M.V. Rastei et al. / Surface Science 600 (2006) 2178–2183
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For 3 and 5 Hz deposits, rougher films were obtained with
thicknesses of about 40 and 50 nm, respectively. This slight
increase of film thickness is due to the different rms error
related to samples with a large particle size.
The in-plane magnetic anisotropy was measured by
angle-dependent magnetization measurements. By rotating
the samples in the film plane, no difference in magnetiza-
tion curves was observed, indicating no in plane uniaxial
anisotropy. This suggests that the particles have a ran-
domly crystalline orientation.
In order to have an insight into the crystalline structure
of the deposits, TEM observations have been performed.
HRTEM images reveal a well defined crystalline structure
of Co particles. Most of them are single crystals without
stacking faults and other defects. Fig. 5 shows a HRTEM
image of two adjacent nanoparticles scraped off from the
sample imaged in Fig. 1(a). Within each particle a single
crystal lattice can be observed, which consists of one set
of lattice fringes with a spacing of 0.205 nm. This is consis-
tent with the theoretical hcp {002} Co interplanar distance
of 0.2035 nm. The c axes of two individual lattices, repre-
sented by white arrows in the figure, show the random ori-
entation of two analyzed nanoparticles. Therefore, the
absence of the uniaxial in-plane anisotropy of these sam-
ples can indeed be attributed to the random orientation
of the single-crystal particles.
The magnetization measurements performed with the
field applied perpendicular to the sample plane, reveal for
all samples, larger saturation fields compared to those ob-
tained in the in-plane configuration measurements, which
speaks in favor of an in-plane anisotropy induced by the
particle coalescence. For samples grown during 12 s, both
in-plane and out-of-plane magnetization measurements re-
veal low values of remnant magnetization, which confirms
the random orientation of the crystalline structure of the
particles. The random character of the crystallographic
axes seems to be maintained in all three space directions,
as revealed by transmission electron microscopy and con-
firmed by a close inspection of the MFM images performed
on single particles. To summarize the magnetization mea-
surements, we plotted in Fig. 6 the effective anisotropy
factor Keff as a function of the deposition time. These vari-
ations show a continuous increase of Keff with the deposi-
Fig. 6. The effective anisotropy Keff as a function of the deposition time
for samples grown at 1, 3 and 5 Hz pulse frequencies. The lines are only a
guide for the eyes.
tion time, for all pulse frequencies, in agreement with the
AFM images which show an increasing number of coa-
lesced particles with the deposition time. Moreover, the sig-
nificant increase of Keff was observed for the deposits made
at 1 Hz, indicating that the coalescence of these small par-
ticles increases significantly the in-plane anisotropy. In con-
trast, Keff of the Co particles made using higher pulse
frequencies (3 and 5 Hz) seems to be nearly unaffected up
to 24 s deposition time, albeit the particle density increases.
The drastic increase of Keff with the further increase of the
deposition time at 40 s is due to the formation of compact
films. In this case, the reduction of the Keff value with the
increasing pulse frequency can easily be explained by the
increased film thickness for high pulse frequency and by
the reduced correlation between the large particles.
3.2. Organized nanoparticles
The random character of the Co particles nucleation on
natural defects can be avoided by creating focused ion
beam (FIB) small defects in the Si substrate, covered previ-
ously with a 200 nm thick SiO2 layer. Square arrays of
holes, 400 nm deep and distant by 2 lm, were etched on
different substrates. As shown in the scanning electron
microscopy (SEM) images of Fig. 7(a)–(c), three hole diam-
eters (550, 400 and 200 nm) were chosen in order to inves-
tigate the effect of the particle shape on the magnetic
properties.
AFM observations performed after the Co electrodepos-
ition at a rate of 1 Hz, show that the holes are homoge-
neously filled and protrude by a maximum of 10 nm out
of the surface (Fig. 7(d)–(f)). The current density and the
deposition time were about À0.5 mA/cm2 and 180 s,
respectively. The deposition time presented limited varia-
tions from one sample to another due to the confined
growth conditions. The choice of 1 Hz pulse frequency
was revealed to be the most adequate to grow organized
particles, since, as observed in the case of particle growth
on free silicon surface, this pulse sequence assures the
smallest grain size and the highest nucleation density. This
Fig. 5. TEM image reflecting the different orientation of the particle c-
axes. The particles were scraped from the sample grown at 1 Hz pulse
frequency and during 12 s.