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Tavcar et al.
3934 Organometallics, Vol. 29, No. 17, 2010
To gain more detailed insight into the structural properties
of 7, the molecular structure was unequivocally elucidated by
single-crystal X-ray diffraction studies (Figure 2).10 Com-
pound 7 crystallizes in the monoclinic space group P21/c. The
important bond lengths and bond angles are given in the
legend of Figure 2. The X-ray structure revealed the silicon
atom to be five-coordinate17 and exhibits a distorted square-
pyramidal geometry. The two nitrogen atoms from the amidi-
nato ligand and the two oxygen atoms from the diketone
form the base of the pyramid and occupy the four coordina-
tion sites. The remaining apical coordination site is occupied
by the chlorine atom. The two independent silicon oxygen
Table 1. Crystallographic and Structure Refinement
Data at 100.0(2) K
parameter
5 0.5toluene
7
3
empirical formula
fw
space group
˚
C61.5H70N4O4Si2 C29H33ClN2O2Si
985.39
P21/c
505.11
P21/c
a (A)
13.7468(18)
21.681(3)
19.780(3)
109.503(2)
5556.9(13)
4
12.2971(4)
18.4375(6)
11.5359(3)
95.673(2)
2602.70(14)
4
˚
b (A)
˚
c (A)
β (deg)
3
V (A )
˚
Z
F
calcd (g/cm3)
F(000)
1.178
2108
0.114
1.289
1072
0.222
˚
bond lengths are 1.6796(13) and 1.7064(13) A, respectively,
μ (mm-1
)
which match very well with the reported silicon oxygen single-
bond distance.11 Another notable aspect is the O-Si-O and
N-Si-N bond angles. The former is only 90.71(6)°, which is
smaller compared to the reported O-Si-O angles, whereas
the latter (70.09(7)°) shows a small increase if compared with
that of compound 6 (68.35(8)°).15 The reduction of the
O-Si-O bond angle as well as the increase of the N-Si-N
bond angle is probably the result of the ring strain of the
θ range for data collection (deg) 1.44-26.72
1.66-26.40
59 125/5325
11 781/101/708 5325/0/322
reflns collected/unique [I > 2σ(I)] 84 719/11 781
data/restraints/params
Goof on F2
1.050
0.0450
1.060
0.0392
R1 [I > 2σ(I)]
wR2 (all data)
˚
largest diff peak/hole (e A
0.1142
0.725/-0.628
0.1000
0.285/-0.348
-3
)
Calcd for 5 0.5toluene: C61.5H70N4O4Si2 (985.39) C, 74.96; H,
3
˚
7.16; N, 5.69. Found: C, 74.51; H, 7.22; N, 5.55. 1H NMR (500
MHz, C6D6, 25 °C): δ 1.42 (s, 36 H, tBu), 6.29 (s, 2H, CH),
6.86-6.96 (m, 10 H, Ph); 7.92-8.19 (m, 10 H, Ph) ppm. 13C{1H}
NMR (125.75 MHz, C6D6, 25 °C): δ 30.8(CMe3), 57.2 (CMe3),
125.6, 126.4, 127.0, 127.8, 127.9, 128.5, 128.9, 129.4, 129.9,
130.2, 133.0 (Ph), 171.37 (NCN) ppm. 29Si{1H} NMR (99.36
MHz, C6D6, 25 °C): δ -79.75 ppm. EI-MS: m/z 939 [Mþ]
(100%).
heterocycle in 7. The Si-Cl distance in 7 (2.0958 (7) A) is
shorter when compared with that of 6 (2.156(1) A).
15
˚
In conclusion, we have prepared two siladioxolene deri-
vatives stabilized by a bulky amidinato ligand. Both the
compounds were formed by [1þ4] cycloaddition reaction
between the low-valent silicon compounds and benzil. The
formal oxidation state of silicon in 5 is þ3, whereas that in 7
is þ4. The molecular structure of 5 shows that the Si-Si
bond is not cleaved during the reaction. The formation of 5
and 7 as stable compounds indicates that siladioxolenes can
be electronically stabilized by σ-donor ligands. Here it is also
worth pointing out that reduction of 7 in a molar ratio of 1:1
with KC8 in THF and toluene did not furnish 5 and leads to a
mixture of insoluble products, which could not be identified.
Preparation of 7. Toluene (25 mL) was added to the mixture of
6 (0.29 g, 1.02 mmol) and benzil (0.21 g, 1.00 mmol) at ambient
temperature. The mixture was stirred overnight. The solvent
was removed under vacuum. The residue was treated with 20 mL
of toluene and filtered. Storage of the filtrate at -32 °C in a
freezer for 1 day afforded colorless crystals of 7 (0.39 g, 71.4%).
