Chemistry of Materials
Article
corresponding fwhm parameters. The transistor behavior of P2,
P3, and isomerized P2 (solution, solid state) showed lower off-
currents for the latter ones. This phenomenon was explained by
the higher order and smaller spacings of the layer structures
which reduced the charge trapping through midgap states
presented at the interlayer boundaries. The hole mobilities,
however, were in the same range of 0.3−0.6 cm V s . This
finding suggested the conclusion that the interlayer distance is
not as crucial for the charge carrier transport as the molecular
weight. Additionally, the solution-processed isomerization of
P2 led to a decrease in solubility up to 30% in organic solvents
as determined by the UV−vis absorbance after calibration.
Future work could apply the introduction of such stereo-
isomeric alkenes into liquid discotics like hexa-peri-hexabenzo-
coronene to study their influence on the self-assembly behavior.
R. U. A.; Kwon, O. P.; Tapponnier, A.; Rashid, A. N.; Gu
Funct. Mater. 2006, 16, 180.
8) Brown, P. J.; Sirringhaus, H.; Friend, R. H. Synth. Met. 1999, 101,
57.
9) Kang, I.; Yun, H.-J.; Chung, D. S.; Kwon, S.-K.; Kim, Y.-H. J. Am.
Chem. Soc. 2013, 135, 14896.
10) Nielsen, C. B.; Sohn, E.-H.; Cho, D.-J.; Schroeder, B. C.; Smith,
J.; Lee, M.; Anthopoulos, T. D.; Song, K.; McCulloch, I. ACS Appl.
Mater. Interfaces 2013, 5, 1806.
(11) Tsao, H. N.; Cho, D. M.; Park, I.; Hansen, M. R.; Mavrinskiy,
̈
nter, P. Adv.
(
5
(
(
2
−1 −1
A.; Yoon, D. Y.; Graf, R.; Pisula, W.; Spiess, H. W.; Mu
Chem. Soc. 2011, 133, 2605.
12) (a) Duester, G. Eur. J. Biochem. 2000, 267, 4315. (b) Schoenlein,
R.; Peteanu, L.; Mathies, R.; Shank, C. Science 1991, 254, 412.
c) Zimmerman, W. F. Vision Res. 1974, 14, 795. (d) Wood, R.; Lee,
̈
llen, K. J. Am.
(
(
T. J. Chromatogr. A 1983, 254, 237. (e) Weber, F. J.; Isken, S.; de Bont,
J. A. M. Microbiology 1994, 140, 2013.
(
13) Zong, K.; Deininger, J. J.; Reynolds, J. R. Org. Lett. 2013, 15,
1032.
(14) (a) Pisula, W.; Tomovic,
T.; Mullen, K. Chem. Mater. 2005, 17, 4296. (b) Sinha Ray, S.;
ASSOCIATED CONTENT
Supporting Information
Additional information including synthetic procedures and
characterization of materials, decoupled NMR spectra, FT-IR
■
*
S
̌
́
Z.; Simpson, C.; Kastler, M.; Pakula,
̈
Okamoto, M. Prog. Polym. Sci. 2003, 28, 1539. (c) Tashiro, K.; Sasaki,
S. Prog. Polym. Sci. 2003, 28, 451.
(
(
(
15) Moussebois, C.; Dale, J. J. Chem. Soc. C 1966, 260.
16) Gunstone, F. D.; Ismail, I. A. Chem. Phys. Lipids 1967, 1, 264.
17) Balzar, D.; Audebrand, N.; Daymond, M. R.; Fitch, A.; Hewat,
AUTHOR INFORMATION
■
A.; Langford, J. I.; Le Bail, A.; Louer
N.; Popa, N. C.; Stephens, P. W.; Toby, B. H. J. Appl. Crystallogr.
004, 37, 911.
̈
, D.; Masson, O.; McCowan, C.
