Journal of the Chemical Society. Chemical communications p. 359 - 361 (1986)
Update date:2022-08-29
Topics:
Wong, Joe
Thomas, John M.
Jefferson, David A.
Sparrow, Timothy G.
Koch, Edward F.
Using a range of electron spectroscopic (plasmon, core-electron-edge, X-ray emission) and electron microscopic (high-resolution imaging and optical diffractometry) techniques it is established that unannealed SIPOS is non-crystalline SiO0.50+/-0.05 and that the annealed form contains microcrystallites of elemental silicon (100 Angstroem diameter).
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