Formation of TUNGSTEN SILICIDE (cas 12039-88-2) on an STM tip during atom manipulation

Add time:08/04/2019    Source:sciencedirect.com

We have investigated compositional changes of a tip before and after atom manipulation by a scanning tunnelling microscope (STM) combined with an atom probe (AP). On clean Si(0 0 1) : (2×1), the surface was modified by the STM with a bias of +5 V and 2 nA at the sample. The AP mass spectrum clearly showed that Si as well as W atoms were detected. The detected ratio of W to Si is 1 : 2 at first and then 5 : 3, which indicates that two types of stable TUNGSTEN SILICIDE (cas 12039-88-2)s, WSi2 and W5Si3, respectively, are formed on the STM tip. Direct evidence of silicide formation during atom manipulation was clearly shown by STM combined with AP(AP-STM).

We also recommend Trading Suppliers and Manufacturers of TUNGSTEN SILICIDE (cas 12039-88-2). Pls Click Website Link as below: cas 12039-88-2 suppliers

Prev:TUNGSTEN SILICIDE (cas 12039-88-2) contacts to polycrystalline silicon and silicon–germanium alloys
Next:Chemical vapor deposition of TUNGSTEN SILICIDE (cas 12039-88-2) (WSix) for high aspect ratio applications)