Effects of O2 on the Reduction of NO Prereduced CaO
J. Phys. Chem. B, Vol. 103, No. 12, 1999 2199
3.4. Kinetics. Equations relating Arrhenius kinetic parameters
A and Ea (preexponential factor and apparent activation energy,
respectively), surface coverage θ, and linear heating rate (â)
have been reviewed by Lord and Kittelberger.26 It was shown
that the slope of a plot of ln(Tm2 θmn-1/â) versus 1/Tm reproduces
the apparent activation energy for desorption by multiplying it
with the gas constant R. Tm represents the temperature of
maximum desorption, θm the peak coverage, and n the order of
the desorption reaction. In the present work, n will be taken as
one. This simplifies the plot to ln(Tm2/â) versus 1/Tm. Calcula-
tions have shown that the assumption of a reaction order of 1
does not introduce major errors in the activation energy.26 The
activation energy for reduction of NO in the high-temperature
channel is determined by exposing a reduced CaO surface to
NO (2500 ppm) during a heating ramp between room temper-
ature and 900 °C, while measuring the formation of N2.
Repeating this for different heating rates (â) results in an
activation energy for the reduction of NO to N2 of about 25
kcal/mol.
The effect of lattice parameter on the hole hopping mecha-
nism for charge transport is illustrated semiquantitatively by
employing a regularized Hartree-Fock method.24,25 The activa-
tion energies are taken to be reflected in the relative stabilities
of the symmetry broken odd-electron system O--Ca2+-O2-
embedded cluster16,19 and the symmetric system, which delo-
calizes the hole over the two oxygen ions. Activation energies
in the range 20-32 kcal/mol are obtained by simply varying
the lattice constant in the range of the alkaline earth oxide series
from MgO to BaO. The activation energy for holes hopping in
CaO is determined to be 26.2 kcal/mol. It is gratifying to note
the semiquantitative agreement with the apparent activation
energies for NO reduction on these substrates.12 This was
expected on the basis of experience with similar systems.14-16
The main sources of error are due to the rigid cluster ansatz,
the assumption that nearest-neighbor interactions in an external
electrostatic potential determines the charge carrier properties
of the alkaline earth oxides, use of an effective electron
correlation description, and neglect of dispersion interactions.
The potential for such a model in explaining experimental
observations relies on the cancellation of errors. In this respect
the objective to seek the possible origin for a trend in an
activation energy is ideal. This is why the somewhat fortuitous
agreements between experiment and theory, regarding both trend
and magnitudes, can be taken to support the existence of a hole
transport controlled reaction channel for doped alkaline earth
oxides.
A semiconductor model based on an apparent activation
energy of 25 kcal/mol for hole transport cannot explain the
reduction of NO at room temperature since for the reduction of
NO at these temperatures a much lower activation energy is
expected. Figure 1 shows the transient formation of N2 and N2O
during exposure of the CaO surface to NO at room temperature.
A significant difference is observed in the reduction of NO with
and without an intermediate O2 exposure, i.e., a reduced NO
reduction capacity and a disappearance of the N2 formation.
Increasing the O2 exposure time results in a further decrease of
the N2O formation. The activity at these low temperatures is
complicated and can best be explained by a combination of two
reaction channels of which only one involves extra electrons.
These extra electrons must be easy to access, which makes
electrons localized in F-centers possible candidates. The nature
of these has been extensively reviewed in the literature.21,27-29
An intermediate room-temperature exposure to O2 would
stabilize the electrons of the F-center by forming peroxides and/
or superoxides. These sites, involved in a reaction channel
accessible at low temperatures and referred to as the “low-
temperature sites”, are thus expected to be eliminated by an
exposure of the substrate to O2. Left is then the activity observed
after the intermediate exposure to O2. At this stage there are no
electrons localized in F centers available and the activation
energy for hole transport is too high to have a significant
participation. A third reaction channel which does not involve
transport of holes and/or F centers and of which the effectiveness
decreases with increasing O2 exposure time is therefore needed.
Such a reaction channel has been proposed by Platero et al.30
and Cerruti et al.31 for MgO surfaces, based on infrared
spectroscopy studies:
4. Discussion
The effect of O2 on the reduction of NO over prereduced
CaO surfaces is investigated and the resistance toward poisoning
by O2 is shown to depend on the set up of the experiments, i.e.,
sequential (Figures 1-7) or simultaneous (Figures 8 and 9)
exposure to O2 and NO. The role of a prereduction has been
discussed before11,12 and results in a surface oxygen abstraction,
depositing the electrons of the abstracted oxygen ion in the
substrate. The fate of these electrons is not clear, and two models
are under consideration. One is based on a semiconductor model
using impurity states in the band gap as electron acceptors,
whereas in the other model the excess electrons are localized
in F-centers. An activation energy for the oxygen abstraction
step of about 25 kcal/mol was found.11
A common feature in the results of the sequential room-
temperature exposure to O2 and NO is that some sites are
inaccessible until elevated temperatures (Figure 3). For heating
ramps in NO (Figure 7), a maximum reduction is observed at
about 760 °C (heating rate of 0.5 K/s). Thus, even in the
presence of an oxidant (NO), the reduced CaO is not fully
oxidized until elevated temperatures. The sites involved in the
high-temperature reduction of NO will be referred to as the
“high-temperature sites” and a reaction channel based on an
activated hole transport is proposed to explain their activities.
This understanding results from three independent observations,
i.e., (i) an apparent activation energy of 25 kcal/mol for the
surface oxygen abstraction,11 (ii) an apparent activation energy
of 25 kcal/mol for formation of N2 under heating ramps in NO
(results presented in this paper), and (iii) a maximum apparent
activation energy of 10 kcal/mol for the breaking of a NO bond
in the presence of excess electrons.11 These experimental results
indicate that the transport of holes might be the rate-determining
step, i.e., a transport of holes from the O- species to the surface
during the oxygen abstraction step and back during the
reoxidation.
This understanding would explain the correlation between
apparent activation energy for the reduction of NO by H2 and
the lattice parameter of the respective alkaline earth oxides. In
previous work,12 an increase in apparent activation energy with
lattice parameter, and thus with increasing ionic radii of the
alkaline earth cation, was found. This is in full agreement with
the mechanism presented here. An increased lattice constant
results in a decreased overlap between the oxygen orbitals and
consequently in hole localization and thus in increasing the
apparent activation energy for hole transport.
4NO + 2O2- w 2NO2- + N2O2
(R1)
(R2)
2-
N2O22- w N2O + O2-
It is gratifying to notice that even in the absence of a surface
oxygen abstraction step the reaction mechanism, as proposed