3
8
K.-i. Shimizu et al. / Applied Catalysis A: General 417–418 (2012) 37–42
Table 1
Table 2
List of catalysts.
Curve-fitting analysis of Pt L3-edge in situ EXAFS.
S/Pt (precursor)a
S/Pt (ICP)b
Tcal/ Cc
◦
D/nmd
Na
R/Åb
ꢀ/Åc
Rf/%d
Catalysts
Sample
Shell
Pt/SiO2-550
Pt/SiO2-600
SPt/SiO2-0.10
SPt/SiO2-0.13
0
0
1
5
–
–
0.10
0.13
550
600
–
3.3 ± 1.5
6.8 ± 3.0
5.2 ± 2.4
5.5 ± 3.2
SPt/SiO2-0.13
Pt/SiO2-550
Pt
Pt
9.6
10.6
2.74
2.75
0.088
0.083
2.6
0.9
a
Coordination numbers.
Bond distance.
Debye–Waller factor.
Residual factor.
–
b
c
a
S/Pt molar ratio in the catalyst precursors prepared by impregnation of
NH4)2SO4 to Pt/SiO2.
d
(
b
S/Pt molar ratio in the catalysts after calcination and H2-reduction of the pre-
cursors.
c
Temperatures of calcination.
Average particle size of Pt estimated by TEM.
In a typical catalytic test, SPt/SiO -0.13 (1 mol% Pt with respect
to aniline) was added to the mixture of aniline (1.0 mmol), di-iso-
propylamine (2.0 mmol) and o-xylene (2 mL) in a reaction vessel
2
d
equipped with a condenser and N was filled. The resulting mixture
2
GCMS-QP5000) analyses were carried out with a Rtx-65 capillary
column (Shimadzu) using nitrogen as the carrier gas.
was vigorously stirred under reflux condition (heating tempera-
◦
ture = 155 C) for 4 h. Products were identified with GC–MS and
SiO -supported Pt (Pt/SiO2 with Pt loading of 5 wt%) was pre-
2
1
H NMR [29]. Conversion of aniline and yields of products were
2
−1
pared by impregnating SiO2 (Q-10, 300 m g , supplied from
Fuji Silysia Chemical Ltd.) with an aqueous HNO3 solution of
determined by GC using n-dodecane as an internal standard.
Pt(NH ) (NO ) (Tanaka Kikinzoku), followed by evaporation to
3
2
3 2
◦
◦
dryness at 80 C, drying at 120 C for 12 h, calcination in air at
3. Results and discussion
◦
◦
5
00 C, and reduction in a flow of 100% H2 at 550 C for 10 min.
This sample is named Pt/SiO -550. The sample named Pt/SiO -600
3.1. Characterization
2
2
◦
was prepared by the similar method and reduced in H at 600 C for
2
1
0 min. Sulfur-loaded Pt/SiO2 catalysts were prepared by impreg-
Pt/SiO -550 (as a precursor of S-loaded catalysts), Pt/SiO -600,
2
2
nating Pt/SiO -550 with aqueous solution of (NH ) SO , followed
and SPt/SiO -x (x = 0.1, 0.13) were characterized by various spec-
2
4
2
4
2
◦
◦
by evaporation to dryness at 80 C, drying at 120 C for 12 h, and
troscopic methods. The S/Pt ratio of the catalyst was determined
by ICP analysis as listed in Table 1. XRD pattern of these samples
showed lines due to Pt metal. TEM measurements of these sam-
ples were carried out, and the particle size analysis was conducted
on 98–124 particles. The size distribution of Pt/SiO2 samples and
◦
reduction in a flow of 100% H at 500 C for 10 min. Table 1 includes
2
the relative amount of (NH ) SO in the solution to that of Pt atoms
4
2
4
in Pt/SiO and the S/Pt ratio of the catalyst after the H -reduction
2
2
◦
at 500 C determined by ICP analysis. The catalysts are designated
as SPt/SiO -x, where x is the S/Pt ratio. SPt/SiO -0.13 is used as a
SPt/SiO -0.13 are illustrated in Fig. 1. As listed in Table 1, the aver-
2
2
2
standard catalyst.
age particle size of SPt/SiO -x (x = 0.1, 0.13) and Pt/SiO -600 are
2
2
XRD patterns of the powdered catalysts were recorded with a
Rigaku MiniFlex II/AP diffractometer with Cu K␣ radiation. Trans-
mission electron microscopy (TEM) measurements were carried
out using a JEOL JEM-2100F TEM operated at 200 kV.
in a range 5.2–6.8 nm. Pt/SiO -550 has a relatively smaller Pt size
2
(3.3 nm).
