D476
Journal of The Electrochemical Society, 154 ͑9͒ D473-D481 ͑2007͒
Scharifker et al.21,22 The initial sudden change is associated with the
charge of the double layer; immediately after, the increase of the
current indicates the increase in the electroactive area due to the
growth and increment of independent nuclei and/or the hemispheri-
cal diffusion. In this growing step of the deposit, the nuclei develop
diffusion zones adjacent to them. As the diffusion zones overlap, the
hemispheric mass transfer changes to a linear mass transfer, causing
the current to diminish and the current transient to approximate lin-
ear diffusion.21
Quantitative analysis of the current transients allows the estima-
tion of the nucleation parameters, which are indicative of the copper
deposition mechanism on GC, in terms of the nucleation rate and the
number of saturated and initially available nuclei, as a function of
the applied potential. In the case of the copper analysis,21 the current
of the global process ͑IT͒ obtained during the reduction process has
been described, considering the existence of only two processes: the
double-layer discharge and the 3D nucleation-growth contribution,
as shown in Eq. 2
Cu+ + e− → Cu0
͓6͔
When the nucleation and growth of the copper clusters is not suffi-
ciently fast, it would be reasonable to assume that Reaction 5 may
lead to accumulation of Cu+ at the electrode surface. Reaction 5 is
limited by diffusion, because Cu2+ needs to diffuse to the interface
where it can be reduced. Nevertheless, the charge transfer could also
be a limiting step for the global process ͑Cu2+/Cu+/Cu0͒, because
the step Cu+ to Cu0 ͑Reaction 6͒ is controlled by charge transfer.
Thus, it is hard to ascertain which of the two processes controls the
global process; moreover, the charge transfer will depend on the
potential pulse applied to the electrode. Because a broad potential
range was considered in the chronoamperometric study, it is perhaps
more correct to assume that the global process ͑Cu2+/Cu+/Cu0͒
takes place under conditions of mixed charge transfer and diffusion
limitations, as proposed by Milchev and Zapryanova.25
The current associated with Reaction 5 can be described by a
Marcus-type electron-transfer reaction ͑Eq. 7͒, assuming that reduc-
ing species is relatively unstable and could react back to oxidant
IT = Idl + I3D-dc
͓2͔
Iet = aR exp͑− bRt͒
͓7͔
The explanation of Eq. 2 with respect to each one of the contri-
butions is as follows: At the initial stage of the copper deposition,
the transient presents a sharp decline in current. According to the
literature,23 this effect is related to the electrode double layer ͑dl͒
charging, initiated by the potential pulse employed. A quantitative
characterization has been performed by Hölzle and co-workers23
showing that the charging effect can be correlated to the adsorption-
desorption process of ions on the surface electrode. To quantitatively
estimate the dl charge contribution ͑Idl͒ in the potential step, the
approach of Hölzle23 was employed, which considers that the con-
tribution in the current transient is based on a Langmuir-type ion
adsorption-desorption equilibrium.24 Idl and kads can be related to the
total charge of the adsorption process Qads by the relation in Eq. 3
where aR and bR are parameters associated with the electron-transfer
reaction, which depend on potential as proposed by Milchev and
Zapryanova.25 Furthermore, in the present case, the area of the me-
tallic copper changes with time due to the electrocrystallization pro-
cess; thus, Eq. 7 varies with both time and potential pulse. A more
detailed description of these equations has been described before by
Milchev and Zapryanova.25
Analysis of the current transients for the SO24Ϫ and ClO4Ϫ solu-
tions
.— The current of the global process ͑IT͒ obtained during the
Cu2+ reduction process on the GC electrode in the SO42− and ClO−4
media can be obtained from the contributions due to electron trans-
fer, the 3D-dc nucleation-growth process, and the double-layer dis-
charge ͑Eq. 8͒
Idl = kads exp͑− kdest͒
͓3͔
where kads = kdesQads
.
IT = Idl + I3D-dc + Iet
͓8͔
The nucleation and growth processes of the copper nuclei can be
explained by the theoretical approach developed by Scharifker and
Mostany22 where it is not necessary to classify the mechanism of
nucleation growth. The current associated with the contribution of
the reduction process ͑3D-dc͒ is then given by
The detailed Eq. 8 was programmed in Mathematica software,
where through a nonlinear least-squares fit and employing the cur-
rent transients experimental data; the best-fit parameters were ob-
tained. The simulation procedure comprises topics involving an in-
depth statistical study beyond the scope of this work. However, the
values of the parameters obtained with the simulation process are
consistent with those reported in the literature17,18 and in accordance
with their physical meaning. This aspect was considered important
in the present analysis, because different models were used to fit the
current transients ͑not shown͒, and despite the good fit, lead to un-
realistic values of the nucleation and kinetic parameters. Tables I
and II show the best-fit parameters as a function of the potential in
zFD1/2
C
1 − exp͑− At͒
I3D-dc͑t͒ =
1 − exp − N kD t −
0
ͩ
ͪ
͓4͔
ͫ
ͬ
ͭ
ͮ
1/2t1/2
A
with = 1 − exp͑−N0kD͕t − ͓1 − exp͑−At͔͒/A͖͒, where z is the
number of the electrons exchanged, F is the Faraday constant, C is
the concentration of the metallic ion in the bulk solution, N0 is the
number of active nucleation sites, A is the nucleation rate, is the
surface coverage by the formed nuclei, k = ͑8C/͒1/2, and is the
density of the deposit.
ClO−4 and SO24−
.
In all cases a typical behavior is obtained for the nucleation rate
constant ͑A͒ and the active nucleation sites number ͑N0͒, increasing
as the potential is more negative. A comparison between these baths,
approximately at the same potential, shows the SO24− medium has
the lower value of A. For the N0 values, the ClO−4 ion displays a
lower number of active sites ͑one order of magnitude͒ in comparison
In noncomplexing media, it is generally accepted that the Cu2+
reduction occurs in a global step via two electrons, because the time
for the existence of Cu+ is very short, not detectable by CV tech-
niques. However, the contribution of the Cu2+/Cu+ step to the total
current has been recognized for many years through the use of ac
techniques such as electrochemical impedance spectroscopy.2,11,12
Therefore, the reduction step Cu2+/Cu+ has been found to affect the
nucleation and growth process, and consequently, the shape of the
current transients. Milchev and Zapryanova25 have reported for cop-
per solutions with sulfates that an electron-transfer reaction takes
place ͑Cu2+/Cu+͒ before and simultaneously with the nuclei forma-
tion process. This consideration has been successfully proven in
copper electrodeposition from ammoniacal solutions.26 Therefore,
the reduction process can be considered to take place in the follow-
ing manner
with the SO24−
.
Figure 7a and b shows the comparison of the experimental cur-
rent transients with those built using Eq. 8 and the values obtained
from the fitting process ͑Table II͒, in the case of the SO24− acid bath,
at potentials of 0.08 and −0.04 V, respectively. Considering that
these transients represent a cumulative change in the electrode cur-
rent during the nucleation process, constructed with different contri-
butions, the plot in Fig. 7 takes into account the following phenom-
ena: ͑a͒ the double-layer charge ͑Idl͒, ͑b͒ the discharge of the Cu2+
ions ͑Iet͒, and ͑c͒ the nucleation-growth process ͑I3D-dc͒. The addi-
tion of these contributions results in a single theoretical transient
with characteristics close to the experimental transient, involving all
Cu2+ + e− → Cu+
͓5͔
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