C648
Journal of The Electrochemical Society, 153 ͑9͒ C648-C655 ͑2006͒
0013-4651/2006/153͑9͒/C648/8/$20.00 © The Electrochemical Society
Epitaxial Growth of Ag on Au„111… by Galvanic Displacement
of Pb and Tl Monolayers
b
R. Vasilic,a, L. T. Viyannalage, and N. Dimitrov
*
a,b,**,z
aMaterials Science and Engineering Program, and bDepartment of Chemistry, State University of New
York at Binghamton, Binghamton, New York 13902, USA
The development of a new method for epitaxial growth of metals in solution by galvanic displacement of layers predeposited by
underpotential deposition ͑UPD͒ is discussed and experimentally illustrated. Cyclic voltammetry and scanning tunneling micros-
copy are employed to carry out and monitor a “quasi-perfect,” two-dimensional growth of up to 35 monolayers of Ag on Au͑111͒
by repetitive galvanic displacement of underpotentially deposited Tl and Pb monolayers. A complementary kinetic study of Pb and
Tl UPD layer stability at open-circuit potential identifies the oxygen reduction reaction and hydrogen evolution reaction as key
oxidative competitors of Ag in the proposed displacement protocol. Analysis of the morphology evolution during the growth of Ag
by displacement Pb and Tl UPD layers suggests the one-to-one exchange scenario ͑Ag–Tl͒ as more efficient for longer mainte-
nance of a layer-by-layer silver deposition. The excellent quality of layers deposited by monolayer-restricted galvanic displace-
ment is manifested by a steady UPD voltammetry and ascertained by an overall flat and uniform surface morphology maintained
during the entire growth process. An X-ray photoelectron spectroscopy analysis finds no traces of Pb and Tl in the Ag deposit.
© 2006 The Electrochemical Society. ͓DOI: 10.1149/1.2218769͔ All rights reserved.
Manuscript submitted April 4, 2006; revised manuscript received May 8, 2006. Available electronically July 13, 2006.
The growth of smooth, homo-, and heteroepitaxial metal layers
DMG and SMG,2-4 these methods are still subject to some limita-
tions and practical inconvenience that need to be addressed. For
instance, both methods are tunable over a variety of parameters,
including metal concentrations, scan rate, potential limits, and sub-
monolayer coverage that are mutually dependent and thus difficult
to balance. Also, the thickness control ͑via charge measurements͒
during growth is hindered by the interference of factors such as side
reactions and double-layer charging that, especially in DMG, are
manifested by currents comparable to ͑or even exceeding͒ the depo-
sition current level. Finally, although very low, the possibility for
incorporation of mediator into the deposit cannot be completely
ruled out.
In this paper we present an electrochemical and scanning tunnel-
ing microscopy ͑STM͒ study aimed at experimental validation of a
recently proposed deposition method6 realizing a monolayer-
restricted galvanic displacement ͑GD͒ as a “building block” for the
growth of smooth, epitaxial metal films. The employed strategy uti-
lizes a concept first proposed and then widely used for submono-
layer to monolayer surface modification, assisted by irreversible gal-
vanic displacement of underpotentially predeposited less-noble
metal by a more-noble metal of interest.7,8 The newly developed
protocol is enabled for heteroepitaxial systems in which the dis-
placed metal deposits underpotentially not only on the substrate, but
also on the growing metal, so that the “building block” reaction may
be repeated as many times as desired. Similarly, repetitive deposi-
tion loops have been technically used for years in electrochemical
atomic layer epitaxy ͑EC ALE͒ for growth of epitaxial, compound
semiconductor layers with wide application in the electronics
industry.9 Recent proof-of-concept results demonstrated excellent
growth uniformity achieved by multiple application of a galvanic
displacement step.6 A perfect thickness control during the deposition
is warranted by the redox exchange stoichiometry. The electroless
nature of the displacement reaction enables the decoupling of mutu-
ally dependent in a typical DMG or SMG scenario, growth control-
ling factors thus improving the overall deposition control. Lastly, a
potential monitoring during the displacement reaction serves to vir-
tually exclude incorporation of the UPD metal into the growing
layer.
has always been a major goal of electrodeposition. Such layers are
considered superior to any other kind of thin films as they strictly
reproduce the crystallography and ͑in general͒ the morphology of
the underlying substrate surface. Epitaxial metallic layers also fea-
ture reduced ohmic resistivity and electromigration that, along with
their continuity, render these layers highly desirable for applications
in the electronics industry and in the synthesis of low-metal loading
catalysts.
Thin-film growth modes are generally classified as Frank–van
der Merve or layer-by-layer ͑2D͒ growth, Volmer-Weber or 3D-
cluster growth, and Stranski-Krastanov ͑SK͒ mode, the latter asso-
ciated with a transition from 2D to 3D growth.1 Step-flow growth is
a multilayer variant of Frank–van der Merve mode and occurs at an
appropriate step density and deposition flux. As long as 2D mode is
operating during the growth ͑whether monolayer or multilayer͒, the
resulting film is in registry with the substrate structure. However, the
vast majority of characterized heteroepitaxial systems displays ei-
ther 3D or SK growth mode at ambient temperature. In addition,
owing to kinetic issues, 3D growth is often encountered even in
overlayer/substrate systems that should, according to thermody-
namic considerations, grow in a flat, 2D mode. As a result, 3D
clusters that are far apart grow predominantly in the vertical direc-
tion to merge eventually at a considerable layer thickness in a poly-
crystalline metal deposit.
A major advance toward electrodeposition of smooth, epitaxial
metal deposits was made by Sieradzki et al. with the development of
2
defect mediated growth ͑DMG͒ and surfactant mediated growth
͑SMG͒.3 The protocols employed in these techniques assume either
codeposition of the growing metal with a reversibly deposited me-
diator metal ͑Pb2+ or Cu2+͒ ͑DMG͒ or use a predeposited submono-
layer of “surfactant” metal ͑Pb2+͒ ͑SMG͒ that floats on the top of the
depositing metal and facilitates the 2D growth in the system of
interest. The applicability of these methods was successfully dem-
onstrated by growth of commercially thick metal deposits in the
4
systems Ag/Au͑111͒, Ag/Ag͑111͒,2,3 and Cu/Au͑111͒ with Pb2+
or Cu2+ as mediators. Recent X-ray specular reflectivity measure-
ments of Wang et al.5 demonstrated that nearly complete ͑“perfect
2D”͒ monolayer ͑ML͒ and bilayer Ag films can be grown by opti-
mized DMG procedures.
In this work the growth experiments are preceded by a concise
kinetic study of the stability of Tl and Pb UPD layers on Ag͑111͒ at
open-circuit potential ͑OCP͒. This effort is justified by arguments
͑discussed in more detail elsewhere10͒ associated with the competi-
tion between Ag+ as displacing ions and oxidative agents such as
oxygen reduction reaction ͑ORR͒ and hydrogen evolution reaction
͑HER͒. The ultimate goal of these experiments is to determine quan-
titatively a concentration of Ag+ that will guarantee maximum effi-
ciency and thus a stoichiometric yield of the employed displacement
Although results of structural characterization and elemental
analysis suggest smooth and inclusion-free epitaxial films grown by
*
Electrochemical Society Student Member.
Electrochemical Society Active Member.
**
z E-mail: dimitrov@binghamton.edu
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