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2
H. Qin et al. / Journal of Molecular Catalysis A: Chemical 409 (2015) 79–84
Table 1
Physicochemical properties of Cu/xMgO-SiO2 catalysts.
Cu dispersiona
(%)
SCu
(m
a
dCuOb
(nm)
dMb(nm)
Catalyst
SBET
VP
(cm
dP
(nm)
2
−1
3
−1
2
−1
g cat)
(m
g
)
g
)
Cu/SiO2
356.6
222.9
110.7
64.7
52.7
30.0
0.79
0.53
0.20
0.22
0.21
0.16
20.2
16.1
14.6
13.9
16.1
21.1
18.3
22.8
29.8
32.6
30.4
15.5
30.6
38.2
49.8
54.5
50.9
26.0
20.9
19.0
14.5
–
–
–
20.9
18.8
13.2
–
–
–
Cu/1MgO-SiO2
Cu/3MgO-SiO2
Cu/9MgO-SiO2
Cu/20MgO-SiO2
Cu/MgO
a
Cu dispersion and surface area of Cu determined by N2O titration.
CuO and Cu crystallite sizes calculated using the Scherrer formula.
b
imum copper dispersion and surface, and identified that copper
dispersion and surface may promote its catalytic performance.
of larger CuO clusters. For Cu/SiO2 catalyst, the 576 K reduced
peaks may be ascribed to collective action of the reduction of
above mentioned Cu species. The Cu/MgO sample exhibits a broad
reduction peak at 739 K along with a shoulder peak at 677 K, indi-
3.2.2. Crystalline phase
cating that the sample is reduced in two stages, i.e., CuO → Cu O
The XRD patterns of all the samples after calcination are shown
2
0
and Cu O → Cu . The broad peak may be ascribed to collective
in Fig. 3a. When MgO to SiO mass ratio is lower than 3, the charac-
2
2
+
0
◦
◦
action of reducing Cu and CuO clusters to Cu . A similar behav-
ior was reported by Nagaraja et al. [23] for Cu/MgO catalyst
prepared by co-precipitation method that Cu/MgO sample was
reduced in two steps. For Cu/xMgO-SiO2 samples, the reduction
peak is shifted to higher temperature with increasing magnesium
oxide amount. However, it lies between Cu/SiO2 and Cu/MgO. A
similar result was also reported by Tu and Chen [17] that the
reduction temperature of Cu-MgO/SiO2 was higher than that of
teristic peaks at 2ꢀ of 35.6 and 38.7 (JCPDS 05-0661) are ascribed
to CuO, indicating that some copper species are agglomerated on
the surface of the support. With the continuous increasing of mag-
◦
◦
nesium oxide content, new diffraction peaks at 2ꢀ of 36.9 , 42.9 ,
◦
and 62.2 (JCPDS 43-1022) attributed to magnesium oxide become
apparent, whereas CuO diffraction peaks disappear, indicating the
copper species are highly dispersed in MgO-SiO2 support. The CuO
particle sizes calculated by Scherrer equation are shown in Table 1.
Since the crystalline sizes of copper species are quite small, the
diffraction peak can not be detected. The peak intensity and sharp-
ness increase along with the increasing particle sizes. According to
this situation, the CuO crystallite sizes of the Cu/xMgO-SiO2 cata-
lysts are much smaller than the Cu/SiO2 catalyst, which illustrate
Cu/SiO . This result is possibly due to the addition of MgO into
2
Cu/SiO2 catalyst, which essentially improves the dispersion of
cupreous species during the preparation of catalysts, strengthens
the interaction between active components of copper ions and
catalyst support. The enhanced interaction makes catalysts more
0
difficult to be reduced to Cu , and alters Cu valence states distribu-
that the employ of composite MgO-SiO support can reduce particle
2
tion on catalyst surface.
size to promote copper particles dispersed.
Temperature programmed desorption (TPD) of CO is a common
The XRD patterns of reduced catalysts are presented in Fig. 3b.