3
Fig. 2A shows k -weighted in situ extended X-ray absorption
fine structure (EXAFS) data of SPt/SiO -0.13 acquired at room tem-
2
◦
In situ IR spectra were recorded at room temperature on a JASCO
FT/IR-620 equipped with a quartz IR cell connected to a conven-
tional flow reaction system. Samples were pressed into a 22 mg
of self-supporting wafer and mounted into the quartz IR cell with
CaF2 windows, and the spectrum was measured at room temper-
perature in a flow of He after H -reduction at 200 C. The Pt–Pt
2
coordination number and the distance are determined by curve-
fitting analysis and are listed in Table 2. The EXAFS consists of a
Pt–Pt contribution with coordination number of 9.6 at bond dis-
tance of 2.74 A˚ . These values are not markedly different from those
−
1
ature in He flow accumulating 15 scans at a resolution of 4 cm
.
of Pt/SiO -550: Pt–Pt coordination number of 10.6 at bond dis-
2
For the CO adsorption IR experiments, a reference spectrum of the
catalyst wafer in He was subtracted from each spectrum. Prior to
tance of 2.75 A˚ . This indicates that the presence of sulfur species on
Pt/SiO does not change the bulk structure of metallic Pt. The EXAFS
2
each experiment the catalyst disk was heated in H (2%)/He flow
result showed no Pt–S bond in the SPt/SiO -0.13 sample. In the IR
2
2
3
−1
◦
(
100 cm min ) at 500 C for 10 min, followed by cooling to room
spectrum of the unreduced precursor, (NH ) SO -loaded Pt/SiO -
4 2 4 2
−
1
temperature under He flow. Then, the catalyst was exposed to a
flow of CO(0.9%)/He for 180 s.
550 with S/Pt ratio of 5, a band due to sulfate species (1420 cm
was observed (result not shown). This band was not observed for
the H -reduced sample, SPt/SiO -0.13. Taking into account the fact
)
Pt L -edge in situ XAFS measurement was carried out at BL01B1
3
2
2
of SPring-8 (Hyogo, Japan). The storage ring energy was operated
at 8 GeV with a typical current of 100 mA. A self-supported wafer
form (pressed pellet) of the pre-reduced Pt catalyst with 10 mm
that the catalyst exhibits the S/Pt ratio of 0.13 (ICP result in Table 1),
it is reasonable to assume that sulfidic sulfur species are present on
the catalyst and some of them may present on the surface of Pt.
As shown in Table 2, the coordination number for the Pt–Pt
bond in Pt/SiO -550 (10.6) was larger than that of SPt/SiO -0.13
diameter was placed in a quartz in situ cell in a flow of 100% H
2
3
−1
◦
(
100 cm min ) for 30 min at 200 C under atmospheric pressure,
2
2
◦
and the sample was cooled to 40 C under a flow of He, then the
spectra were recorded in situ. The analyses of the extended X-ray
absorption fine structure (EXAFS) and X-ray absorption near-edge
structures (XANES) were performed using the REX version 2.5 pro-
(9.6). On the other hand, the Pt particle size of Pt/SiO -550 (3.3 nm)
2
was smaller than that of SPt/SiO -0.13 (5.2 nm). Assuming that the
2
shape of Pt particle does not depend on the presence of sulfur, it is
likely that EXAFS data is not consistent with the average size of Pt
particles measured by TEM. This inconsistency might be explained
3
gram (RIGAKU). The Fourier transformation of the k -weighted
EXAFS from k space to R space was carried out over the k range
as follows. Some of the sulfur species in SPt/SiO -0.13 interact
strongly with Pt surface, which results in an increased disorder in
the local structure of the Pt metals.
2
−
1
3
–15 A˚
to obtain a radial distribution function. The inversely
Fourier filtered data (in the R range of 1.5–3.3 A˚ ) were analyzed with
−
1
a usual curve fitting method in the k range of 3.3–14.7 A˚ using the
Fig. 2B shows in situ X-ray absorption near-edge structures
empirical phase shift and amplitude functions for Pt–Pt and Pt–O
(XANES) for SPt/SiO -0.13. It is clear that the XANES spectrum
2
shells extracted from the data for Pt foil and PtO , respectively.
of SPt/SiO -0.13 is nearly identical to that of Pt/SiO -550, which
2
2
2