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C=total integrated peak count, R=ratio of scan time
to background counting time, B=total background
count, Lp=Lorentz-polarization factor, p=p-factor].
We used a p factor (0.050) to downweight the intense
reflections and then a goodness of fit of 1.51 was
obtained. The final R (Rw) value was 0.054 (0.071).
Plots of Sw(ꢀFoꢀ−ꢀFcꢀ)2 versus ꢀFoꢀ, reflection order in
data collection, (sin q)/u and various classes of indices
showed no unusual trends. Crystallographic data are
summarized in Table 1. The atomic coordinates are
listed in Table 3.
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Acknowledgements
We thank Dr M. Oshima and Prof. H. Suzuki of
Tokyo Institute of Technology for collection of X-ray
diffraction data of 3. This work was financially sup-
ported by a Grant-in-Aid for Scientific Research from
the Ministry of Education, Science, Sports and Culture,
Japan.
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