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The dynamic force mode AFM study was carried out
on a Nanocute scanning probe microscope system
(SII Nanotechnology). 2D-GIXD experiments were
conducted at the SPring-8 on the beamline BL19B2.
The sample was irradiated at a fixed incident angle
on the order of 0.12° through a Huber diffractome-
˚
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detector (Pilatus 300K, Dectris, Baden, Switzerland).
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by spin casting the polymer and polymer/PC61BM
solution on the ITO substrate.
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Solar Cell Fabrication and Measurement
ITO substrates were first precleaned sequentially by
sonicating in a detergent bath, deionized water, ace-
tone, and isopropanol at room temperature, and in
a boiled isopropanol bath each for 10 min, and then
baked at 120°C for 10 min in air. The substrates were
then subjected to a UV/ozone treatment at room
temperature for 20 min. The precleaned ITO sub-
strates were coated with PEDOT:PSS (Clevios P VP
Al4083, Heraeus, Hanau, Germany) by spin coat-
ing (5000 rpm for 30 s, thickness: ꢀ50 nm). The
photoactive layer was deposited in a glove box by
spin coating a CB solution, containing 3–6 g/L of the
polymer sample with respective amount of PC61BM,
at 400 rpm for 20 sec and 1500 rpm for 5 sec, in
which the solution was kept heated at 100°C. The
thin films were transferred into a vacuum evapo-
rator connected to the glove box, and the Ca layer
(20 nm) and the Al layers (100 nm) were deposited se-
quentially. The active area of the cells was 0.16 cm2.
J–-V characteristics for the cells were measured us-
ing a Keithley 2400 source measure unit in nitrogen
atmosphere under 1 Sun (AM1.5G) conditions us-
ing a solar simulator (XES-40S1, San-Ei Electric,
Osaka, Japan). The light intensity for the J--V mea-
surements was calibrated using a reference PV cell,
AK-100 (Konica Minolta, Tokyo, Japan), which was
certified at National Institute of Advanced Industrial
Science and Technology, Japan. EQE spectra were
measured using a spectral response measuring sys-
tem (S 9241, Soma Optics, Tokyo, Japan).
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Heteroatom Chemistry DOI 10.1002/hc