polycrystalline CdO powder (ICDD no. 05-0640; Powder
Diffraction File, International Centre of Diffraction Data,
Newton Square, PA).
presence of O (Ka at 0.525 keV) and S (Ka at 2.307 keV),
respectively. No peaks relative to other light elements have been
detected, thus confirming for CdO and CdS their monophasic
nature, assessed through XRD measurements, and the absence of
any C contamination.
Thermal treatments under nitrogen (100 sccm) result in two
different phases, depending on the reaction temperature. In
particular, the XRD pattern of films heated at 350–450 uC
In summary, the novel adduct Cd(tta) ?tmeda represents, to our
2
(Fig. 3b) show several peaks at 2h 5 28.75, 33.30, 47.75 and
knowledge, the first example of a multi-functional single source
5
6.70u, corresponding to the 111, 200, 220 and 311 reflections
precursor which reproducibly and selectively yields CdO or CdS
films, depending on the processing parameters. Its thermal
properties point to its potential application as a single precursor
for the synthesis of Cd-containing nanoparticles through a
respectively of the CdF2 cubic lattice, in accordance with the
nature of the residue found in the TG analysis. Films are also
polycrystalline and randomly oriented, in accordance with data
reported in the ICDD database (ICDD no. 23-0864).
15
surfactant-based template approach, and studies are currently
in progress. In addition, the easy synthetic procedure and simple
deposition process make the new cadmium adduct an attractive
candidate, not only for laboratory solution processes, but also for
large scale applications.
Thermal treatments under nitrogen at temperatures higher than
550 uC give rise to a different XRD pattern, with several peaks that
point to the formation of a new Cd-containing phase, namely CdS.
In fact, all the peaks (Fig. 3c) observed at 2h 5 24.85, 26.55, 28.20,
3
6.75, 43.85, 47.90, 51.90 and 52.80u can be associated with
The authors thank the MIUR for the financial support. Dr. G.
G. Condorelli is acknowledged for FT-IR measurements. CRIST
(Centro Interdipartimentale di Cristallografia Strutturale),
University of Florence is also gratefully acknowledged.
the reflections of the hexagonal CdS lattice (ICDD no. 41-1049).
The presence of all the expected reflections also points to the
polycrystalline nature of the CdS films. Actually, the low intensity
of these peaks, together with the broad peak centered around 20u,
indicate that the CdS films are of a poorly crystalline nature.
Notes and references
The change from CdF
in the 450–550 uC range under N
films.
2
to CdS is gradual, and at temperatures
{
Elemental analysis of 1. Calc. for C22
N, 4.18; S, 9.56. Found: C, 39.15; H, 3.76; N, 4.25; S, 9.35%.
Crystallographic data for 1: C22 24CdF , M 5 670.95, mono-
clinic, space group P2 /c, a 5 17.582(5), b 5 8.335(2), c 5 18.610(7) A˚ ,
6 2 4 2
H24CdF N O S : C, 39.38; H, 3.61;
2
, both phases are present in the
§
H
6 2 4 2
N O S
The SEM images (Fig. 3) show completely different morpho-
logies in accordance with the XRD data. Larger rounded grains
1
3
23
˚
b 5 92.61(3)u, V 5 2724.4(14) A , T 5 293 K, Z 5 4, D
c
5 1.636 g cm , m
Mo-Ka) 5 1.026 mm , 4804 reflections collected, 4640 unique
21
(
and square shaped grains are observed for the CdO and CdF
2
2
int 5 0.0327). F refinement, R1 5 0.0510 (I . 2s(I)), wR2 5 0.1467
(R
films, respectively, while a nanostructured surface with grain
dimensions less than 100 nm in diameter is observed for CdS films.
