently at the MnAs/GaAs
interface.18
The authors thank C. Herrmann and M. Kastner for the
sample preparation, and J. Herfort for technical assistance.
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