Appl. Phys. Lett., Vol. 73, No. 15, 12 October 1998
K u¨ ttel et al.
2115
FIG. 3. I–V measurements on a nanotube film with the inset being the
Fowler–Nordheim representation of the data. Emission starts at 2.5 V/m.
1
0Ϫ8 mbar with a Keithley 237 instrument. The detection
limit was 1 pA at maximum voltage (Ϯ1100 V͒. The emis-
sion current is collected by a highly polished steel sphere of
4
mm diameter, mounted on a linear piezo drive, with a step
size of 1 m and 10 mm travel. The anode is grounded over
a 100 M⍀ ballast resistor. Alternatively, the emission could
be monitored with a phosphorus coated indium tin oxide
FIG. 4. Electron field emission as monitored by a phosphorous screen. ͑a͒ is
taken at 2.5 V/m, ͑b͒ at 3.1 V/m. The size of the image is 1.5ϫ3 cm .
2
͑
ITO͒ glass electrode in order to determine the emission site
The authors are indebted to R. Wessicken at ETH Z u¨ rich
for performing the TEM investigations. Part of this work was
supported by the Swiss National Science Foundation
density. In Fig. 3 we show I–V measurements with the inset
being the Fowler–Nordheim representation of the data. The
emission starts at a field of a 1.5 V/m. Using a work func-
tion of 5 eV one can deduce from the slope of the straight
line in the Fowler–Nordheim representation an aspect ratio
of approx. 800–1000 which is further confirmed by HRSEM.
The mechanism of field emission is clearly governed by the
field enhancement at the apex of the nanotubes. A more rig-
orous investigation of the work function of nanotubes, using
energy resolved field emission, gives a value of 5.3 eV.20 In
Fig. 4 the emission was monitored on a phosphorus screen.
At a field of 2.5 V/m the emission site density is approx.
͑NFP36͒ and the Swiss Priority Program of Materials ͑PPM͒.
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0 /cm and increases to its maximum at roughly 3 V/m
6
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when the whole screen is illuminated, making it even impos-
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In this letter we presented the deposition of nanotube
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CH /H gas mixture under similar conditions than what is
used for the growth of CVD diamond films. The film quality
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8
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17
1
1
2
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0
bach ͑unpublished͒.
In collaboration with CSEM in Neuenburg, Switzerland, Detailed results
21
strate, and are very uniform. These films are very suitable
21
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for applications as cold electron sources. 1
will be published elsewhere.
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