Mp: 164-170 °C. Anal. Calcd for C29H33ClN2O2Si (505.12): C,
1
68.96; H, 6.58; N, 5.55. Found: C, 68.66; H, 6.43; N, 5.06. H
NMR (500 MHz, THF-d8, 25 °C): δ 1.20 (s, 18H, tBu),
7.13-7.56 (m, 15H, Ph) ppm. 13C{1H}NMR (125.75 MHz,
THF-d8, 25 °C): δ 31.8 (CMe3), 55.6 (CMe3), 127.4, 127.6,
128.5, 128.6, 128.9, 129.1, 129.9, 130.6, 135.6, 135.2, 135.8
(Ph), 175.2 (NCN) ppm. 29Si{1H}NMR (99.36 MHz, C6D6,
25 °C): δ - 92.2 ppm. EI-MS: m/z 505 [Mþ] (100%).
Experimental Section
All manipulations were carried out in an inert gas atmosphere
of dinitrogen using standard Schlenk techniques and in a
dinitrogen-filled glovebox. The solvents used were purified by
a MBraun solvent purification system, MB SPS-800. Com-
pounds 4 and 6 were prepared by literature methods.2a,8c All
chemicals purchased from Aldrich were used without further
purification. 1H, 13C, and 29Si NMR spectra were recorded
using a Bruker Avance DPX 200 or a Bruker Avance DRX 500
spectrometer. The 1H, 13C, and 29Si NMR spectra were recorded
in C6D6 and THF-d8. The chemical shifts δ are reported in ppm
relative to SiMe4 as external standard. EI-mass spectra were
obtained using a Finnigan MAT 8230 instrument. Elemental
Crystal Structure Determination. Shock-cooled crystals were
selected and mounted under nitrogen atmosphere using the
X-TEMP.10 The data for 5 0.5toluene were collected at 100(2)
3
K on a Incoatec Mo microsource18 with Quazar mirror optics
and an APEX II detector on a D8 goniometer. The data of 7
were measured on a Bruker TXS-Mo rotating anode with Helios
mirror optics and an APEX II detector on a D8 goniometer.
Both diffractometers were equipped with a low-temperature
˚
device and used MoKR radiation, λ = 0.71073 A. The data of
€
analyses were performed by the Institut fur Anorganische
Chemie, Universitat Gottingen. Melting points were measured
5 0.5toluene and 7 were integrated with SAINT,19 and an
€
€
3
empirical absorption (SADABS) was applied.20 The structures
were solved by direct methods (SHELXS-97) and refined by full-
matrix least-squares methods against F2 (SHELXL-97).21 All
non-hydrogen atoms were refined with anisotropic displace-
ment parameters. The hydrogen atoms were refined isotropi-
cally on calculated positions using a riding model with their Uiso
values constrained to equal to 1.5 times the Ueq of their pivot
atoms for terminal sp3 carbon atoms and 1.2 times for all
other carbon atoms. Disordered moieties were refined using
€
in a sealed glass tube on a Buchi B-540 melting point apparatus.
Preparation of 5. Toluene (20 mL) was added to a mixture of 4
(0.1 g, 0.19 mmol) and benzil (0.08 g, 0.37 mmol) at ambient
temperature. The mixture was stirred overnight. The volatiles
were removed in vacuo, and n-hexane (10 mL) was added to the
residue. The reaction mixture once again was stirred overnight.
The n-hexane was removed in vacuo, and toluene (10 mL) was
added to the reaction mixture. The solution was concentrated
and stored at room temperature for two days to yield colorless
crystals of 5 0.5toluene (0.07 g, 38.9%). Mp: 154-158 °C. For
the elemental analysis 5 was treated in vacuo overnight. Anal.
3
(18) Schulz, T.; Meindl, K.; Leusser, D.; Stern, D.; Ruf, M.; Shel-
drick, G. M.; Stalke, D. J. Appl. Crystallogr. 2009, 42, 885–891.
(19) Bruker, SAINT v 7.68A; Bruker AXS Inc.: Madison, WI, 2009.
(17) The bonding in high-coordinate silicon complexes is elucidated
in: Kocher, N.; Henn, J.; Gostevskii, B.; Kost, D.; Kalikhman, I.;
Engels, B.; Stalke, D. J. Am. Chem. Soc. 2004, 126, 5563–5568.
€
(20) Sheldrick, G. M. SADABS 2008/2; University of Gottingen, 2008.
(21) Sheldrick, G. M. Acta Crystallogr., Sect. A 2008, 64, 112–122.