Physica C 469 (2009) 1371–1373
Physica C
Electrodeposition of textured nickel on nickel alloy Hastelloy
M. Sugimoto a, , R. Teranishi , S. Ooue , M. Mukaida , N. Mori , K. Yamada ,
a
a
a
a
a
*
a
b
b
H. Fukushima , T. Izumi , Y. Shiohara
Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan
a
b
Superconductivity Research Laboratory, ISTEC, 1-10-13, Shinonome Koto-ku, Tokyo 135-0062, Japan
a r t i c l e i n f o
a b s t r a c t
Article history:
Available online 29 May 2009
We proposed a new method fabricating low-cost and mechanically strong tapes for coated conductors. In
this method, HastelloyÒ tape, which is a strong nickel alloy, is plated with a nickel film. A two-step plat-
ing was applied to obtain a textured nickel film. In the first step, a strike bath was used in order to plate a
nickel film on Hastelloy surface. In the second step, the film was plated in a low cost watts bath. We con-
trolled various plating conditions such as pH-condition, thickness, and current density in the watts bath
to fabricate a textured nickel film.
PACS:
8
8
1.15.Pq
2.45.Qr
The crystal orientation of the nickel films was characterized by an X-ray diffraction method (XRD) with
Keywords:
Hastelloy
Nickel plating
Strike bath
Watts bath
Cu K
a radiation. Preferred orientation of the film depends on pH of watts bath, nickel film thickness, and
current density. The optimal conditions for obtaining a textured nickel film are pH of 4.5 for the watts
2
bath, current density of 500 A/m , and thickness of 92
l
m. Finally, we succeeded in obtaining nickel films
with 96% c-axis orientation.
Ó 2009 Elsevier B.V. All rights reserved.
1
. Introduction
REBa Cu 7ꢀd (RE = Rare Earth elements, REBCO) coated con-
2. Experimental
2
3
O
A Hastelloy C-276 tape with 90 lm thick, 10 mm wide, and
ductors are mainly grown on substrates fabricated by means of a
Rolling-Assisted Biaxially Textured Substrates (RABiTS) method
and an Ion Beam Assist Deposition (IBAD) method [1,2]. In the RA-
BiTS method, fcc metal substrates are biaxially textured by heavy
cold rolling and annealing. Substrates fabricated by RABiTS method
are low cost, but mechanically weak, because basic material of the
substrate is composed by clean fcc metals.
20 mm long was used as a cathode electrode. One side of the
Hastelloy was electrolytic polished and the other side was coated
by an insulation tape. A nickel plate was used as an anode
electrode.
Both strike bath [5] and watts bath [6] were used to plate nickel
film on Hastelloy substrates. Compositions of these baths are
showed in Tables 1 and 2, respectively. First of all, the Hastelloy
2
On the other hand, substrates fabricated by an IBAD method are
tape was plated inversely at a current density of 500 A/m in the
strong. Inner layers (Yttria-stabilized zirconia (YSZ), Gd
2
Zr
2
O
7
strike bath for 30 s. Then, the tape was plated in the bath for
3 min to be deoxidized and plated nickel adhesion layers with
(
GZO) [3], MgO [4], etc.) in an IBAD substrate are biaxially textured
by an assisting ion beam on a Hastelloy. But this method is high-
cost due to their vacuum equipments, and inefficient for high
speed productive.
In this study, a new method is proposed which realizes a low-
cost and mechanically strong substrate for coated conductors.
We use Hastelloy substrates and plate biaxially textured nickel
films. High c-axis orientation of nickel films is discussed.
1.2 lm thickness. Next, the thin nickel film, obtained in the strike
bath, was thickened in the watts bath. We controlled pH-condition,
plating time, and current density in the watts bath to plate the tex-
tured nickel films. The pH of watts bath was adjusted with NaOH
3
solution of 10 mol/m from pH of 2.7–6.0. All nickel electro depo-
3
sitions were carried out in a glass beaker with 500 cm electrolyte
at about 40 °C.
Crystal orientations of the films were evaluated by using an X-
ray diffractometer h/2h scan with Cu–Ka radiation. In this study,
crystal orientation of the nickel film was estimated by a degree
of (2 0 0)Ni orientation, which was defined as follows:
*
Corresponding author. Present address: Mukaida laboratory, Department of
Materials Physics and Chemistry, Graduate School of Engineering, Kyushu Univer-
sity, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan. Tel.: +81 92 802 2979; fax:
81 92 802 2978.
r
200 ¼ F200=ðF111 þ F200 þ F220 þ F311
Þ
ð1Þ
ð2Þ
+
Fhkl ¼ Intensity ðcpsÞ=relative intensity
hkl
hkl
0
921-4534/$ - see front matter Ó 2009 Elsevier B.V. All rights reserved.
doi:10.1016/j.physc.2009.05.077