To better understand the decomposition mechanism under a N2
atmosphere, the precursor decomposition process has been
investigated through gas phase FT-IR (Fourier Transform-
Infrared) analysis using nitrogen as the reaction gas. IR spectra
show that precursor decomposition starts at 250 uC and is
(all data). CCDC 277427. For crystallographic data in CIF or other
electronic format see DOI: 10.1039/b509623e
1 L. Weinhardt, Th. Gleim, O. Fuchs, C. Heske, E. Umbach, M. Bar,
H.-J. Muffler, Ch.-H. Fischer, M. C. Lux-Steiner, Y. Zubavichus,
T. P. Niesen and F. Karg, Appl. Phys. Lett., 2003, 82, 571–573.
2
MRS Bull. 2000, 25, (8), ed. D. S. Ginley and C. Bright. Special issue on
transparent conducting oxides.
S. A. Kazanskii, D. S. Rumyantsev and A. I. Ryskin, Phys. Rev. B,
3
complete at 300 uC. This indicates that at the temperature of CdF
2
2002, 65, 165214–165225.
formation, the tta ligand is completely decomposed. This supposed
decomposition mechanism does not give an immediate explanation
of the CdS phase formation at higher temperatures since once the
precursor has decomposed, no S should be available for further
reaction unless a S residue remains in the film. The EDX analysis
4
5
T. Kobori and K. Tsutsui, Appl. Phys. Lett., 2001, 78, 1406–1408.
A. B. M. A. Ashrafi, H. Kumano, I. Suemune, Y. W. Ok and
T. Y. Seong, J. Cryst. Growth, 2002, 237–239, 518–522.
6
7
M. Yan, M. Lane, C. R. Kannewurf and R. P. H. Chang, Appl. Phys.
Lett., 2001, 78, 2342–2344.
A. W. Metz, J. R. Ireland, J. G. Zheng, R. P. S. M. Lobo, Y. Yang,
J. Ni, C. L. Stern, V. P. Dravid, N. Bontemps, C. R. Kannewurf,
K. R. Poeppelmeier and T. J. Marks, J. Am. Chem. Soc., 2004, 126,
of CdF films actually shows the presence of the S-Ka peak at
2
2
.307 keV in addition to the F-Ka peak at 0.677 keV and the Cd-L
peaks observed in the range 3.120–3.750 keV. The amount of S is
about 15–20%.
8477–8492.
J. R. Babcock, A. W. Metz, N. L. Edleman, M. V. Metz, M. A. Lane,
C. R. Kannewurf and T. J. Marks, Chem. Vap. Deposition, 2001, 7,
8
Therefore, it is likely that at lower temperatures under N
2
, the
2
39–241.
9 A. Gulino, P. Dapporto, P. Rossi and I. L. Fragal a` , Chem. Mater.,
002, 14, 1441–1444.
precursor decomposition yields the CdF phase and some
2
2
amorphous S and/or CdS that is not detectable using XRD.
Upon increasing the temperature, the amorphous S reacts with
1
0 D. Barreca, A. Gasperotto, C. Maragno and E. Tondello,
J. Electrochem. Soc., 2004, 151, G428–G435.
CdF
2
, yielding CdS and volatile species containing F. On the other
to yield CdO, the
1
1 Y. K. Hwang, S. Y. Woo, J. H. Lee, D. Y. Jung and Y. U. Kwon,
Chem. Mater., 2000, 12, 2059–2063.
2 M. W. Jones, L. J. Rigby and D. Ryan, Nature, 1966, 212, 5058–5060.
3 F. H. Allen, Acta Crystallogr., Sect. B, 2002, B58, 380–388.
hand, it is well known that CdS reacts with O
2
1
1
most stable of the two phases. Therefore, it is straightforward that
CdO always forms independently of the processing temperature
14 L. C. Tzavellas, C. Tsiamis, C. A. Kavounis and C. J. Cardin, Inorg.
when reactions are carried out under O . The EDX data of CdO
2
Chim. Acta, 1997, 262, 53–59.
15 M.-P. Pileni, Nat. Mater., 2003, 2, 145–150.
and CdS films show, in addition to the Cd peaks, the unique
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Chem. Commun., 2005, 5681–5683 | 5683