Communications
concentration, the increased acidity, and the presence of
electrolyte anions and residual water in the pore walls of
templates etched with sulfuric acid. Figure 4a shows a TEM
Sample preparation: The templates were prepared according to
[
1,2]
procedures described elsewhere.
For the SnSe and SnO wires, as
2
[
12]
well as for the Sn tubes shown in Figure 1 and Figures 3–5, the
Sn(SePh) was melted on the template surface at a temperature of
4
image of SnO nanowires at low magnification. They typically
2
1
108C. For the SnSe tubes shown in Figure 2, a solution of 5wt%
Sn(SePh)4 in chloroform was applied dropwise onto the template
surface. Subsequently, thermolysis was performed at 3508C, and or
alternatively, SnSe was converted into SnO2 or Sn at 6508C. All
thermolytic reactions and annealing procedures were performed in
corundum crucibles under argon. The templates were selectively
removed either partially or completely by etching with a 20 wt%
aqueous solution of potassium hydroxide at 708C. The resulting
suspension was washed with deionized water several times until it was
neutral.
X-ray diffraction measurements: XRD measurements were
performed with a Philips Xꢀpert MRD diffractometer with a CuKa
radiation source, cradle, and secondary monochromator in a q/2q
geometry. The wires and tubes were aligned within the pores of the
templates. Their long axes were parallel, and the template surface was
perpendicular to the plane defined by the incident beam and the
detector.
Electron microscopy: SEM images of both the completely
released tubes, which were deposited on conductive substrates
(highly doped silicon wafers), and the partially liberated tubes
standing in the matrix of the partially etched templates were obtained
using a field-emission scanning electron microscope JEOL JSM
Figure 4. a) TEM image of single-crystalline SnO nanowires with a
diameter of 25 nm; b) indexed SAED pattern (zone axis [122]) of the
2
marked section of the SnO nanowire seen in (a).
2
have aspect ratios (length over diameter) greater than 100.
The nonuniform contrast of these nanowires is due to bending
[
17]
contours, thickness fringes, and planar defects. An indexed
SAED pattern of part of a section of a single-crystalline SnO2
nanowire (Figure 4a) is depicted in Figure 4b.
6300F at an accelerating voltage of 5kV. For TEM imaging and
A high-resolution TEM micrograph of a selected area of
electron diffraction recording, aqueous suspensions of the nano- and
micro-objects were applied dropwise onto copper grids coated with a
holey carbon film. The samples were investigated in a JEM 1010
microscope operated at 100 kV. High-resolution TEM images shown
in Figure 5were recorded with a high-resolution TEM (JEM 4010
operating at 400 kV).
an individual nanowire of tetragonal SnO (Figure 5) again
2
shows the single-crystalline nature of the wires. The inter-
planar spacing of d = 3.34 (Figure 5c) could be assigned to
{
110} planes of the SnO lattice described in space group P4 /
2 2
[
18]
mnm.
Received: July 29, 2005
Published online: November 30, 2005
Keywords: nanostructures · selenides · template synthesis · tin
.
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Figure 5. a) Segment of an individual SnO nanowire with a diameter
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homogeneity and crystallinity; c) high-resolution image of a part of (b),
showing {110} lattice fringes of SnO2.
2
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In conclusion, the selective reactivity of the pore walls of
porous alumina and macroporous silicon, which leads not just
to a surface modification but to a complete conversion of the
one-dimensional nano-objects, allows the preparation of
monodisperse tubes and nanowires of three different target
[
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materials—SnSe, SnO , and Sn—from a single-source pre-
2
cursor, Sn(SePh) . The enhanced reaction temperature for the
4
oxidation within the pores facilitated the formation of single-
crystalline nanowires of SnO2.
2
003, 15, 780; g) M. Steinhart, R. B. Wehrspohn, U. Gösele, J. H.
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2
Geppert, E. Pippel, R. Scholz, U. Gösele, S. Schlecht, Chem.
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Experimental Section
Synthetic procedures: The precursor compound Sn(SePh) was
4
[
4]
synthesized according to a literature procedure.
[4] S. Schlecht, M. Budde, L. Kienle, Inorg. Chem. 2002, 41, 6001.
3
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ꢀ 2006 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim
Angew. Chem. Int. Ed. 2006, 45, 311 –315