X. Liu et al. / Journal of Alloys and Compounds 651 (2015) 135e142
137
decomposition stages, corresponding to dehydration at about
Where D is the size of the crystallites, k ¼ 0.89,
l
¼ 0.154 nm, h(1/
150e200 ꢀC, pyrolysis of ligand at about 260e300 ꢀC and finally
leaving the oxide under 500 ꢀC. In order to ensure that each pre-
cursor was completely decomposed, the temperature for annealing
was 500 ꢀC.
2) ¼ peak width at half-height of strongest peak and
q corresponds
to the peak position. The size of samples is shown in Table 1. From
Table 1, the peak width at half-height of strongest peak is broader,
and the particle diameter is reduced with the increase of yttrium
dopant. It indicates the doping of Y3þ can inhibit growth of the
Bi2O3 particles.
3.2. Structural characterization
Table 2 shows the specific surface areas of all samples. It can be
seen the specific surface areas of Y5, Y10 and Y15 are obviously
larger than Y0 and Y1. The highest specific surface area is obtained
when Y doping molar ratio is 10%, then the specific surface area
drops at 15%. It is suggested that a low content of yttrium can in-
crease specific surface area of photocatalyst, while a large amount
of yttrium may lead to a drop in the specific surface area due to the
reunion of particles. A high specific surface area can provide more
reactive adsorption/desorption sites for photocatalytic reaction,
which is favorable for the enhancement of photocatalytic
performance.
The FE-SEM images of samples are shown in Fig. 3(a)e(f). It is
observed that all samples are irregular and large cluster.
The particle size of pure Bi2O3 and Y1 are larger obviously
than the other samples. And the Y5, Y10, Y15 are uniform
and disperse relatively, which is consistent with the observation
from XRD patterns and specific surface areas. The EDX
technique is used for confirming purity of the samples and
presence of the elements in the samples and the results are
shown in Fig. 4. For pure Bi2O3, the peaks are clearly related to O
and Bi elements. In the case of Y-doped Bi2O3 samples, the peaks
correspond to O, Bi and Y elements. Other peaks in the figure are
related to the elements applied for sputter coating of the samples
on the EDX stage. The EDX data of samples are also listed in Table
3. It can be observed that there is an increase in the Y content
indeed.
XRD patterns of different molar ratios of Bi2O3 doped with
yttrium are shown in Fig. 2. It can be seen that the diffraction peaks
of prepared samples were relatively sharp, which suggests all
samples were with high crystallinity. The number of diffraction
peaks gradually reduced with the increase of yttrium concentra-
tion. The main 2q peaks of Y0 and Y1 observed in the XRD patterns
at 25.75ꢀ, 26.91ꢀ, 27.38ꢀ, 28.01ꢀ, 33.254ꢀ and 46.32ꢀ are consistent
with monoclinic Bi2O3 (0 0 2), (111), (ꢁ1 2 1), (0 1 2), (2 0 0) and (2
2 1) lattice planes, which can be indexed to a-phase Bi2O3 (JCPDS
71-2274). And the main 2q peaks of Y5 and Y10 observed in the XRD
patterns at 27.97ꢀ, 31.77ꢀ, 32.72ꢀ, 46.26ꢀ, 54.26ꢀ and 55.52ꢀ are
consistent with tetragonal Bi2O3 (2 0 1), (0 0 2), (2 2 0), (2 2 2), (2
0 3) and (4 2 1) lattice planes, which can be indexed to
b
-phase
Bi2O3 (JCPDS 27-0050). Moreover, the main 2
q peaks of Y15
observed in the XRD pattern at 27.945ꢀ, 32.42ꢀ, 46.49ꢀ, 55.12ꢀ,
74.77ꢀ and 77.37ꢀ are consistent with cubic Bi2O3 (111), (2 0 0), (2 2
0), (3 11), (3 3 1) and (4 2 0) lattice planes, which can be indexed to
d-phase Bi2O3 (JCPDS 27-0052). No crystalline Y2O3 phase was
observed in all samples, the reason may contain two aspects. On the
one hand, the yttrium content is below the detection limit of XRD
instrument. On the other hand, it is assumed that the metal ions
were either interacted with the framework of Bi2O3 because of little
radius of Y3þ [d(Y3þ) ¼ 0.09 nm, d(Bi3þ) ¼ 0.103 nm] or dispersed
on the surface of Bi2O3 in an amorphous form. As known, the low-
temperature
while - and
would be easily transformed to
a
g
-Bi2O3 and the high-temperature
-Bi2O3 phases are high-temperature metastable and
-phase as the temperature cooled
d-Bi2O3 are stable,
b
3.3. UVevis DRS analysis
a
to room temperature, and all kinds of phases can be transformed
with the change of temperature, shown in Scheme 1. However, XRD
UVevis DRS of as-prepared samples are shown in Fig. 5. It can be
seen that all samples exhibit broad and strong absorption in the
region of 200e400 nm. At the same time, the absorption onset of Y-
doped Bi2O3 in the visible light range was larger red-shifts than that
of pure Bi2O3. The red-shifts could be attributed to the charge-
transfer transition between the d electrons of Y3þ and the con-
duction or valence band of Bi2O3. A larger red-shift might indicate
that the catalyst absorbs more photons and the photocatalytic ac-
tivity could be enhanced. The absorption edge was extend to longer
wavelength with increasing yttrium content and the direct band
results showed Y5 and Y10 were
b-phase. It indicates the incor-
poration of an appropriate concentration of yttrium dopant may
restrict the phase transition from
cooling after annealing.
b-phase to a-phase during the
The as-products size from the broadening of peaks was esti-
mated by the Scherrer's equation:
D ¼ kl=hð1=2Þcos q
(2)
gap of Eg was estimated according to the formula Eg ¼ 1240/
l,
shown in Table 4. The wavelength at the absorption edge, , was
l
determined as the intercept on the wavelength axis for a tangential
line drawn on the absorption spectra. From Table 4, the Eg of Y-
doped Bi2O3 were lower than that of pure Bi2O3, indicating that Y-
doped Bi2O3 has a potential ability for photocatalysis under visible
light irradiation.
3.4. PL analysis
It is well known that the photoluminescence (PL) spectra signals
of semiconductor materials result from the recombination of pho-
togenerated electronehole pairs. Generally, the lower PL intensity
suggested the lower the recombination rate of photogenerated
electronehole pairs, which leads to the higher photovoltaic effi-
ciency of the semiconductor materials [48]. Fig. 6 shows PL spectra
of samples with the excitation wavelength of 365 nm to investigate
the efficiency of charge carrier trapping, immigration, transferring,
and the fate of photogenerated electronehole pairs. It can be
Fig. 2. XRD patterns of Y-doped Bi2O3.