
Journal of Structural Chemistry p. 115 - 121 (1982)
Update date:2022-08-05
Topics:
Sharapov, V. A.
Gusev, A. I.
Bel'skii, V. K.
Zavodnik, V. E.
Stepanov, V. V.
et al.
An x-ray structural study of two organosilicon compounds, 2,2-diphenyl-2-sila-1-oxa-1,2-dihydronaphthalene (I) and 2,2-dichloro-3-trichlorosilyl-2-sila-1-oxa-1,2-dihydronaphthalene (II), has been carried out.The structures were determined by the direct method and refined by the method of least squares in the anisotropic (I) and isotropic (II) approximations from three-dimensional sets of diffractometric data as far as R-factors of 8.6 and 15.5 percent for compounds I and II respectively.Both molecules are characterized by planar conformation of the naphthalene unit, and the intracyclic Si-C bond lengths (1.838 and 1.82 Angstroem for compounds I and II, respectively) are slightly shorter than the standard value of 1.87 Angstroem.
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