G. C. Papavassiliou et al. · Nickel 1,2-Dichalcogenolene Complexes as Single-component Semiconductors
683
(Diphenylethylenedithiolato)(1,3-dithiol-2-thione-4,5-
dithiolato)nickel, Ni(dpedt)(dmit)
every 97 reflections showed less than 3 % variation and no
decay. Lorentz, polarization and analytical absorption cor-
rections were applied using Crystal Logic software. Sym-
metry equivalent data were averaged with Rint = 0.0389
to give 1799 independent reflections from a total of 1981
collected. The structure was solved by Direct Methods us-
ing SHELXS-86 [22] and refined by full-matrix least-squares
techniques on F2 with SHELXL-97 [23] using 1799 reflec-
tions and refining 140 parameters. All hydrogen atoms were
introduced at calculated positions as riding on bonded atoms.
All non-hydrogen atoms were refined anisotropically. The
largest shift/esd in the final refinement cycle was 0.002.
Table 1 contains further numbers of the structure refine-
ment. CCDC 628860 contains the supplementary crystallo-
graphic data for this paper. These data can be obtained free
of charge from The Cambridge Crystallographic Data Centre
Using 3 (270 mg, 1 mmol) [13], instead of 1a, and 2
(406 mg, 1 mmol), the complex Ni(dpedt)(dmit) was ob-
tained by the same procedure (104 mg, 21 %). M. p.
240 ◦C (dec.). – UV/vis/near IR (CS2): λmax (lgεmax) =
974 nm (4.65). – IR (KBr): ν = 1066, 1077 (C=S) cm−1
.
– C17H10S7Ni (497.35): calcd. C 41.05, H 2.01; found
C 40.92, H 1.93.
(1,2-Bis-decylsulfanyl-ethene-1,2-dithiolato)(1,3-dithiol-2-
thione-4,5-dithiolato)nickel, Ni(dcdt)(dmit)
Using 5 (462 mg, 1 mmol) [14], instead of 1a, and 2
(406 mg, 1 mmol), the complex Ni(dcdt)(dmit) was obtained
by the same procedure (5.5 mg, 0.8 %). M. p. 105 ◦C (dec.).
– UV/vis/near IR (CS2): λmax (lgεmax) = 1040 nm (4.54).
– IR (KBr): ν = 1064, 1072 (C=S), 2915 (CH3) cm−1
.
Physical measurements
– C25H42S9Ni (689.57): calcd. C 43.54, H 6.09; found
C 43.50, H 6.14.
Thin deposits on quartz plates and/or Si-SiO2 substrates,
with predefined interdigitated gold electrodes spaced 2 –
25 µm apart, were obtained by spinning, spraying or drop
casting solutions of the complexes in CS2. The OA spectra of
the complexes in CS2 or of thin deposits were recorded on a
Perkin-Elmer, model Lambda 19 spectrophotometer. The dc
conductivity was measured by the well known voltage-drive
method. The Id-Vd characteristics were measured by using a
4140B HP picoammeter.
X-Ray crystal structure determination
A suitable single crystal was mounted in air and
diffraction measurements were made on a P21 Nicolet
diffractometer upgraded by Crystal Logic using graphite-
monochromated CuKα radiation. Crystal data and other
numbers pertinent to the structure determination are col-
lected in Table 1. Unit cell dimensions were determined and
refined by using the angular settings of 25 automatically cen-
tered reflections in the range 22 < 2θ < 54◦. Intensity data
were recorded using θ-2θ scans to 2 θmax = 118◦, with a
scan speed of 4.5 deg min−1 and a scan width of 2.45◦
plus α1α2 separation. Three standard reflections monitored
Acknowledgement
The work was carried out as a part of the “Excellence
in the Research Institutes” project grant 0684, supported by
GSRT/Ministry of Development in Greece.
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