972
S.K. Arora et al. / Journal of Physics and Chemistry of Solids 65 (2004) 965–973
Table 2
also been calculated using the formula,
Some other electrical parameters obtained from the experimental data
1
ne ¼
ð19Þ
Parameters
Values
RHe
EF
and all these values are recorded in Table 2.
(100) plane
(010) plane
0.685 eV
0.695 eV
A
4. Conclusions
(100) plane
3.09
(010) plane
3.08
† The d.c. conductivity of strontium tartrate occurs
between the normal conductivities of semiconductor
and insulator.
me*
Nd
r
1.339 £ 10237 kg
1.529 £ 1015 m23
4.225 £ 105 V cm
28.6338 £ 1026 cm2/(volt·s)
2364.62 m3/coulomb
1.714 £ 1010 cm23
mH
RH
ne
† The obtained value of the exponent ðs ¼ 0:72Þ charac-
terises Efros hopping conduction mechanism in our
crystals.
† The activation energy required to move permanent
intrinsic defects in the crystal lattice is equal to 0.50 eV.
† The charged carriers responsible for electrical conduc-
tion in the lower temperature region (,363 K) are
electrons, while in the higher temperature region
(.363 K) are protons.
† The thermal anomaly found in the gel-grown crystals of
strontium tartrate is in excellent agreement with the
observed conductivity anomaly.
a straight line is expected. This is what has been observed
(Fig. 6). Using the slope and the intercept of the line, the
values of EF and A have both been determined. These values
obtained for (100) and (010) habit planes of crystal are given
in Table 2. Using the value A < 3; the scattering parameter
is obtained exactly as s ¼ 21=2; it is to be associated with
lattice scattering. The fact that EF is fairly constant also
implies that the carrier concentration ðneÞ is not changing
with the temperature. Therefore, Eq. (13) can be expressed
as [39],
References
ꢀ
ꢁꢂ
ꢀ
ꢁꢃ
k
e
Nd
ne
S ¼ 2
A þ ln
;
ð15Þ
[1] K. Singh, Solid State Ionics 66 (1993) 5.
[2] R.G. Liu, W.L. Worrell, Solid State Ionics 18–19 (1986) 524.
[3] A.W. Al-Kassab, B.D. James, J. Liesegang, J. Phys. Chem. Solids 54
(1993) 439.
where Nd is the effective density of states, given by
ꢂ
ꢃ
3=2
2pmpekT
[4] H. Sharma, K. Kumari, L.S. Singh, R.N.P. Choudhary, Bull. Mater.
Sci. 25 (2002) 133.
Nd ¼ 2
;
ð16Þ
h2
[5] T. Kar, R.N.P. Choudhary, J. Phys. Chem. Solids 60 (1999) 673.
¨
[6] H. Bottger, V.V. Bryskin, Hopping Conduction in Solids, Akademie-
and ne ¼ 1:714 £ 1016 m23 is the carrier concentration as
obtained from the Hall Effect measurements (described in
Section 3.3). Using S ¼ 25:036 £ 1025V=K at T ¼ 316 K,
h ¼ 6:626 £ 10234 Js and k ¼ 1:381 £ 10223 J/K, the
computed values of mep and Nd are also given in Table 2.
Verlag, Berlin, 1985.
[7] T.R. Trivedi, A.T. Oza, V.A. Patel, S.K. Arora, Cryst. Res. Technol.
35 (2000) 615.
[8] Md. Shareefuddin, U.V. Subba Rao, K.N. Reddy, M.N. Chary, Cryst.
Res. Technol. 25 (1990) K278.
[9] S.M.D. Rao, P.M. Rao, Cryst. Res. Technol. 24 (1989) 693.
[10] S.S. Ata-Allah, Phys. Stat. Sol. (a) 177 (2000) 251.
[11] S.D. Druger, M.A. Ratner, A. Nitzan, Phys. Rev. B31 (1985) 3939.
3.3. Hall coefficient
´ ´
[12] M.E. Torres, T. Lopez, J. Peraza, J. Stockel, A.C. Yanes, C. Gonzalez-
´
Silgo, C. Ruiz-Perez, P.A. Lorenzo-Luis, J. Appl. Phys. 84 (1998)
The value of r obtained from the van der Pauw technique
is recorded in Table 2. In the range of applied magnetic field
0.27–13.65 Kgauss, we found out DR=DB ¼ 271.4948 V/
gauss from the slope of R versus B plot. So, the Hall
mobility of carriers and Hall coefficient are calculated as:
5729.
´ ´
[13] M. Torres, T. Lopez, J. Stockel, X. Solans, M. Garcia-Valles, E.
´ ´
Rodriguez-Castellon, C. Gonzalez-Silgo, J. Solid State Chem. 163
(2002) 491.
[14] H.K. Henisch, Crystal Growth in Gels, Pennsylvania State University
Press, USA, 1973.
mH ¼ ðt=rÞðDR=DBÞ:
RH ¼ mHr
ð17Þ
ð18Þ
[15] G. de Mey, Electr. Commun. 28 (1973) 309.
¨
[16] H. Bottger, V.V. Bryksin, Phys. Stat. Sol. (b) 78 (1973) 9.
[17] W. Taylor, D.J. Lockwood, H.J. Labbe, J. Phys.-C, Solid State Phys.
17 (3) (1984) 685.
The negative sign of RH; in consonance with Seebeck
coefficient data (Section 3.2), confirms that strontium
tartrate is an n-type material. It is implied, therefore, that
the conduction may be predominantly contributed by the
tartrate ions. The effective charge carrier concentration has
[18] K.D. Kreuer, A. Rabenau, W. Weppner, Angew. Chem. Int. Ed. Engl.
21 (1982) 208.
[19] A. Clearfield, Chem. Rev. 88 (1988) 125.
[20] V.M. Gurevich, Electric Conductivity of Ferroelectrics, Moscow,
1960.