J. Choi et al.
Dyes and Pigments 189 (2021) 109255
this validates the formation of Lewis adduct between O atom of the
organic HTM and unsaturated Pb2+ ions of the perovskite [49,50]. To
rule out the possibility of oxidation of perovskite, we immediately
characterized the samples, and no peak was observed from the
perovskite-only layer even after its exposure to air for several hours.
X-ray diffraction (XRD) patterns in Fig. 1d, referenced to ITO signals,
show that the crystallinity of perovskite is enhanced on the underlying
organic HTL. The passivation of defect at the interface is believed to
assist the growth of perovskite crystal in the preferred orientation.
characteristics, which were measured under 100 mW cmꢀ 2 AM 1.5G
illumination, at a scan rate of 0.05 V sꢀ 1 for forward scan, in an atmo-
sphere without encapsulation, and with an aperture area of 0.096 cm2,
are represented in Fig. 3a. J-V curves of PSCs show that the efficiency of
the PSC without organic HTM is largely improved from 16.28% [short
circuit current density (Jsc): 21.95 mA cmꢀ 2, open circuit voltage (Voc):
1.04 V, fill factor (FF): 71.44%] to 18.29% (Jsc: 22.41 mA cmꢀ 2, Voc:
1.04 V, and FF: 78.47%) with the addition of organic HTL. For reference,
the average values of PV cell parameters, obtained by J-V characteris-
tics, are summarized in Table 1. The enhancement of photocurrent could
be further confirmed by external quantum efficiency (EQE) spectra
(Fig. 3b), and the Jsc values, obtained by integrating the EQE spectra,
were well-matched to those from the J-V plots. Meanwhile, the PSCs
with organic HTM did not show any hysteretic behaviors, as shown in
Fig. 4a, and the performances of devices, measured at the maximum
power point, were comparable to those from J-V scanning (Fig. 4b),
representing the stable operation of the devices. As mentioned, the
improved interfacial properties along with the superior quality of defect-
passivated perovskite are also expected to enhance the stability of PSC
devices [58], and we confirmed that the PSCs with organic HTM showed
excellent stability (Fig. 4c), preserving 92% of its initial efficiency for
500 h in ambient air (Al2O3-encapsulation, room temperature, and the
relative humidity between 30% and 50%).
Moreover, under UV-irradiation (from perovskite-side), while
a
diffraction peak at 12.6◦, related to (001) plane of PbI2 impurity, is
newly generated from the pristine perovskite, demonstrating the
decomposition of the perovskite, no PbI2-related peak is observed from
the perovskite, grown on the organic HTM, proving its enhanced UV-
stability after passivation (Fig. 1e) [51,52]. The variation of intensity
and full width at half maximum (FWHM) of main XRD peak of perov-
skite at ~ 14◦ is summarized in Table S3, for reference. Additionally, the
perovskite grains with and without organic HTM are shown in scanning
electron microscope (SEM) images in Fig. 1c and Fig. S8.
Fig. 2a shows that photoluminescence (PL) intensity of perovskite is
30% and 54% reduced in NiOx/perovskite and NiOx/organic HTM/
perovskite films, respectively, compared to that of pristine perovskite
film. These reduced PL spectra represent that the recombination loss in
the perovskite photo-absorber is suppressed by the passivation of its
defects with the organic HTM [53–56]. Additionally, charge transfer
dynamics at the interface was further examined by time-resolved pho-
toluminescence (TRPL) measurement (Fig. 2b and Table S4), and it was
confirmed that the carrier lifetime of 202 ns, observed from the
perovskite-only thin film, decreased to 165 ns with NiOx and it was
further reduced to 157 ns with the additional organic HTM on NiOx. The
shortened lifetime could be a proof of improved carrier extraction at the
interface with the passivation. For calculating those lifetimes, the sam-
ples were excited using a picosecond diode laser (510 nm wavelength)
from the perovskite-side, and their carrier lifetimes (τavg) were calcu-
lated by fitting their decay curves to a bi-exponential equation: τavg = A1
2.3. Reduced trap-density at the interface between perovskite and HTL
The trap-density of the perovskite can be calculated by estimating
the trap-filled limited voltages (VTFL) of dark J-V curves of hole-only
devices (ITO/NiOx/organic HTM/perovskite/spiro-OMeTAD/Au) with
the following equation (1) [59,60].
Ntrap = 2εεoVTFL(eL2)ꢀ 1
(1)
where e is elementary charge, εεo is semiconductor permittivity, and L is
the layer thickness. Fig. 5a and Table S5 confirmed that the calculated
static trap-density of the perovskite film was reduced after passivation
exp(-t/τ1) + A2 exp(-t/τ2), where τ1, τ2, A1, and A2 were lifetimes for
slow and fast decay, and their relative amplitudes, respectively
(Table S4) [57].
from 1.18 × 1016 to 0.88 × 1016 cmꢀ 3. The hole-mobility (
μ) was also
obtained by fitting the curves in space-charge-limited-current (SCLC)
regime with the Mott-Gurney law (2) [61].
2.2. Perovskite solar cell performances
J = 9εεoμV2(8L3)ꢀ 1
(2)
The enhanced interfacial properties between perovskite and HTL
with the addition of organic HTM are expected to improve the perfor-
mances and stability of PV devices. To confirm this, we prepared p-i-n
architecture PSC devices with the following structure, ITO/NiOx/
The calculated hole-mobility was enhanced from 1.2 × 10ꢀ 3 to 3.0 ×
10ꢀ 3 cm2 Vꢀ 1 sꢀ 1 with the organic passivation layer (Table S5), indi-
cating that the reduced trap density was beneficial to the efficient charge
transport.
organic
HTM/perovskite[Cs0.04(FA0.92MA0.08 0.96
)
Pb(I0.92Br0.08)3]/
The decreased trap-states are also advantageous to suppress the non-
radiative recombination of photo-generated carrier in the photo-
absorbing layer, consequently increasing its quasi-Fermi level
fullerene(C60)/2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline(BCP)/
silver(Ag) (inset of Fig. 3a), and their current density-voltage (J-V)
Fig. 2. (a) Steady-state photoluminescence (PL) spectra of perovskite films (perovskite, NiOx/perovskite, and NiOx/organic/perovskite). (b) Time-resolved PL (TRPL)
decay curves of perovskite films (perovskite, NiOx/perovskite, and NiOx/organic/perovskite).
3