*
2
*
(18) (a) George, G. M.; Jack, M. B.; Alex, C. M. Organic Field-Effect
Transistors; CRC Press: Boca Raton, FL, 2007; p 341. (b) Henning, S.
Organic Field-Effect Transistors; CRC Press: Boca Raton, FL, 2007; p
Author Contributions
The manuscript was written through contributions of all
authors. All authors have given approval to the final version of
the manuscript.
1
03. (c) Hoichang, Y. Organic Field-Effect Transistors; CRC Press: Boca
Raton, FL, 2007; p 371. (d) Hong, Z.; Michelle, L. S.; Mark, E. R.;
Colin, R.; Abhijit Basu, M.; Stefan, C. B. M.; Zhenan, B.; Jason, L.
Organic Field-Effect Transistors; CRC Press: Boca Raton, FL, 2007; p
Funding
1
59. (e) Michael, G. K. Organic Field-Effect Transistors; CRC Press:
Boca Raton, FL, 2007; p 551.
19) Stangenberg, R.; Saeed, I.; Kuan, S. L.; Baumgarten, M.; Weil,
Notes
The authors declare no competing financial interest.
(
T.; Klapper, M.; Mu
̈
llen, K. Macromol. Rapid Commun. 2014, 35, 152.
ACKNOWLEDGMENTS
■
We gratefully acknowledge the DELTA electron storage ring in
Dortmund for providing synchrotron radiation and technical
support for GIWAXS. The authors thank also Dr. Adam
Kiersnowski for helpful discussion and technical support for
GIWAXS.
REFERENCES
■
(
(
1) Schlu
̈
ter, A. D.; Wegner, G. Acta Polym. 1993, 44, 59.
2) (a) Mei, J.; Bao, Z. Chem. Mater. 2014, 26, 604−615. (b) Lei, T.;
Wang, J.-Y.; Pei, J. Chem. Mater. 2013, 26, 594−603.
3) (a) Facchetti, A. Chem. Mater. 2010, 23, 733. (b) Li, C.; Liu, M.;
Pschirer, N. G.; Baumgarten, M.; Mullen, K. Chem. Rev. 2010, 110,
817. (c) Facchetti, A. Nat. Mater. 2013, 12, 598. (d) Wang, C.; Dong,
(
̈
6
H.; Hu, W.; Liu, Y.; Zhu, D. Chem. Rev. 2011, 112, 2208. (e) Forrest,
S. R.; Thompson, M. E. Chem. Rev. 2007, 107, 923. (f) Zaumseil, J.;
Sirringhaus, H. Chem. Rev. 2007, 107, 1296.
(
4) (a) Mas-Torrent, M.; Rovira, C. Chem. Rev. 2011, 111, 4833.
b) Klauk, H. Chem. Soc. Rev. 2010, 39, 2643.
5) Thompson, B. C.; Frechet, J. M. J. Angew. Chem., Int. Ed. 2008,
7, 58.
6) (a) Feng, X.; Pisula, W.; Kudernac, T.; Wu, D.; Zhi, L.; De
Feyter, S.; Mullen, K. J. Am. Chem. Soc. 2009, 131, 4439. (b) Duran,
H.; Hartmann-Azanza, B.; Steinhart, M.; Gehrig, D.; Laquai, F.; Feng,
X.; Mullen, K.; Butt, H.-J.; Floudas, G. ACS Nano 2012, 6, 9359.
c) Piot, L.; Marchenko, A.; Wu, J.; Mullen, K.; Fichou, D. J. Am.
Chem. Soc. 2005, 127, 16245.
7) (a) Pisula, W.; Kastler, M.; Wasserfallen, D.; Mondeshki, M.;
Piris, J.; Schnell, I.; Mullen, K. Chem. Mater. 2006, 18, 3634. (b) Khan,
(
(
́
4
(
̈
̈
(
̈
(
̈
4
848
dx.doi.org/10.1021/cm5021355 | Chem. Mater. 2014, 26, 4844−4848