2
◦
◦
◦
technique to determine the basicity of solid catalysts. The basicity
Some diffraction peaks at 2ꢀ of 43.3 , 50.4 , and 74.1 attributed to
0
0
of Cu/SiO2 and Cu/xMgO-SiO2 catalysts obtained by CO -TPD and
Cu (JCPDS 04-0836) are observed. The intensities of Cu diffraction
2
the profiles are displayed in Fig. 4b. Cu/SiO2 sample exhibits two
CO2 desorption peaks, a low-temperature peak of 550–700 K and
a high desorption peaks of 750–950 K, which can be identified as
moderate and strong basic sites, respectively. For Cu/xMgO-SiO2
catalysts, added magnesium oxide can lead to the appearance of
weak basic sites with a CO2 desorption peak at 300–500 K and the
disappearance of the moderate basic sites with a CO2 desorption
peak at 550–700 K. Strong basic sites with a CO2 desorption peak
at 950–1050 K gradually disappears when the content of magne-
sium oxide increases. Tu and Chen [17] found that the addition of
magnesium oxide to Cu/SiO2 catalyst could increase the content of
peaks weaken or even disappear with an increasing MgO/SiO mass
2
ratio, but the diffraction peaks are very distinct for Cu/MgO sam-
0
ple. The Cu crystallite size estimated as shown in Table 1 by the
Scherrer equation decreases along with the increased magnesium
oxide when the MgO/SiO2 mass ratio is lower than 20. Obviously,
the results demonstrate that adding moderate magnesium oxide to
catalysts is beneficial for inhibiting growth of metallic copper parti-
◦
cles. Moreover, a weak peak at 2ꢀ of 36.6 attributed to Cu O (JCPDS
2
0
5-0667) is observed when MgO /SiO mass ratio is above 1, and the
2
peak becomes apparent with an increasing MgO/SiO2 mass ratio,
and Cu/MgO catalyst sample exhibits the most obvious Cu O char-
2
weak basic site of catalyst and Cu-MgO/SiO catalyst exhibited bet-
acteristic peak. The results indicate that the metallic Cu and Cu O
2
2
0
+
+
ter catalytic stability than Cu/SiO in the dehydrogenation reaction
coexist in the working catalysts, and the ratio of Cu /(Cu + Cu )
significantly change with increasing magnesium oxide content. It
can be concluded that the catalytic activity may be associated with
the Cu valence states distribution and other chemical properties.
2
process, which was mainly attributed to beneficial effects of weakly
basic sites on Cu species, while the strong basic sites could damage
the stabilities of the catalysts. It can be found that Cu/9MgO-SiO2
catalyst exhibits more weak basic sites, so the excellent catalytic
activity may be associated with it.
3.2.3. Reducibility and surface base properties
To evaluate the reduction behavior of the catalysts, the cal-
cined Cu/SiO , Cu/MgO and Cu/xMgO-SiO samples were examined
2
2
by H -TPR and the result are presented in Fig. 4a. In Cu/SiO2
3.2.4. Surface chemical states
2
catalyst, the reduction peak centered at 576 K can be identified
XPS and XAES were recorded to analyze the chemical state and
surface composition of activated catalysts. The XPS curves of acti-
vated Cu/xMgO-SiO2 are shown in Fig. 5a. Generally, the peak at
binding energy of around 934 eV and the 2p → 3d satellite peak at
942–944 eV are the proofs of existing Cu2+ [24]. However, the above
two peaks can not be found and the peak at 932 eV is observed,
which may be due to the reduction of Cu2+ to Cu+ or Cu0 species.
In addition, the tiny chemical shift of binding energy for Cu2p3/2
0
as CuO → Cu . In many open literatures, this reduction peak is
ascribed to the process of reducting small CuO clusters. Wang
et al. [22] reported Cu/SiO2 catalyst prepared by impregnation
method presented three different temperature of TPR peaks (518 K,
5
60 K, and 629 K). The two lower reduced peaks can be tenta-
tively ascribed to small CuO clusters and highly dispersed copper
species; The reduced peak at 629 K may be caused by reduction