A.-F. Shihada, F. Weller
Table 6 Crystal data, measurement, and structure refinement details for 1, 2, and 3
1
2
3
Formula
[Ph3Sn(O2AsMe2)]
486.98
monoclinic
P21/n
699.8(1)
1961.4(2)
1433.6(2)
[(n-Bu)2ClSn(O2AsMe2)]
405.32
[PhClSn(O2AsMe2)(µ-OMe)]2
Formula weight
Crystal system
Space group
a / pm
399.26
monoclinic
P21/m
triclinic
¯
P1
480.6(1)
822.8(2)
b / pm
1992.7(2)
910.4(2)
c / pm
808.8(1)
929.2(2)
α /deg
77.04(3)
ß / deg
95.174(13)
103.726(5)
82.35(3)
γ / deg
68.69(3)
V / pm3 x 10Ϫ4
Cell determination
ρcalc / g x cmϪ3
Z
1959.7(4)
752.4(1)
10047
1.789
2
400
40.41
IPDS II (Stoe)
71.073
192(2)
omega-scans
Ϫ6 Յ h Յ 6, Ϫ27 Յ kՅ 27,
Ϫ11 Յ l Յ10
2.04 to 29.28°
11619
2089 [R(int)ϭ0.0336]
2089
1849 [I>2sigme(I)]
face-indexed
630.9(3)
7166 (Θ 2.0 to 25.8)
2775 (Θ 2.2 to 25.7)
1.651
2.102
2
384
48.24
IPDS I (Stoe)
71.073
193(2)
phi scans
4
F(000)
960
µ (MoKα ) / cmϪ1
Diffractometer type
Wavelength / pm
T / K
29.88 cmϪ1
IPDS I (Stoe)
71.073
193(2)
phi scans
Ϫ8 Յ h Յ 8, Ϫ23 Յ kՅ 24,
Ϫ17 Յ l Յ17
1.76 to 25.99
15312
3809 [R(int)ϭ0.1115)]
3809
Scan mode
hkl range
Ϫ10 Յ h Յ 10, Ϫ11 Յ kՅ 11,
Ϫ11 Յ l Յ10
2.25 to 26.05°
6289
2309 [R(int)ϭ0.0817]
2309
Theta range for data collection
Reflections collected
Independent reflections
Reflections used for refinement
Observed reflections
Absorption correction
Programs used
Solution
Refinement
refined parameters
wR2 [all reflections]
R1 [I>2sigma(I)]
2223 [I>2sigma(I)]
based on equivalent reflections
1398 [I>2sigme(I)]
based on equivalent reflections
XCAD4[24], SHELXS-97, SHELXL-97[25], PLATON[26], SHELXTL[27],
Direct Methods/difmap
Direct Methods/difmap
Patterson Methods/difmap
Full-matrix least-squares on F2
188
90
131
0.0597
0.0343
0.002
0.0444
0.0211
0.018
0.0626
0.0363
(shift/error)max
ρfin (max/min) / eA
-0.002
Ϫ1
˚
0.638/Ϫ0.525
0.385/Ϫ1.025
0.731/Ϫ0.799
successive refinement cycles and difference Fourier syntheses [25].
Hydrogen atoms were introduced into the models as part of rigid
groups. Geometrical calculations were carried out by PLATON
[26].
[12] A.-F. Shihada, Z. Naturforsch. 1995, 50b, 745.
[13] R. C. Paul, V. Nagpal, S. L. Chadha, Inorg. Chim. Acta 1972,
6, 335.
[14] R. C. Poller, Spectrochim. Acta 1966, 22, 935.
[15] M. G. Newton, I. Haiduc, R. B. King, C. Silvestru, J. Chem.
Soc., Chem. Comm. 1993, 1229.
[16] V. Chandrasekhar, V. Baskar, A. Steiner, S. Zacchini, Or-
ganometallics 2004, 23, 1390.
[17] J. G. Masters, F. A. K. Nasser, M. B. Hossain, A. P. Hagen,
D. van der Helm, J. J. Zuckerman, J. Organomet. Chem. 1990,
385, 39.
Crystallographic data (excluding structure Factors) have been de-
posited with the Cambridge Crystallographic Data Centre as sup-
plementary publications nrs. CCDC-659567 (1), CCDC-659568 (2),
and CCDC-659569 (3). Details are available, free of charge, on
application to CCDC, 12 Uniion Road, Cambridge CB2 1EZ, UK
(fax: (ϩ44) 1223/336033; e-mail: deposit@ccdc.cam.ac.uk)
[18] A.-F. Shihada, F. Weller, Z. Naturforsch. 1995, 50b, 1343.
[19] F. Weller, A.-F. Shihada, J. Organomet. Chem. 1987, 322, 185.
References
´
[20] A. Diasse-Sarr, A. H. Barry, T. Jouini, L. Diop, B. Mahieu,
M. F. Mahou, K. C. Molloy, J. Organomet. Chem. 2004, 689,
2087.
[1] B. L. Chamberland, A. G. MacDiarmid, J. Chem. Soc. 1961,
445.
[21] (a) M. Kondracka, K. Merzweiler, Z. Anorg. Allg. Chem. 2007,
633, 1131; (b) M. Kondracka, T. Herntrich, K. Merzweiler, Z.
Anorg. Allg. Chem. 2007, 633, 2121.
[22] D. W. Allen, I. W. Nowell, J. S. Brooks, R. W. Clarkson, J.
Organomet. Chem. 1981, 219, 29.
[23] A.-F. Shihada, F. Weller, Z. Kristallogr., New Cryst. Struct.
1997, 212, 332.
[24] K. Harms, XCAD4 Program for Data Reduction, Marburg,
1993.
´
[2] M. Sidibe, M. Lahlou, L. Diop, B. Mahieu, Main Group Met.
Chem. 1998, 21, 605.
[3] I. G. M. Campbell, G. W. A. Fowles, L. A. Nixon, J. Chem.
Soc. 1964, 3026.
[4] H. Schumann, T. Östermann, M. Schmidt, Chem. Ber. 1966,
99, 2057.
[5] H. Schumann, A. Roth, Chem. Ber. 1969, 102, 3725.
[6] A.-F. Shihada, F. Weller, Z. Anorg. Allg. Chem. 2002, 628,
1007.
[25] G. M. Sheldrick, SHELXS-97, SHELXL-97 Programs for the
Solution and Refinement of Crystal Structures, Göttingen,
1997.
[26] A. L. Spek, PLATON-89, University of Utrecht, 1989.
[27] G. M. Sheldrick, SHELXTL, Release 5.03 for Siemens Ana-
lytical X-Ray Instruments Inc., Madison, WI, 1990.
[7] A.-F. Shihada, F. Weller, Z. Naturforsch. 1998, 53b, 699.
[8] V. K. Jain, Coord. Chem. Rev. 1994, 135/136, 809.
[9] A.-F. Shihada, F. Weller, Z. Anorg. Allg. Chem. 2006, 632, 2238
(and references therein).
[10] A.-F. Shihada, F. Weller, Z. Anorg. Allg. Chem. 2001, 627, 638.
[11] A.-F. Shihada, Z. Naturforsch. 1994, 49b, 1319.
344
2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Z. Anorg. Allg. Chem. 2008, 339Ϫ344